公开(公告)号：US09496126B2

公开(公告)日：2016-11-15

申请号：US14690307

申请日：2015-04-17

Applicant: Thermo Finnigan LLC

Inventor： Johnathan Wayne Smith

IPC: H01J49/32 ,  H01J47/06 ,  G01N30/00 ,  H01J49/42 ,  H01J49/00

CPC classification number: H01J49/4215 ,  H01J49/0036 ,  H01J49/025

Abstract: A method for analyzing a sample by mass spectrometry includes producing ions from the sample, delivering the ions to an entrance of a multipole, and applying oscillatory and resolving DC voltages to electrodes of the multipole. The oscillatory and resolving DC voltages cause the multipole to selectively transmit to its distal end ions within a range of mass-to-charge ratios (m/z's) determined by the amplitudes of the oscillatory and resolving DC voltages. The method further includes acquiring data representative of the spatial distributions of ions transmitted by the multipole at a plurality of consecutive time points, and deconvolving the acquired data to produce a mass spectrum. Deconvolving the acquired data includes processing the data to compress a dynamic range of intensity values in the data.

Abstract translation: 通过质谱分析样品的方法包括从样品中产生离子，将离子输送到多极的入口，以及向多极的电极施加振荡和分解的DC电压。 振荡和分辨的DC电压导致多极选择性地在由振荡和分辨的DC电压的振幅确定的质荷比（m / z）范围内向其远端离子传输。 该方法还包括获取表示在多个连续时间点由多极发射的离子的空间分布的数据，并且对所获取的数据进行解卷积以产生质谱。 解卷积采集的数据包括处理数据以压缩数据中的强度值的动态范围。

公开(公告)号：US07348555B2

公开(公告)日：2008-03-25

申请号：US11029810

申请日：2005-01-04

Applicant: Mamoru Usami ,  Kazushi Tanaka ,  Yukio Kaneko ,  Naoyuki Echigo ,  Hiroshi Tominaga ,  Akihiko Kizaki ,  Kunihiko Ozaki

Inventor： Mamoru Usami ,  Kazushi Tanaka ,  Yukio Kaneko ,  Naoyuki Echigo ,  Hiroshi Tominaga ,  Akihiko Kizaki ,  Kunihiko Ozaki

IPC: H01J49/32

CPC classification number: G21K5/04

Abstract: An electron beam irradiation apparatus includes a turn-transfer mechanism; a turn irradiation chamber; an electron beam irradiation section; a replacement room configured to bring a target into and out of the turn irradiation chamber; an outer irradiation target holding table configured to form a part of the replacement room, and including an X-ray shielding mechanism, an airtightness maintaining mechanism, a target holding mechanism; an inner irradiation target holding table configured to form a part of the replacement room, and including an X-ray shielding mechanism, an airtightness maintaining mechanism, and a target holding mechanism, the inner irradiation target holding table being supported by the turn-transfer mechanism; a turning mechanism configured to drive the turn-transfer mechanism; and an elevator mechanism configured to move the turn-transfer mechanism, which supports the inner irradiation target holding table, up and down.

Abstract translation: 电子束照射装置包括转向传递机构; 转照射室; 电子束照射部; 更换室，其构造成使目标进出转动照射室; 外部照射目标保持台，被配置为形成更换室的一部分，并且包括X射线屏蔽机构，气密性保持机构，目标保持机构; 内部照射目标保持台，被配置为形成更换室的一部分，并且包括X射线屏蔽机构，气密性保持机构和目标保持机构，所述内部照射目标保持台由所述转动传递机构 ; 构造成驱动转向传递机构的转动机构; 以及电梯机构，被构造成上下移动支撑内照射目标保持台的转向传递机构。

公开(公告)号：US5801380A

公开(公告)日：1998-09-01

申请号：US600861

申请日：1996-02-09

Applicant: Mahadeva P. Sinha

Inventor： Mahadeva P. Sinha

IPC: H01J31/50 ,  H01J49/02 ,  H01J49/32 ,  H01J49/00 ,  B01D59/44

CPC classification number: H01J49/025 ,  H01J31/507 ,  H01J49/32

Abstract: Improvements for viewing particles, e.g. electrons or ions, in mass spectrometer systems. A special kind of system allows a phosphor to be formed which does not include any kind of conductive layer thereon. The particles impinge directly on the phosphor, and produce light that shines through an ITO layer. This special system enables lower voltage, and smaller systems. Another improvement enables direct viewing of ions from the system.

