公开(公告)号：US20240322816A1

公开(公告)日：2024-09-26

申请号：US18673151

申请日：2024-05-23

Applicant: Rohm Co., Ltd.

Inventor： Takeshi KIKUCHI ,  Masato Nishinouchi ,  Akio SASABE ,  Daiki YANAGISHIMA

IPC: H03K17/18 ,  H02P29/024

CPC classification number: H03K17/18 ,  H02P29/0241

Abstract: A signal transmission device that transmits a driving signal for a power transistor from a primary circuit system to a secondary circuit system while isolating between the primary and secondary circuit systems includes: a first fault detection circuit configured to detect a fault in the primary circuit system; a second fault detection circuit configured to detect a fault in the secondary circuit system; a first signal transmission path configured to transmit the result of detection by the second fault detection circuit from the secondary circuit system to the primary circuit system while isolating between the primary and secondary circuit systems; and a self-test circuit configured to perform a self-test on each of the first fault detection circuit, the second fault detection circuit, and the first signal transmission path.

公开(公告)号：US12081203B2

公开(公告)日：2024-09-03

申请号：US17440898

申请日：2020-03-23

Applicant: HORIZON GLOBAL AMERICAS INC.

Inventor： Chandrakumar D. Kulkarni

IPC: H03K17/08 ,  H03K17/082 ,  H03K17/18

CPC classification number: H03K17/0822 ,  H03K17/18 ,  H03K2217/0027

Abstract: A diagnostic circuit for an electronic control unit comprises a field-effect transistor device, a comparator circuit, and a microprocessor. The diagnostic circuit detects a short to ground detection and turns off the field-effect transistor device. The diagnostic circuit may include redundant or dual short to ground protection for a field-effect transistor device. The comparator circuit generates an interrupt signal based on comparing a sensed parameter of an output signal of the field-effect transistor device to a threshold value. The microprocessor samples output from the field-effect transistor device and compares the sampled output to a power limit threshold. The microprocessor turns off the field-effect transistor device based on receiving the interrupt signal or comparison of the sampled output to the power limit threshold. Detection or prevention of a short to ground protects the field-effect transistor device.

公开(公告)号：US12047060B2

公开(公告)日：2024-07-23

申请号：US17994131

申请日：2022-11-25

Applicant: FUJI ELECTRIC CO., LTD.

Inventor： Hiroaki Ichikawa

IPC: H03K17/14 ,  G01R31/26 ,  H03K17/08 ,  H03K17/18 ,  H03K17/284 ,  H03K19/20

CPC classification number: H03K17/14 ,  G01R31/2607 ,  H03K17/08 ,  H03K17/18 ,  H03K17/284 ,  H03K19/20

Abstract: A drive device for driving a voltage-controlled semiconductor element. The drive device includes: a drive circuit connected to the gate of the semiconductor element via a gate resistor; a delay circuit connected to the drive circuit, for delaying a drive signal output from the drive circuit until a gate voltage of the semiconductor element enters a Miller effect period, which is a period during which the gate voltage transitionally changes, the gate voltage having temperature dependency on a chip temperature of the semiconductor element; a one-shot circuit connected to the delay circuit, for outputting a pulse signal with a pulse width shorter than the Miller effect period; a comparator that compares the gate voltage with a reference voltage; and an AND circuit that outputs an overheat detection signal in response to the gate voltage exceeding the reference voltage.

公开(公告)号：US12023520B2

公开(公告)日：2024-07-02

申请号：US18143619

申请日：2023-05-05

Applicant: SIEMENS HEALTHINEERS INTERNATIONAL AG

Inventor： Reto Filiberti

IPC: A61N5/10 ,  A61B6/46 ,  H01H9/16 ,  H01H13/02 ,  H01H13/70 ,  H05G1/56 ,  H05G1/58 ,  A61B6/04 ,  A61B17/00 ,  H03K17/18 ,  H03K17/955 ,  H03K17/96

