公开(公告)号：US3986025A

公开(公告)日：1976-10-12

申请号：US477466

申请日：1974-06-07

Applicant: Mitsuo Fujiwara ,  Hifumi Tamura ,  Toshio Kondo

Inventor： Mitsuo Fujiwara ,  Hifumi Tamura ,  Toshio Kondo

IPC: G01N23/225 ,  H01J37/252 ,  H01J37/256 ,  H01J49/30 ,  H01J49/32 ,  H01J37/26

CPC classification number: H01J49/324 ,  H01J37/256 ,  H01J49/30

Abstract: In an ion microanalyzer wherein the secondary ions emitted from a sample as a result of the bombardment of the sample by a primary ion beam are mass-analyzed and selected in accordance with their mass to electric charge ratios and the selected secondary ions are then detected by a detector, the image of the secondary ions emitted from the sample is formed through the converging action of a modified electrostatic lens on a slit disposed between the mass analyzing means and the detector or in front of the mass analyzing means.

Abstract translation: 在离子微量分析仪中，其中由于通过一次离子束轰击样品而从样品发射的二次离子根据其质量与电荷比进行质量分析和选择，然后通过以下方式检测所选择的二次离子： 检测器，通过改变的静电透镜在设置在质量分析装置和检测器之间或狭缝分析装置前面的狭缝上的会聚作用形成从样品发射的二次离子的图像。

公开(公告)号：US3610921A

公开(公告)日：1971-10-05

申请号：US3610921D

申请日：1968-05-01

Applicant: PERKIN ELMER CORP

Inventor： MAJOR HAROLD W JR

IPC: H01J49/32 ,  B01D59/44 ,  H01J39/34

CPC classification number: H01J49/324

Abstract: Identification of metastable ion transitions with a double focusing mass spectrometer having an electric and a magnetic analyzer is accomplished by initially identifying an ion m* and subsequently modifying the electric analyzer in a manner for causing transition ions of mass m1 to be focused at an object of the magnetic analyzer. The daughter ion can then be identified and the precursor ion mo is determined from the relationship m* m12/mo. This measurement of m* and attending maintenance of ion energy levels while identifying m1 advantageously functions to maintain sensitivity and resolving power at normal operating values.

公开(公告)号：US3866042A

公开(公告)日：1975-02-11

申请号：US37992573

申请日：1973-07-17

Applicant: CAMECA

Inventor： VASTEL JEAN

IPC: G01N27/62 ,  G01Q60/00 ,  H01J49/28 ,  H01J49/32 ,  H01J39/34 ,  H01J37/26

CPC classification number: H01J49/28 ,  H01J49/286 ,  H01J49/324

Abstract: A microanalyser operating by secondary ion emission and comprising a double magnetic-prism for deflecting the ions according to their ''''momentum-to-charge'''' ratio and electrostatic means for filtering the ions according to their ''''energy-tocharge'''' ratio. An element is provided to operate either as an electrostatic mirror allowing the production of images through ion microscopy or as a transmitting and filtering device incorporated in the make-up of a double-focussing mass spectrometer in accordance with the magnetic prism and an electrostatic condenser.

Abstract translation: 通过二次离子发射操作的微型分析仪，包括用于根据“动量与电荷”比率偏转离子的双重磁性棱镜，以及根据其“能量 - 电荷”比对过滤离子的静电装置。 提供元件以作为静电镜来操作，其允许通过离子显微镜产生图像，或作为根据磁性棱镜和静电冷凝器结合在双重聚焦质谱仪的组合中的透射和滤波装置。

公开(公告)号：US3673404A

公开(公告)日：1972-06-27

申请号：US3673404D

申请日：1970-05-15

Applicant: PERKIN ELMER CORP

Inventor： MAJOR HAROLD W JR

IPC: H01J49/32 ,  B01D59/44

CPC classification number: H01J49/324

Abstract: A method of ion kinetic energy analysis is provided by forming ions including metastable ions from a vaporized sample material, accelerating the ions toward a target collector electrode through an electric field, and for an interval of time for enhancing the probability of decomposition of the metastable ions in an area along a trajectory of the ions intermediate the ion source and the electric field, varying the electric field intensity for causing daughter ions of differing kinetic energy to be successively focused at a point along the trajectory and providing a spectrum display of the intensity of the ions formed at the point in synchronism with the field variation.

Abstract translation: 通过形成离子包括来自气化样品的亚稳离子的离子来提供离子动能分析的方法，通过电场将离子加速到目标集电极，并提供一段时间以提高亚稳离子的分解概率 在沿着离子源和电场之间的离子的轨迹的区域中，改变电场强度以使不同动能的子离子在沿着轨迹的点处连续聚焦，并提供光谱显示的强度 在与场变化同步的点处形成的离子。