Scalable circuitry and method for control insertion

    公开(公告)号:US10296479B1

    公开(公告)日:2019-05-21

    申请号:US14975370

    申请日:2015-12-18

    Abstract: The present disclosure provides an innovative circuit structure for control insertion into a multiple-word wide data stream. The control-insertion circuit structure is advantageously scalable as the data width increases. An exemplary implementation of the control-insertion circuit structure includes a multiple-layer shifting circuit. The multiple-layer shifting circuit has some similarities with a barrel shifter. However, unlike a barrel shifter, the multiple-layer shifting circuit moves data words in both directions and moves portions of the data to create spaces or holes in the data (rather than moving the entire width as a barrel shifter does). The output of the multiple-layer shifting circuit is a “swiss-cheese-like” structure of data, where the spaces or holes in the data are available for control insertion. Other features, aspects and embodiments are also disclosed.

    Optical buffer with a signal-switching capability
    5.
    发明授权
    Optical buffer with a signal-switching capability 有权
    具有信号切换功能的光缓冲器

    公开(公告)号:US09405070B1

    公开(公告)日:2016-08-02

    申请号:US14713284

    申请日:2015-05-15

    Abstract: We disclose an optical buffer having a plurality of optical ports. In some embodiments, an optical signal to be stored may be injected into the buffer through any one of the optical ports and then may be ejected from the buffer, after being stored therein for a selectable amount of time, through any one of the optical ports as well. This feature advantageously enables the optical buffer to also function as an optical switch or router. In an example embodiment, the optical buffer comprises two optical recirculation loops, each of which can store the optical signal by causing it to circulate therein. The buffer is configured to compensate optical losses incurred by the optical signal during this circulation by transferring the optical signal from one loop to the other through an optical amplifier. Due to the latter feature, the optical buffer may be able to store an optical signal, with an acceptable OSNR, for a significantly longer time than certain conventional optical buffers.

    Abstract translation: 我们公开了具有多个光学端口的光学缓冲器。 在一些实施例中,要存储的光信号可以通过任何一个光端口注入到缓冲器中,然后可以通过任何一个光端口在缓冲器中存储可选择的时间量之后从缓冲器中弹出 以及。 该特征有利地使得光学缓冲器也可以用作光学交换机或路由器。 在一个示例性实施例中,光学缓冲器包括两个光学循环回路,每个循环回路可以通过使其在其中循环而存储光学信号。 缓冲器被配置为通过光学放大器将光信号从一个环路传送到另一个环路来补偿在该循环期间由光信号引起的光学损耗。 由于后一个特征,光学缓冲器可能能够存储具有可接受的OSNR的光信号比特定的常规光学缓冲器显着更长的时间。

    METHOD AND SYSTEM FOR QUEUING DATA FOR MULTIPLE READERS AND WRITERS
    6.
    发明申请
    METHOD AND SYSTEM FOR QUEUING DATA FOR MULTIPLE READERS AND WRITERS 有权
    用于多个读取器和写入程序的数据的方法和系统

    公开(公告)号:US20160070535A1

    公开(公告)日:2016-03-10

    申请号:US14786080

    申请日:2014-06-13

    Applicant: TRAVELPORT, LP

    Inventor: Bryan Karr

    Abstract: Systems and methods of queuing data for multiple readers and writers are provided. Enqueuing operations are disclosed that can process write functionality and can determine whether ring buffers have potentially filled, and dynamically declare a new ring buffer at a multiple of capacity of the current ring. Dequeuing operations are disclosed that can process read functionality for advancing control and determining whether and when to free ring buffers from memory.

