公开(公告)号：US11709148B2

公开(公告)日：2023-07-25

申请号：US17557549

申请日：2021-12-21

Applicant: The Regents of the University of California

Inventor： Nader Pourmand ,  Boaz Vilozny ,  Paolo Actis ,  R. Adam Seger

IPC: B01L3/02 ,  G01N27/416 ,  G01N27/447 ,  B01L3/00 ,  G01N33/487 ,  G01Q60/44 ,  G01N27/327 ,  B82Y35/00

CPC classification number: G01N27/44791 ,  B01L3/021 ,  B01L3/50273 ,  B82Y35/00 ,  G01N27/3277 ,  G01N27/4167 ,  G01N33/48721 ,  G01Q60/44 ,  B01L2300/0896

Abstract: Disclosed are methods and devices for detection of ion migration and binding, utilizing a nanopipette adapted for use in an electrochemical sensing circuit. The nanopipette may be functionalized on its interior bore with metal chelators for binding and sensing metal ions or other specific binding molecules such as boronic acid for binding and sensing glucose. Such a functionalized nanopipette is comprised in an electrical sensor that detects when the nanopipette selectively and reversibly binds ions or small molecules. Also disclosed is a nanoreactor, comprising a nanopipette, for controlling precipitation in aqueous solutions by voltage-directed ion migration, wherein ions may be directed out of the interior bore by a repulsing charge in the bore.

公开(公告)号：US20200024649A1

公开(公告)日：2020-01-23

申请号：US16401033

申请日：2019-05-01

Applicant: Kalim Mir

Inventor： Kalim Mir

IPC: C12Q1/6825 ,  B01L3/02 ,  G01Q60/44 ,  G01N33/543 ,  G01N33/487 ,  C12Q1/6869

Abstract: The disclosure relates to devices and instruments for detecting and individually analyzing biomolecules, biomolecular complexes and biomolecules with ligands attached thereon.

公开(公告)号：US08980073B2

公开(公告)日：2015-03-17

申请号：US13411221

申请日：2012-03-02

Applicant: Nader Pourmand ,  Boaz Vilozny ,  Paolo Actis ,  R. Adam Seger ,  Bakthan Singaram

Inventor： Nader Pourmand ,  Boaz Vilozny ,  Paolo Actis ,  R. Adam Seger ,  Bakthan Singaram

IPC: G01N27/327 ,  G01N27/333 ,  B82Y35/00 ,  B01L3/02 ,  B01L3/00 ,  G01N33/487 ,  G01Q60/44

CPC classification number: G01N27/44791 ,  B01L3/021 ,  B01L3/50273 ,  B01L2300/0896 ,  B82Y35/00 ,  G01N33/48721 ,  G01Q60/44

Abstract: Disclosed are methods and devices for detection of ion migration and binding, utilizing a nanopipette adapted for use in an electrochemical sensing circuit. The nanopipette may be functionalized on its interior bore with metal chelators for binding and sensing metal ions or other specific binding molecules such as boronic acid for binding and sensing glucose. Such a functionalized nanopipette is comprised in an electrical sensor that detects when the nanopipette selectively and reversibly binds ions or small molecules. Also disclosed is a nanoreactor, comprising a nanopipette, for controlling precipitation in aqueous solutions by voltage-directed ion migration, wherein ions may be directed out of the interior bore by a repulsing charge in the bore.

Abstract translation: 公开了用于检测离子迁移和结合的方法和装置，利用适用于电化学感测电路的纳米管。 可以在其内孔上用金属螯合剂官能化纳米针管，用于结合和感测金属离子或其它特异性结合分子，例如用于结合和感测葡萄糖的硼酸。 这种功能化的纳米移液管包含在电传感器中，该传感器检测纳米管片何时选择性地和可逆地结合离子或小分子。 还公开了一种纳米反应器，其包括纳米管，用于通过电压导向的离子迁移控制水溶液中的沉淀，其中离子可以通过孔中的排斥电荷引出到内孔内。

