Voltage stabilising arrangements
    1.
    发明授权
    Voltage stabilising arrangements 失效
    电压稳定装置

    公开(公告)号:US3842342A

    公开(公告)日:1974-10-15

    申请号:US36919173

    申请日:1973-06-12

    申请人: ASS ELECT IND

    IPC分类号: H02J3/16 H02J3/12

    CPC分类号: H02J3/16 Y02E40/34

    摘要: A voltage stabilising arrangement for alternating current supplies in which a H.T. transmission line supplies a lower voltage feed conductor via a step-down transformer, having a saturated reactor connected to the feed conductor, a first series capacitor associated directly with the reactor for compensating the slope reactance of the reactor, and at least one other series capacitor associated with the transformer for compensating the leakage reactance of the latter, with the capacitors chosen so that together they provide slope compensation for the transmission line, each said capacitor having at least one bypass filter in parallel with it for suppressing instabilitygenerating harmonics which may be generated within the arrangement. With such an arrangement it is possible to create constant voltage levels both on the H.T. line and the feed conductor.

    摘要翻译: 一种用于交流电源的稳压装置,其中H.T. 传输线通过降压变压器提供较低电压的馈电导体,具有连接到馈电导体的饱和电抗器,与电抗器直接相连的第一串联电容器,用于补偿电抗器的斜率电抗,以及至少一个其它串联电容器 与变压器相关联,用于补偿后者的漏电抗,其中选择的电容器一起为传输线提供斜率补偿,每个所述电容器具有与其并联的至少一个旁通滤波器,用于抑制不稳定产生的谐波 这可以在该布置内产生。

    A.c.power system couplings
    2.
    发明授权
    A.c.power system couplings 失效
    A.C.POWER SYSTEM COUPLINGS

    公开(公告)号:US3745416A

    公开(公告)日:1973-07-10

    申请号:US3745416D

    申请日:1971-07-02

    申请人: ASS ELECT IND

    发明人: THANAWALA H

    IPC分类号: H02H9/00 H02H9/02

    CPC分类号: H02H9/021 H02H9/007

    摘要: In a short-circuit limiting coupling comprising a series combination of inductance and capacitance tuned to power-system frequency, at least a portion of the capacitance is connected in parallel with a bypass circuit which, at least in effect, comprises two parallel branches, one of the branches comprising a first saturable reactor in series with a first resistance shunted by a second saturable reactor, and the other branch comprising a second resistance in series with a rejector filter such as a parallel resonant circuit, also tuned to power-system frequency. The second reactor is designed to desaturate at a somewhat higher current level than the first; the first resistance will therefore assist in the recovery of the first reactor. The second resistance will damp harmonic and, more importantly, sub-harmonic oscillations.

    Electron spectroscopy
    3.
    发明授权
    Electron spectroscopy 失效
    电子光谱

    公开(公告)号:US3733483A

    公开(公告)日:1973-05-15

    申请号:US3733483D

    申请日:1971-02-26

    申请人: ASS ELECT IND

    发明人: GREEN B WATSON J

    IPC分类号: H01J49/48 G01T1/36

    CPC分类号: H01J49/484 H01J49/48

    摘要: An electron spectroscopy apparatus has an analyzer and a retardation lens system. In a first mode of operation, no retardation is applied, and the analyzer scans a low-energy range of the energy spectrum. In a second mode, retardation is applied, and the analyzer scans a high-energy range. The retardation is varied in synchronism with the scanning of the analyzer, so as to maintain a constant retardation factor.

    摘要翻译: 电子光谱仪具有分析仪和延迟透镜系统。 在第一种操作模式下,不施加延迟,分析仪扫描能量谱的低能量范围。 在第二模式中,应用延迟,并且分析仪扫描高能量范围。 延迟与分析仪的扫描同步变化,以保持恒定的延迟因子。

    Viewing screen mechanism for electron microscope
    4.
    发明授权
    Viewing screen mechanism for electron microscope 失效
    查看电子显微镜的屏幕机制

    公开(公告)号:US3696245A

    公开(公告)日:1972-10-03

    申请号:US3696245D

    申请日:1970-04-28

    申请人: ASS ELECT IND

    CPC分类号: H01J37/224 H01J37/16

    摘要: An electron microscope comprising a microscope chamber having a viewing screen positioned within the chamber and mounted for movement to at least a first position away from a beam of electrons or a second position in which electrons passing through an object or specimen are intercepted by the viewing screen to thereby produce an image. A drive motor is coupled to the viewing screen for moving the screen to either the first or the second position.

    摘要翻译: 一种电子显微镜,包括具有位于所述室内的观察屏幕的显微镜室,并安装成用于移动至远离电子束的至少第一位置或第二位置,其中通过物体或样品的电子被观察屏幕截取 从而产生图像。 驱动马达耦合到观察屏幕,用于将屏幕移动到第一或第二位置。

    Gas blast interrupters
    6.
    发明授权
    Gas blast interrupters 失效
    气体中断

    公开(公告)号:US3683141A

    公开(公告)日:1972-08-08

    申请号:US3683141D

    申请日:1970-06-23

    IPC分类号: H01H33/86

    CPC分类号: H01H33/86

    摘要: A gas blast interrupter has two hollow contact assemblies enclosed in a housing which can be filled with compressed air. A main exhaust valve, when opened, discharges compressed air from the interior of one contact assembly and thereby brings about separation of its contact making part from the contact making part of the second contact assembly. A further exhaust valve, when opened, discharges compressed air from the housing through the second contact assembly. The interrupter has a control valve having a first operative position in which compressed air is utilized to bring about the sequential opening of the main exhaust valve and the further exhaust valve and to close those valves after their contact making parts have separated, and having a second operative position in which compressed air is utilized to cause the contact making parts to engage and the contact assemblies and the housing to be filled with compressed air.

