Abstract:
A tandem mass spectrometer includes an ion source, a first mass analyzer, a second mass analyzer, and a detector. An electron focusing source is provided between the first mass analyzer and the second mass analyzer in order to provide for dissociation of a parent ion beam into a plurality of daughter ion beams. In a first embodiment, the focused electron source comprises a cylindrical cathode having a concentric cylindrical anode in its interior. Control of the cathode temperature and the potential between the cathode and the anode provides a desired electron flux along the axis of the source. The second embodiment, the desired electron flux is provided by a field emission electrode.
Abstract:
A tandem mass spectrometer includes an ion source, a first mass analyzer, a microchannel collision plate, a second mass analyzer, and a detector. The microchannel collision plate comprises a matrix defining a plurality of microchannels which are disposed in a generally parallel orientation with a beam of parent ions emanating from the first mass analyzer. Collision of the parent ions with the internal surfaces of the microchannels causes the parent ions to dissociate into daughter ions. The second mass analyzer distinguishes between various mass fractions of the daughter ions, allowing the detector to quantitate said fractions and produce a mass spectra of the material being analyzed.