公开(公告)号：US20140041085A1

公开(公告)日：2014-02-06

申请号：US13566327

申请日：2012-08-03

Applicant: Sergei V. Kalinin ,  Nina Balke ,  Albina Y. Borisevich ,  Stephen Jesse ,  Petro Maksymovych ,  Yunseok Kim ,  Evgheni Strelcov

Inventor： Sergei V. Kalinin ,  Nina Balke ,  Albina Y. Borisevich ,  Stephen Jesse ,  Petro Maksymovych ,  Yunseok Kim ,  Evgheni Strelcov

IPC: G01Q60/44

CPC classification number: G01Q60/30

Abstract: An excitation voltage biases an ionic conducting material sample over a nanoscale grid. The bias sweeps a modulated voltage with increasing maximal amplitudes. A current response is measured at grid locations. Current response reversal curves are mapped over maximal amplitudes of the bias cycles. Reversal curves are averaged over the grid for each bias cycle and mapped over maximal bias amplitudes for each bias cycle. Average reversal curve areas are mapped over maximal amplitudes of the bias cycles. Thresholds are determined for onset and ending of electrochemical activity. A predetermined number of bias sweeps may vary in frequency where each sweep has a constant number of cycles and reversal response curves may indicate ionic diffusion kinetics.

Abstract translation: 激发电压在纳米尺度网格上偏置离子导电材料样品。 偏置以最大幅度增加扫描调制电压。 当前的响应是在网格位置测量的。 电流响应反转曲线映射到偏置周期的最大幅度。 对于每个偏置周期，反转曲线在电网上进行平均，并映射到每个偏置周期的最大偏置幅度。 平均反转曲线区域映射到偏置周期的最大幅度。 确定电化学活性的起始和结束的阈值。 预定数量的偏置扫描可以在频率上变化，其中每个扫描具有恒定的循环次数，反转响应曲线可以指示离子扩散动力学。

公开(公告)号：US20110131690A1

公开(公告)日：2011-06-02

申请号：US12864302

申请日：2009-02-02

Applicant: Pavel Novak ,  Chao Li ,  Andrew Shevchuk ,  Victor Ostanin ,  David Klenerman ,  Yuri Korchev ,  Gregory Frolenkov ,  Richard Clarke

Inventor： Pavel Novak ,  Chao Li ,  Andrew Shevchuk ,  Victor Ostanin ,  David Klenerman ,  Yuri Korchev ,  Gregory Frolenkov ,  Richard Clarke

IPC: G01Q60/44

CPC classification number: G01Q60/44 ,  B82Y35/00 ,  G01Q10/00 ,  G01Q10/02 ,  G01Q10/065

Abstract: The subject invention concerns methods for interrogating a surface using scanning ion conductance microscopy (SICM). In one embodiment, a method of the invention comprises the steps of: a) repeatedly bringing a SICM probe into proximity with the surface at discrete, spaced locations in a region of the surface and measuring surface height at each location; b) estimating surface roughness or other characteristic for the region based upon the surface height measurements; and c) repeatedly bringing the probe into proximity with the surface at discrete, spaced locations in the region, the number and location of which is based upon the estimated surface roughness or other characteristic in the region, and obtaining an image of the region with a resolution adapted to the surface roughness or other characteristic.

Abstract translation: 本发明涉及使用扫描离子电导显微镜（SICM）询问表面的方法。 在一个实施例中，本发明的方法包括以下步骤：a）在表面的一个区域中的不连续，间隔的位置处重复使SICM探针与表面接近，并测量每个位置处的表面高度; b）基于表面高度测量来估计区域的表面粗糙度或其他特性; 以及c）在所述区域中的离散的间隔位置处重复地使所述探针靠近所述表面，所述位置的数量和位置基于所估计的表面粗糙度或所述区域中的其它特征，并且获得所述区域的图像 分辨率适应于表面粗糙度或其他特性。