CPC classification number: A61N5/1048 ,  A61B6/461 ,  A61B6/467 ,  H01H9/161 ,  H01H13/023 ,  H01H13/70 ,  H05G1/56 ,  H05G1/58 ,  A61B6/0487 ,  A61B2017/00017 ,  A61B2017/00199 ,  A61N2005/1074 ,  H01H2013/026 ,  H01H2239/006 ,  H01H2239/064 ,  H01H2300/014 ,  H01H2300/038 ,  H01H2300/04 ,  H03K17/18 ,  H03K17/955 ,  H03K17/96 ,  H03K17/962

Abstract: A radiation therapy system includes an X-ray imaging system that is configured with a combined and simplified filter and collimator positioning mechanism. In addition, an X-ray imager of the RT system is only positioned at a few discrete locations within a plane that is a fixed distance from the imaging X-ray source when generating X-ray images. As a result, for each of these discrete imaging positions, the simplified filter and collimator positioning mechanism positions a specific collimator-filter combination in a specific location between the X-ray source and the imager.

公开(公告)号：US20240134406A1

公开(公告)日：2024-04-25

申请号：US18379262

申请日：2023-10-11

Applicant: STMicroelectronics (Grenoble 2) SAS ,  STMicroelectronics (Alps) SAS

Inventor： Julien GOULIER ,  Nicolas GOUX ,  Marc JOISSON

IPC: G05F3/26 ,  G05F1/46 ,  H03K17/18 ,  H03K17/22

CPC classification number: G05F3/262 ,  G05F1/468 ,  H03K17/18 ,  H03K17/22 ,  H03F3/45179

Abstract: An electronic circuit includes a reference voltage circuit and a circuit for checking the starting operation of the reference voltage circuit. The reference voltage circuit includes a first stack of a first transistor and second transistor receiving first and second control signals, respectively. The start check circuit includes a first elementary test circuit including a second stack of a third transistor and fourth transistor receiving the first and second control signals, respectively. An output of the first elementary test circuit delivers a first binary signal indicative of proper starting operation of the reference voltage circuit.

公开(公告)号：US11962233B2

公开(公告)日：2024-04-16

申请号：US18141911

申请日：2023-05-01

Applicant: Skyworks Solutions, Inc.

Inventor： Michael Robert May ,  Fernando Naim Lavalle Aviles ,  Carlos Jesus Briseno-Vidrios ,  Patrick Johannus De Bakker ,  Gabor Marek ,  Charles Guo Lin ,  Peter Onody ,  Tamas Marozsak ,  Andras V. Horvath

IPC: H02M1/08 ,  H03K17/18 ,  H03K17/68 ,  H03K17/689 ,  H03K17/691 ,  H03K17/567

CPC classification number: H02M1/08 ,  H03K17/18 ,  H03K17/689 ,  H03K17/691 ,  H03K17/567 ,  H03K2217/0081

Abstract: An isolated gate driver has a first portion in a first voltage domain and a second portion in a second voltage domain. The first and second portions are coupled by an isolation communication channel. The isolated gate driver transmits across the isolation communication channel a serial word containing first drive strength information and simultaneously transmits gate information with the serial word across the isolation communication channel. The gate information indicates a state of a gate signal for a transistor coupled to the second portion of the isolated gate driver. A demodulator circuit demodulates a signal containing the gate information and the drive strength information transmitted across the isolation communication channel in the serial word. A gate signal output circuit coupled to the demodulator circuit supplies the gate signal based on the gate information with a drive strength of the gate signal being based on the drive strength information.

公开(公告)号：US11881848B2

公开(公告)日：2024-01-23

申请号：US17435583

申请日：2020-02-27

Applicant: Webasto SE

Inventor： Philipp Eck

IPC: G01R31/26 ,  H03K17/18 ,  G01R31/27 ,  H03K17/082

CPC classification number: H03K17/18 ,  G01R31/2617 ,  G01R31/2621 ,  G01R31/275 ,  H03K17/082

Abstract: The invention provides a method for checking a semiconductor switch for a fault, wherein the semiconductor switch is driven with a PWM signal with a variable duty cycle. To the benefit of determining faults on the semiconductor switch reliably and cost-effectively, it is provided that if the semiconductor switch is operated with a duty cycle of 100% or 0%, the current measurement of the overall system is evaluated, while if the semiconductor switch is operated with a duty cycle of between 0% and 100%, the generated voltage pulses across the semiconductor switch are evaluated.