Abstract translation: 用于观察颗粒的改进，例如 电子或离子，在质谱仪系统中。 一种特殊的系统允许形成不在其上的任何种类的导电层的磷光体。 颗粒直接照射在荧光体上，产生通过ITO层照射的光。 这种特殊的系统可以实现更低的电压和更小的系统。 另一个改进可以直接观察系统中的离子。

公开(公告)号：US5248875A

公开(公告)日：1993-09-28

申请号：US873149

申请日：1992-04-24

Applicant: Donald Douglas ,  Bruce Thomson ,  Jay Corr ,  James Hager

Inventor： Donald Douglas ,  Bruce Thomson ,  Jay Corr ,  James Hager

IPC: G01N27/62 ,  H01J49/32 ,  H01J49/42

CPC classification number: H01J49/063 ,  H01J49/005

Abstract: A method is provided of increasing the resolution in a tandem mass spectrometer having a first quadrupole Q1 to select a parent ion, a second quadrupole Q2 which contains a target gas and forms a collision cell, and a third or analyzing quadrupole Q3 which generates a mass spectrum from daughter ions from Q2. In the method, the target thickness of the target gas in Q2 is held at least at 1.32.times.10.sup.15 cm.sup.-2, preferably at least 3.30.times.10.sup.15 cm.sup.-2, and the DC offset voltage between Q2 and Q3 is kept low or zero. This greatly improves the resolution available in Q3. Q3 is therefore operated with at least unit resolution, and in some cases with resolution of 1/2 or 1/3 amu, making it possible to resolve isotopes of singly, doubly or triply charged daughter ions.

公开(公告)号：US5073713A

公开(公告)日：1991-12-17

申请号：US530667

申请日：1990-05-29

Applicant: Richard D. Smith ,  Harold R. Udseth ,  Alan L. Rockwood

Inventor： Richard D. Smith ,  Harold R. Udseth ,  Alan L. Rockwood

IPC: H01J49/28 ,  H01J49/32 ,  H01J49/40

CPC classification number: H01J49/40 ,  H01J49/004 ,  H01J49/32

Abstract: Dissociations of multiple-charged ions are detected and analyzed by charge-separation tandem mass spectrometry. Analyte molecules are ionized to form multiple-charged parent ions. A particular charge parent ion state is selected in a first-stage mass spectrometer and its mass-to-charge ratio (M/Z) is detected to determine its mass and charge. The selected parent ions are then dissociated, each into a plurality of fragments including a set of daughter ions each having a mass of at least one molecular weight and a charge of at least one. Sets of daughter ions resulting from the dissociation of one parent ion (sibling ions) vary in number but typically include two to four ions, one or more multiply-charged. A second stage mass spectrometer detects mass-to-charge ratio (m/z) of the daughter ions and a temporal or temporo-spatial relationship among them. This relationship is used to correlate the daughter ions to determine which (m/z) ratios belong to a set of sibling ions. Values of mass and charge of each of the sibling ions are determined simultaneously from their respective (m/z) ratios such that the sibling ion charges are integers and sum to the parent ion charge.