    Abstract translation: 提供了为多个读取器和写入器排队数据的系统和方法。 公开了能够处理写入功能并且可以确定环形缓冲器是否可能被填充的入队操作,并且以当前环的容量的倍数动态地声明新的环形缓冲器。 公开了可以处理用于前进控制的读取功能并确定是否以及何时从存储器释放环形缓冲器的排队操作。

    Magnetic memory element, magnetic memory, and magnetic memory device
    8.
    发明授权
    Magnetic memory element, magnetic memory, and magnetic memory device 有权
    磁存储元件,磁存储器和磁存储器件

    公开(公告)号:US08976579B2

    公开(公告)日:2015-03-10

    申请号:US13757981

    申请日:2013-02-04

    Abstract: According to one embodiment, a magnetic memory element includes: a magnetic wire, a stress application unit, and a recording/reproducing unit. The magnetic wire includes a plurality of domain walls and a plurality of magnetic domains separated by the domain walls. The magnetic wire is a closed loop. The stress application unit is configured to cause the domain walls to circle around along the closed loop a plurality of times by applying stress to the magnetic wire. The recording/reproducing unit is configured to write memory information by changing magnetizations of the circling magnetic domains as the domain walls circle around and to read the written memory information by detecting the magnetizations of the circling magnetic domains.

    Abstract translation: 根据一个实施例,磁存储元件包括:磁线,应力施加单元和记录/再现单元。 磁线包括多个畴壁和由畴壁隔开的多个磁畴。 磁线是闭环。 应力施加单元被配置为通过向磁线施加应力使畴壁沿着闭合环多圈。 记录/再现单元被配置为通过随着畴壁围绕而改变环绕磁畴的磁化来写入存储器信息,并且通过检测循环磁畴的磁化来读取写入的存储器信息。

    Automatic defect management in memory devices
    9.
    发明授权
    Automatic defect management in memory devices 有权
    内存设备自动缺陷管理

    公开(公告)号:US08595573B2

    公开(公告)日:2013-11-26

    申请号:US13405309

    申请日:2012-02-26

    Abstract: A method for data storage in a memory including multiple memory cells arranged in blocks, includes storing first and second pages in respective first and second groups of the memory cells within a given block of the memory. A pattern of respective positions of one or more defective memory cells is identified in the first group. The second page is recovered by applying the pattern identified in the first group to the second group of the memory cells.

    Abstract translation: 一种用于在包括以块为单位布置的多个存储单元的存储器中的数据存储的方法,包括将第一和第二页存储在存储器的给定块内的存储单元的相应第一和第二组中。 在第一组中识别出一个或多个有缺陷的存储器单元的相应位置的图案。 通过将第一组中识别的模式应用到第二组存储器单元来恢复第二页。

    Structure for system for and method of performing high speed memory diagnostics via built-in-self-test
    10.
    发明授权
    Structure for system for and method of performing high speed memory diagnostics via built-in-self-test 失效
    用于通过内置自检进行高速存储器诊断的系统和方法的结构

    公开(公告)号:US07870454B2

    公开(公告)日:2011-01-11

    申请号:US12126452

    申请日:2008-05-23

    CPC classification number: G11C29/40 G01R31/31703 G01R31/31704 G11C2029/3202

    Abstract: A design structure for a system for and method of performing high speed memory diagnostics via built-in-self-test (BIST) is disclosed. In particular, a test system includes a tester for testing an integrated circuit that includes a BIST circuit and a test control circuit. The BIST circuit further includes a BIST engine and fail logic for testing an imbedded memory array. The test control circuit includes three binary up/down counters, a variable delay, and a comparator circuit. A method of performing high speed memory diagnostics via BIST includes, but is not limited to, presetting the counters of the test control circuit, presetting the variable delay to a value that is equal to the latency of the fail logic, setting the BIST cycle counter to decrement mode, presetting the variable delay to zero, re-executing the test algorithm and performing a second test operation of capturing the fail data, and performing a third test operation of transmitting the fail data to the tester.

    Abstract translation: 公开了一种用于通过内置自检(BIST)执行高速存储器诊断的系统和方法的设计结构。 特别地,测试系统包括用于测试包括BIST电路和测试控制电路的集成电路的测试器。 BIST电路还包括用于测试嵌入式存储器阵列的BIST引擎和故障逻辑。 测试控制电路包括三个二进制向上/向下计数器,可变延迟和比较器电路。 通过BIST执行高速存储器诊断的方法包括但不限于预设测试控制电路的计数器,将可变延迟预设为等于故障逻辑的等待时间的值,设置BIST周期计数器 将可变延迟预置为零,重新执行测试算法并执行捕获故障数据的第二测试操作,以及执行将失败数据发送给测试者的第三测试操作。

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