Invention Grant
US5801380A Array detectors for simultaneous measurement of ions in mass spectrometry
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用于在质谱中同时测量离子的阵列检测器
- Patent Title: Array detectors for simultaneous measurement of ions in mass spectrometry
- Patent Title (中): 用于在质谱中同时测量离子的阵列检测器
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Application No.: US600861Application Date: 1996-02-09
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Publication No.: US5801380APublication Date: 1998-09-01
- Inventor: Mahadeva P. Sinha
- Applicant: Mahadeva P. Sinha
- Applicant Address: CA Pasadena
- Assignee: California Institute of Technology
- Current Assignee: California Institute of Technology
- Current Assignee Address: CA Pasadena
- Main IPC: H01J31/50
- IPC: H01J31/50 ; H01J49/02 ; H01J49/32 ; H01J49/00 ; B01D59/44
Abstract:
Improvements for viewing particles, e.g. electrons or ions, in mass spectrometer systems. A special kind of system allows a phosphor to be formed which does not include any kind of conductive layer thereon. The particles impinge directly on the phosphor, and produce light that shines through an ITO layer. This special system enables lower voltage, and smaller systems. Another improvement enables direct viewing of ions from the system.
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