Abstract translation: 通过电荷分离串联质谱法检测和分析多电荷离子的离解。 分析物分子被电离以形成多电荷的母体离子。 在第一级质谱仪中选择特定的电荷亲本离子状态，并检测其质荷比（M / Z）以确定其质量和电荷。 然后将所选择的母体离子解离，每个分离成多个片段，包括一组子离子，每个子离子具有至少一个分子量的质量和至少一个的电荷。 由一个亲本离子（同胞离子）的解离产生的子离子集在数量上变化，但通常包括两个至四个离子，一个或多个多次充电。 第二级质谱仪检测子离子的质荷比（m / z）和它们之间的时间或空间 - 空间关系。 这种关系用于关联子离子以确定哪个（m / z）比属于一组同胞离子。 每个同胞离子的质量和电荷的值由它们各自的（m / z）比同时测定，使得同胞离子电荷是整数，并且与母离子电荷相加。

公开(公告)号：US4952803A

公开(公告)日：1990-08-28

申请号：US449438

申请日：1989-12-11

Applicant: Hisashi Matsuda

Inventor： Hisashi Matsuda

IPC: H01J49/06 ,  H01J49/26 ,  H01J49/32

CPC classification number: H01J49/32

Abstract: A double focusing mass spectrometer is used as the second mass analyzer of a Mass Spectrometry/Mass Spectrometry Instrument comprising a uniform electric field and a magnetic sector. Fragment ions produced from precursor ions of a certain ionic species are introduced into a uniform electric field. The fragment ions travel along parabolic orbits and are separated according to their respective energy levels. The separated fragment ions are introduced into a magnetic sector and are dispersed according to their mass by the magnetic sector. A two-dimensional ion detector is disposed along a focal plane of the magnetic sector in order to simultaneously detect the fragment ions and to obtain a spectrum of the fragment ions.

Abstract translation: 使用双重聚焦质谱仪作为包含均匀电场和磁性部分的质谱/质谱仪的第二质量分析器。 由一定离子物质的前体离子产生的片段离子被引入均匀的电场。 碎片离子沿抛物线轨道行进，并根据其各自的能级分离。 分离的碎片离子被引入到磁性部分中，并且根据它们的质量被磁性部分分散。 沿着磁性扇区的焦平面设置二维离子检测器，以便同时检测碎片离子并获得碎片离子的光谱。

公开(公告)号：US4851669A

公开(公告)日：1989-07-25

申请号：US201668

申请日：1988-06-02

Applicant: William Aberth

Inventor： William Aberth

IPC: H01J49/16 ,  H01J49/32

CPC classification number: H01J49/0068

Abstract: A tandem mass spectrometer includes an ion source, a first mass analyzer, a microchannel collision plate, a second mass analyzer, and a detector. The microchannel collision plate comprises a matrix defining a plurality of microchannels which are disposed in a generally parallel orientation with a beam of parent ions emanating from the first mass analyzer. Collision of the parent ions with the internal surfaces of the microchannels causes the parent ions to dissociate into daughter ions. The second mass analyzer distinguishes between various mass fractions of the daughter ions, allowing the detector to quantitate said fractions and produce a mass spectra of the material being analyzed.

Abstract translation: 串联质谱仪包括离子源，第一质量分析器，微通道碰撞板，第二质量分析器和检测器。 微通道碰撞板包括限定多个微通道的矩阵，该多个微通道以与第一质量分析器发出的母体离子束大致平行的方向设置。 母离子与微通道内表面的碰撞导致母体离子离解成子离子。 第二质谱分析仪区分子离子的各种质量分数，允许检测器定量所述级分并产生被分析材料的质谱。

公开(公告)号：US4812649A

公开(公告)日：1989-03-14

申请号：US105251

申请日：1987-10-07

Applicant: Katsuhiro Nakagawa

Inventor： Katsuhiro Nakagawa

IPC: G01N27/62 ,  H01J49/02 ,  H01J49/32 ,  B01D59/44

CPC classification number: H01J49/022

Abstract: In a mass analyzer, an acceleration voltage is applied to an ionization chamber in which a voltage to be applied to repeller electrodes to repel ions is generated with reference to the acceleration voltage and a repeller voltage source is linked with a controller by use of a photocoupler or the like such that the repeller voltage is adjusted with the repeller voltage source electrically insulated from the controller. The repeller voltage can be easily and automatically adjusted by use of a low-voltage control signal so as to obtain a sensitivity developing the maximum value of the quantity of detected ions and hence a qualitative or quantitative analysis of a sample can be achieved with a high sensitivity. The controller processes digital signals and appropriate parameters are stored in a memory. Each parameter is changed with the center of change set to an appropriate parameter previously used and consequently the automatic control is simplified.