    摘要翻译: 气体灭火器具有封闭在壳体中的两个中空接触组件,其可以填充压缩空气。 主排气阀当打开时,从一个接触组件的内部排出压缩空气,从而使其接触制造部件与第二接触组件的接触部分分离。 进一步的排气阀在打开时通过第二接触组件从壳体排出压缩空气。 断流器具有控制阀,该控制阀具有第一操作位置,在该第一操作位置中,利用压缩空气来实现主排气阀和另外的排气阀的顺序打开,并且在其接触制造部件分离之后关闭这些阀,并且具有第二 使用压缩空气来使接触制造部件接合并且接触组件和壳体被填充有压缩空气的操作位置。

    Electron microscope with multi-focusing electron lens
    7.
    发明授权
    Electron microscope with multi-focusing electron lens 失效
    电子显微镜与多重聚焦电子镜头

    公开(公告)号:US3660657A

    公开(公告)日:1972-05-02

    申请号:US3660657D

    申请日:1969-11-25

    申请人: ASS ELECT IND

    发明人: BROOKES KENNETH A

    IPC分类号: H01J37/04 H01J37/20 H01J37/26

    CPC分类号: H01J37/04 H01J37/20

    摘要: An electron lens having two pole pieces spaced along a lens axis so as to define a gap between the pole pieces, coil means associated with the pole pieces for, upon being energized, exciting the pole pieces to deflect an electron beam in a manner such that the beam intersects the lens axis at a plurality of points and thereby defining a plurality of focal points along the lens axis when the electron beam emerges parallel to the lens axis. The electron lens also includes an adjustable support means for positioning an object to be imaged.

    摘要翻译: 一种电子透镜,具有沿着透镜轴线间隔开的两个极片,以便限定极片之间的间隙,与极片相关联的线圈装置,在被激励时,激励极片以使电子束偏转,使得 光束在多个点处与透镜轴相交,从而当电子束平行于透镜轴线时,沿着透镜轴限定多个焦点。 电子透镜还包括用于定位待成像对象的可调支撑装置。

    Beam correcting device for mass spectrometers and method of operation
    8.
    发明授权
    Beam correcting device for mass spectrometers and method of operation 失效
    用于质谱仪的光束校正装置和操作方法

    公开(公告)号:US3657531A

    公开(公告)日:1972-04-18

    申请号:US3657531D

    申请日:1970-05-15

    申请人: ASS ELECT IND

    CPC分类号: H01J49/06 H01J49/326

    摘要: A beam correcting device which may be utilized with mass spectrometers for altering the configuration of the beam of ions passing through the mass spectrometer. The beam altering device may include at least four electrodes disposed at substantially equal positions around the beam of ions and positioned at substantially a point along the beam at which the beam is of a minimum thickness. An electrical control circuit is coupled to the electrodes for applying at least four electrical signals, each of a predetermined value, to the electrodes to establish an electrostatic field about the beam of ions. By varying the potentials applied to the various electrodes, a beam having an arcuate cross-sectional configuration may be altered to produce a beam having a generally rectangular cross-sectional configuration thereby compensating for the effect on the beam caused by undesirable fringing fields.

    摘要翻译: 光束校正装置,其可与质谱仪一起使用,以改变通过质谱仪的离子束的构型。 光束改变装置可以包括设置在围绕离子束的基本相等的位置处的至少四个电极,并且位于基本上沿着光束的光束处于最小厚度的点处。 电控制电路耦合到电极,用于向电极施加至少四个预定值的电信号,以建立围绕离子束的静电场。 通过改变施加到各种电极的电位,可以改变具有弓形横截面构型的梁,以产生具有大致矩形横截面构造的梁,从而补偿由不期望的边缘场引起的对梁的影响。

    Aperture plate control mechanism for electron microscopes
    9.
    发明授权
    Aperture plate control mechanism for electron microscopes 失效
    电子显微镜的光栅控制机制

    公开(公告)号:US3638015A

    公开(公告)日:1972-01-25

    申请号:US3638015D

    申请日:1970-03-31

    申请人: ASS ELECT IND

    IPC分类号: H01J37/02 H01J37/20 H01J37/26

    CPC分类号: H01J37/023 H01J37/20

    摘要: An electron microscope comprising a microscope chamber having an aperture plate control mechanism mounted thereon and including an aperture support arm extending into the microscope chamber and mounted for movement along a longitudinal axis of said arm, and an aperture plate having at least one aperture, or passage, extending therethrough and being pivotably mounted on the support arm. First and second drive means are coupled to the support arm and the aperture plate, respectively, for varying the position of the aperture plate with respect to a beam of electrons.

    摘要翻译: 一种电子显微镜,包括具有安装在其上的孔板控制机构的显微镜室,所述显微镜室包括延伸到所述显微镜室中的孔支撑臂,并且安装成用于沿着所述臂的纵向轴线移动;以及孔板,其具有至少一个孔或通道 延伸穿过并且可枢转地安装在支撑臂上。 第一和第二驱动装置分别联接到支撑臂和孔板,以改变孔板相对于电子束的位置。