公开(公告)号：US20050139767A1

公开(公告)日：2005-06-30

申请号：US11058943

申请日：2005-02-15

Applicant: Gustavo Pinto ,  Brian Leslie ,  David Adler ,  Akella Satya ,  Robert Long ,  David Walker

Inventor： Gustavo Pinto ,  Brian Leslie ,  David Adler ,  Akella Satya ,  Robert Long ,  David Walker

IPC: G01N21/66 ,  G01N21/95 ,  G01N21/956 ,  G01N23/04 ,  G01Q30/16 ,  G01Q60/44 ,  G01R31/28 ,  G01R31/307 ,  H01L23/544 ,  A61N5/00 ,  G21K7/00

CPC classification number: H01L22/34 ,  G01N21/66 ,  G01N21/956 ,  G01N23/04 ,  G01R31/2884 ,  G01R31/307 ,  H01J2237/2817 ,  Y10S977/849

Abstract: Disclosed is a method of inspecting a sample. The sample is scanned in a first direction with at least one particle beam. The sample is scanned in a second direction with at least one particle beam. The second direction is at an angle to the first direction. The number of defects per an area of the sample are found as a result of the first scan, and the position of one or more of the found defects is determined from the second scan. In a specific embodiment, the sample includes a test structure having a plurality of test elements thereon. A first portion of the test elements is exposed to the beam during the first scan to identify test elements having defects, and a second portion of the test elements is exposed during the second scan to isolate and characterize the defect.

Abstract translation: 公开了一种检查样品的方法。 用至少一个粒子束沿第一方向扫描样品。 用至少一个粒子束在第二个方向上扫描样品。 第二方向与第一方向成一个角度。 作为第一扫描的结果，发现样品的每个区域的缺陷数，并且从第二次扫描确定发现的一个或多个缺陷的位置。 在具体实施例中，样本包括其上具有多个测试元件的测试结构。 测试元件的第一部分在第一次扫描期间暴露于光束以识别具有缺陷的测试元件，并且第二部分测试元件在第二次扫描期间暴露以分离和表征缺陷。

公开(公告)号：US5278407A

公开(公告)日：1994-01-11

申请号：US873173

申请日：1992-04-24

Applicant: Yoshinori Ikebe ,  Hifumi Tamura ,  Hiroyuki Sumiya ,  Akemi Furuki

Inventor： Yoshinori Ikebe ,  Hifumi Tamura ,  Hiroyuki Sumiya ,  Akemi Furuki

IPC: H01J37/252 ,  G01N23/225 ,  G01Q30/02 ,  G01Q60/44 ,  H01J37/256 ,  H01J49/14 ,  H01J49/32 ,  H01J37/26

CPC classification number: G01N23/2258 ,  H01J37/256 ,  H01J49/142 ,  H01J2237/004 ,  H01J2237/2527

Abstract: A secondary-ion mass spectrometry apparatus using a field limiting method includes an optical system for primary ions, a sample chamber, and an optical system for secondary ions, and a total ion monitor (TIM) interposed between an electric sector and a magnetic sector of the optical system for secondary ions. A field-limited image (or TIM image) from the TIM can be observed or monitored continually by a CRT, thereby making it possible to grasp quantitatively the charging state of a sample surface. The apparatus may further include an adjuster for adjusting quantatively the charging state of the sample surface.

Abstract translation: 使用场限制方法的二次离子质谱仪装置包括用于一次离子的光学系统，样品室和用于二次离子的光学系统，以及介于电子部分和磁性部分之间的总离子监测器（TIM） 二次离子光学系统。 可以通过CRT连续地观察或监视来自TIM的场限制图像（或TIM图像），从而可以定量地掌握样品表面的充电状态。 该装置还可以包括用于定量地调整样品表面的充电状态的调节器。

