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    QUANTUM DOT PHOTODETECTOR APPARATUS AND ASSOCIATED METHODS
    4.
    发明申请
    QUANTUM DOT PHOTODETECTOR APPARATUS AND ASSOCIATED METHODS 审中-公开

    公开(公告)号：US20180337295A1

    公开(公告)日：2018-11-22

    申请号：US15779213

    申请日：2016-11-24

    Applicant: EMBERION OY

    Inventor： Sami Seppo Antero KALLIOINEN ,  Martti Kalevi VOUTILAINEN

    IPC: H01L31/0352 ,  H01L31/112 ,  H01L27/144 ,  G01J1/42 ,  G01J1/44

    CPC classification number: H01L31/035218 ,  G01J1/00 ,  G01J1/4228 ,  G01J1/44 ,  H01L27/1443 ,  H01L31/112 ,  H01L31/18 ,  H01L51/42

    Abstract: An apparatus comprising at least one pair of first and second photodetectors, each photodetector of the photodetector pair comprising a channel member, respective source and drain electrodes configured to enable a flow of electrical current 5 through the channel member between the source and drain electrodes, and a plurality of quantum dots configured to generate electron-hole pairs on exposure to incident electromagnetic radiation to produce a detectable change in the electrical current flowing through the channel member, wherein the apparatus is configured such that the first and second photodetectors 10 of the photodetector pair generate electron-hole pairs which produce an increase and decrease in electrical current through the channel members respectively, the combined change in electrical current of the pair of first and second photodetectors being indicative of one or more of the presence and magnitude of the incident electromagnetic radiation.

    Spectral Differentiation of Histological Stains
    6.
    发明申请
    Spectral Differentiation of Histological Stains 审中-公开

    公开(公告)号：US20170176325A1

    公开(公告)日：2017-06-22

    申请号：US15379119

    申请日：2016-12-14

    Applicant: Abbott Laboratories

    Inventor： Svitlana Y. Berezhna ,  Rene Nieves Alicea ,  Ema C. Ciucurel

    IPC: G01N21/31 ,  G01N1/30 ,  G01N33/483

    CPC classification number: G01N21/314 ,  G01J1/00 ,  G01J3/10 ,  G01N1/30 ,  G01N21/31 ,  G01N33/4833 ,  G01N2021/3196

    Abstract: The instant disclosure provides spectrophotometric methods for assessing histological stains used in a histology analyzer. The methods find use in various assessments including determinations of the identity of a histological stain, determinations of the quality of a histological stain, etc. Also included are devices and systems for practicing the described methods. The instant disclosure also provides computer readable media containing libraries of reference spectrophotometric characteristics of histological stains useful in assessing a histological stain used in a histology analyzer. Also provided is computer readable media containing instructions that cause a computing device to perform steps for making an assessment of a histological stain.

    Wave front aberration metrology of optics of EUV mask inspection system
    9.
    发明授权
    Wave front aberration metrology of optics of EUV mask inspection system 有权
    EUV面罩检测系统光学波前像差计量学

    公开(公告)号：US09335206B2

    公开(公告)日：2016-05-10

    申请号：US14010484

    申请日：2013-08-26

    Applicant: KLA-Tencor Corporation

    Inventor： Qiang Zhang ,  Yanwei Liu ,  Abdurrahman Sezginer

    IPC: G01J1/00 ,  G01J1/42 ,  G21K7/00 ,  G02B5/08

    CPC classification number: G01J1/00 ,  G01J1/4257 ,  G02B5/0833 ,  G02B5/0891 ,  G03F1/24 ,  G03F1/50 ,  G03F1/52 ,  G03F1/84 ,  G21K7/00

    Abstract: Disclosed is test structure for measuring wave-front aberration of an extreme ultraviolet (EUV) inspection system. The test structure includes a substrate formed from a material having substantially no reflectivity for EUV light and a multilayer (ML) stack portion, such as a pillar, formed on the substrate and comprising a plurality of alternating pairs of layers having different refractive indexes so as to reflect EUV light. The pairs have a count equal to or less than 15.

    Abstract translation: 公开了用于测量极紫外（EUV）检测系统的波前像差的测试结构。 测试结构包括由基本上不对EUV光反射的材料形成的基板和形成在基板上的多层（ML）堆叠部分，例如柱状物，并且包括具有不同折射率的多个交替对的层， 反映EUV光。 这些对具有等于或小于15的计数。

    High efficiency photoelectric cell
    10.
    发明授权
    High efficiency photoelectric cell 有权
    高效光电池

    公开(公告)号：US09239258B1

    公开(公告)日：2016-01-19

    申请号：US13631340

    申请日：2012-09-28

    Applicant: Paul David Swanson ,  Richard L. Waters

    Inventor： Paul David Swanson ,  Richard L. Waters

    IPC: G01J1/00

    CPC classification number: G01J1/00 ,  G01T1/28 ,  H01J40/06

    Abstract: A photoelectric cell comprising: a cathode layer configured to eject electrons in response to receiving photons from a light source; a substantially-photon-transparent anode configured to receive the ejected electrons; first and second, substantially-photon-transparent, dielectric layers, wherein the first dielectric layer is disposed between the cathode layer and the anode layer and wherein the anode layer is disposed between the first and second dielectric layers such that the cathode layer, the first dielectric layer, the anode layer, and the second dielectric layer form a layered stack; and wherein at least a first portion of the layered stack overlaps a second portion of the layered stack.

    Abstract translation: 一种光电池，包括：阴极层，被配置为响应于从光源接收光子而弹出电子; 被配置为接收所喷射的电子的基本上为光子的透明阳极; 第一和第二基本上光子透明的电介质层，其中第一介电层设置在阴极层和阳极层之间，并且其中阳极层设置在第一和第二电介质层之间，使得阴极层，第一 电介质层，阳极层和第二介电层形成层叠堆叠; 并且其中所述分层堆叠的至少第一部分与所述分层堆叠的第二部分重叠。

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