公开(公告)号：US20230372737A1

公开(公告)日：2023-11-23

申请号：US18227992

申请日：2023-07-31

Applicant: Varian Medical Systems, Inc.

Inventor： Ross HANNIBAL ,  Wade CURTISS

IPC: A61N5/10 ,  A61B6/00 ,  H01H13/70 ,  H01H9/16 ,  H05G1/56 ,  H05G1/58 ,  H01H13/02 ,  H03K17/18 ,  A61B17/00 ,  A61B6/04 ,  H03K17/96 ,  H03K17/955

CPC classification number: A61N5/1048 ,  A61B6/461 ,  H01H13/70 ,  H01H9/161 ,  H05G1/56 ,  H05G1/58 ,  H01H13/023 ,  A61B6/467 ,  H01H2239/064 ,  H01H2300/014 ,  H03K17/18 ,  A61B2017/00017 ,  H01H2300/04 ,  A61B6/0487 ,  H03K17/96 ,  H01H2013/026 ,  H01H2239/006 ,  H01H2300/038 ,  H03K17/962 ,  A61N2005/1074 ,  H03K17/955 ,  A61B2017/00199

Abstract: A motion-enable device includes a mechanical switch and a capacitive sensor with a sensing region that is located adjacent to the mechanical switch. The mechanical switch enables a first signal when closed or actuated that indicates that the mechanical switch is in an active state. The capacitive sensor enables a second signal when a conductive object is disposed in the sensing region, where the second signal indicates that the capacitive sensor is in an active state. Enablement of operation of an apparatus depends on receipt of both the first signal and the second signal. The mechanical switch and the capacitive sensor act as the two separate switches required by functional safety requirements for a motion enable device. Because the sensing region of the capacitive sensor is adjacent to the mechanical switch, the first and second signals are generated when an operator actuates the mechanical switch with a single digit.

公开(公告)号：US11664718B2

公开(公告)日：2023-05-30

申请号：US16969111

申请日：2019-02-12

Applicant: Know Moore LTD.

Inventor： David Summerland

IPC: H02M1/08 ,  H02K11/33 ,  H10B69/00 ,  H03K17/18 ,  H01L27/102

CPC classification number: H02M1/08 ,  H01L27/1026 ,  H02K11/33 ,  H03K17/18 ,  H03K2217/0027 ,  H03K2217/0081

Abstract: A transistor device includes a transistor and programmable controller. The controller has an output that controls operation of the transistor. The controller includes analog computing circuitry and optionally digital computing circuitry that may be used to setup the analog computing circuitry. In addition to two connectors for connecting the transistor into an external circuit, the device includes a further connector that provides an input to the controller and through which the control can be programmed post manufacture. The transistor device may be a discrete component in which transistor and controlling circuitry are held in packaging, the three connectors exposed through the packaging in order to connect the device to an external circuit.

公开(公告)号：US20190229724A1

公开(公告)日：2019-07-25

申请号：US16371331

申请日：2019-04-01

Applicant: Texas Instruments Incorporated

Inventor： Xiong Li ,  Anant Kamath

IPC: H03K17/567 ,  H03K17/18 ,  G01R31/28

CPC classification number: H03K17/567 ,  G01R31/2608 ,  G01R31/2621 ,  G01R31/2817 ,  G01R31/2837 ,  G01R31/2849 ,  G01R31/42 ,  H03K17/18

Abstract: An isolated insulated gate bipolar transistor (IGBT) gate driver is provided which integrates circuits, in-module, to support the measurements of threshold voltage, and collector-emitter saturation voltage of IGBTs. The measured gate threshold and collector-emitter saturation voltage can be used as precursors for state of health predictions for IGBTs. During the measurements, IGBTs are biased under specific conditions chosen to quickly elicit collector-emitter saturation and gate threshold information. Integrated analog-to-digital converter (ADC) circuits are used to convert measured analog signals to a digital format. The digitalized signals are transferred to a micro controller unit (MCU) for further processing through serial peripheral interface (SPI) circuits.