公开(公告)号：US5041725A

公开(公告)日：1991-08-20

申请号：US553698

申请日：1990-07-18

Applicant: Eiichi Izumi

Inventor： Eiichi Izumi

IPC: H01J49/26 ,  G01N23/225 ,  G01Q60/44 ,  H01J37/256

CPC classification number: H01J37/256 ,  G01N23/2258

Abstract: A secondary ion mass spectrometry apparatus for analyzing an element contained in the sample by radiating a primary ion beam extracted from an ion source to an analytical sample through a focusing system. The secondary ion mass spectrometry apparatus comprises an input unit for inputting data containing analytical elements names and areas, a storage unit for storing operational expressions to be operated on the input data from the input unit and a table to be reference on the input data and the results operated by the operational expressions and from which the necessary data is read, and a control unit for setting focusing conditions of said focusing system using the input data inputted from said input unit and the operational expressions and tables stored in the storage unit.

Abstract translation: 一种二次离子质谱装置，用于通过将从离子源提取的一次离子束通过聚焦系统辐射到分析样品来分析样品中包含的元素。 二次离子质谱仪包括：输入单元，用于输入包含分析单元名称和区域的数据;存储单元，用于存储对来自输入单元的输入数据进行操作的操作表达式以及要输入的参考表， 由操作表达式操作的结果，并且从其读取必要的数据;以及控制单元，用于使用从所述输入单元输入的输入数据和存储在存储单元中的操作表达式和表来设置所述聚焦系统的聚焦条件。

公开(公告)号：US3767925A

公开(公告)日：1973-10-23

申请号：US3767925D

申请日：1972-03-08

Applicant: BELL TELEPHONE LABOR INC

Inventor： FOLEY E ,  MAC RAE A ,  WHITE C ,  SIMMS D ,  TOLK N

IPC: G01N23/207 ,  G01Q30/08 ,  G01Q60/44 ,  H01J37/252 ,  H01J37/26

CPC classification number: G01N23/2073 ,  H01J37/252

Abstract: The spatial distribution of constituents and contaminants in a solid is determined either by (1) scanning the surface of the solid with a focused ion or neutral particle beam to sputter excited particles from the surface, resulting in photon emissions characteristic of the sputtered particles, and detecting the photon emissions over the scan period, or by (2) flooding the surface with a diffuse beam, and photographically recording the distribution of photon emissions. Continued sputtering results in removal of surface material and detection of the photon count rate or a sequence of photographs taken during each successive scan period indicates the distribution of constituents and contaminants in the bulk of the solid as a function of distance from the surface.

Abstract translation: 固体中成分和污染物的空间分布由（1）用聚焦离子或中性粒子束扫描固体的表面以从表面溅射激发的粒子来确定溅射粒子的光子发射特性， 在扫描周期内检测光子发射，或者（2）用漫射光束淹没该表面，并照相记录光子发射的分布。 继续溅射导致去除表面材料并且检测光子计数速率或在每个连续扫描周期期间拍摄的照片序列表示作为与表面的距离的函数的固体的大部分中的成分和污染物的分布。

公开(公告)号：US3660655A

公开(公告)日：1972-05-02

申请号：US3660655D

申请日：1969-09-08

Applicant: ASS ELECT IND

Inventor： WARDELL IAN ROBERT MICHAEL

IPC: G01Q60/44 ,  H01J37/256 ,  H01J49/14 ,  H01J37/26 ,  B01D59/44 ,  H01J39/34

CPC classification number: H01J37/256 ,  H01J49/14

Abstract: In micro-analyzer apparatus of the kind in which material to be analyzed is arranged as a target of an ion probe and ionized particles obtained from the target are analyzed in a mass spectrometer, accuracy of analysis is improved by analyzing not secondary ions sputtered from the target but neutral atoms which are collected and passed to the mass spectrometer through an ionizer. Several possible forms of ionizer for ionizing the sputtered neutrals are also disclosed.

Abstract translation: 在质谱仪中分析将待分析材料配置为离子探针的目标物和从目标物获得的离子化粒子的微分析装置，通过分析不分散的二次离子来提高分析精度 目标但中性原子被收集并通过离子发生器传递到质谱仪。 还公开了用于电离溅射中性粒子的几种可能形式的离子发生器。