Abstract translation: 在质量分析装置中，向电离室施加加速电压，在该离子化室中，参照加速电压产生施加到排斥电极的电压以排斥离子，并且使用光电耦合器将调制器电压源与控制器连接 使得排斥电压通过与控制器电绝缘的推斥极电压源来调节。 可以通过使用低电压控制信号容易且自动地调节推斥极电压，以获得显影检测离子量的最大值的灵敏度，因此可以以高的方式实现样品的定性或定量分析 灵敏度。 控制器处理数字信号，并将适当的参数存储在存储器中。 每个参数都会随着变化中心的变化而被改变为先前使用的适当参数，因此简化了自动控制。

公开(公告)号：US4672204A

公开(公告)日：1987-06-09

申请号：US849348

申请日：1986-04-07

Applicant: Georges Slodzian ,  Marcel Chaintreau ,  Roger Dennebouy ,  Jean-Claude Lorin

Inventor： Georges Slodzian ,  Marcel Chaintreau ,  Roger Dennebouy ,  Jean-Claude Lorin

IPC: H01J49/28 ,  G01N27/62 ,  H01J49/06 ,  H01J49/30 ,  H01J49/32

CPC classification number: H01J49/30 ,  H01J49/326

Abstract: Mass spectrometer having an ion source, acceleration means able to impart to the ions an energy essentially dependent on their electric charge, means for producing in a sector a magnetic field orthogonal to the plane of the trajectory of the ions in order to inwardly curve said trajectory and means for detecting the ions. At the inlet of the magnetic sector are provided electrostatic means able to modify the tangential velocity of the ions and consequently their energy, in such a way that ions with different masses can, at different times, follow the same inwardly curved trajectory in the magnetic sector.

Abstract translation: 具有离子源的质谱仪，能够赋予离子基本上取决于其电荷的能量的加速装置，用于在扇区中产生与离子轨迹平面正交的磁场的装置，以便向内弯曲所述轨迹 和用于检测离子的装置。 在磁性扇区的入口处设置有静电装置，其能够修改离子的切向速度并因此改变它们的能量，使得具有不同质量的离子可以在不同时间沿着磁性扇区中相同的向内弯曲的轨迹 。

公开(公告)号：US3986025A

公开(公告)日：1976-10-12

申请号：US477466

申请日：1974-06-07

Applicant: Mitsuo Fujiwara ,  Hifumi Tamura ,  Toshio Kondo

Inventor： Mitsuo Fujiwara ,  Hifumi Tamura ,  Toshio Kondo

IPC: G01N23/225 ,  H01J37/252 ,  H01J37/256 ,  H01J49/30 ,  H01J49/32 ,  H01J37/26

CPC classification number: H01J49/324 ,  H01J37/256 ,  H01J49/30

Abstract: In an ion microanalyzer wherein the secondary ions emitted from a sample as a result of the bombardment of the sample by a primary ion beam are mass-analyzed and selected in accordance with their mass to electric charge ratios and the selected secondary ions are then detected by a detector, the image of the secondary ions emitted from the sample is formed through the converging action of a modified electrostatic lens on a slit disposed between the mass analyzing means and the detector or in front of the mass analyzing means.

Abstract translation: 在离子微量分析仪中，其中由于通过一次离子束轰击样品而从样品发射的二次离子根据其质量与电荷比进行质量分析和选择，然后通过以下方式检测所选择的二次离子： 检测器，通过改变的静电透镜在设置在质量分析装置和检测器之间或狭缝分析装置前面的狭缝上的会聚作用形成从样品发射的二次离子的图像。