公开(公告)号：US20240133682A1

公开(公告)日：2024-04-25

申请号：US18365375

申请日：2023-08-03

Applicant: CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED

Inventor： Fenglin ZHANG ,  Jianlin LIU ,  Shaoteng REN ,  Siyuan QI ,  Zhimeng SHI

IPC: G01B15/00 ,  G01B21/16

CPC classification number: G01B15/00 ,  G01B21/16 ,  H01M10/045

Abstract: A gap inspection apparatus and a gap inspection method are disclosed. The gap inspection apparatus is configured for a wound battery cell, where in a height direction of the wound battery cell. The gap inspection apparatus includes: an X-ray source and an X-ray detector and a bearing mechanism located between the X-ray source and the X-ray detector. The bearing mechanism includes at least one accommodating groove, the accommodating groove is configured to accommodate the wound battery cell, and the height direction of the wound battery cell crosses a first direction in which the X-ray source points to the X-ray detector. The X-ray source is configured to irradiate an arc-shaped area of the wound body portion, and the X-ray detector is configured to obtain an imaging image of the irradiated arc-shaped area, so as to obtain a gap value between two electrode plates within the arc-shaped area.

公开(公告)号：US11965731B2

公开(公告)日：2024-04-23

申请号：US17200868

申请日：2021-03-14

Applicant: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.

Inventor： Kuei-Sung Chang

IPC: G01B11/14 ,  G01B21/16 ,  H01L21/48 ,  H01L21/50 ,  H01L21/56 ,  H01L21/66 ,  H01L23/04 ,  H01L23/043 ,  H01L23/28 ,  G01B7/31

CPC classification number: G01B11/14 ,  G01B21/16 ,  H01L21/4817 ,  H01L21/50 ,  H01L21/56 ,  H01L22/12 ,  H01L23/04 ,  H01L23/043 ,  H01L23/28 ,  G01B7/31

Abstract: The present disclosure provides a measurement method including providing a base, a device disposed on the base, and a lid disposed over the base and the device; irradiating a top surface of the device through an opening of the lid to obtain a first focal plane associated with a top surface of the device; irradiating the lid at the lower end of the opening to obtain a second focal plane associated with the lid at the lower end of the opening; and deriving a distance between the top surface of the device and an interior surface of the lid facing the top surface of the device based on a difference between a level of the first focal plane and a level of the second focal plane. The present disclosure also provides a package structure for the measurement.

公开(公告)号：US11709153B2

公开(公告)日：2023-07-25

申请号：US17102255

申请日：2020-11-23

Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.

Inventor： Jun-Hao Deng ,  Kuan-Wen Lin ,  Sheng-Chi Chin ,  Yu-Ching Lee

IPC: G01N29/44 ,  B08B13/00 ,  G01B17/00 ,  G01B21/16 ,  B08B3/04 ,  B08B5/02 ,  H01L21/02 ,  H01L21/288 ,  H01L21/67 ,  H01L21/66 ,  G01B17/02

CPC classification number: G01N29/44 ,  B08B3/04 ,  B08B5/02 ,  B08B13/00 ,  G01B17/00 ,  G01B17/02 ,  G01B17/025 ,  G01B21/16 ,  H01L21/02041 ,  H01L21/02282 ,  H01L21/02623 ,  H01L21/288 ,  H01L21/67253 ,  H01L22/10 ,  G01N2291/044

Abstract: Methods and systems disclosed herein use acoustic energy to determine a gap between a wafer and an integrated circuit (IC) processing system and/or determine a thickness of a material layer of the wafer during IC processing implemented by the IC processing system. An exemplary method includes emitting acoustic energy through a substrate and a material layer disposed thereover. The substrate is positioned within an IC processing system. The method further includes receiving reflected acoustic energy from a surface of the substrate and a surface of the material layer disposed thereover and converting the reflected acoustic energy into electrical signals. The electrical signals indicate a thickness of the material layer.

公开(公告)号：US20190025126A1

公开(公告)日：2019-01-24

申请号：US15960887

申请日：2018-04-24

Applicant: BOE TECHNOLOGY GROUP CO., LTD. ,  HEFEI XINSHENG OPTOELECTRONICS TECHNOLOGY CO., LTD.

Inventor： Lixin ZHU ,  Ke DAI ,  Chunyang NIE

IPC: G01J3/50 ,  G01J3/02 ,  G01B21/16 ,  G01B21/20

CPC classification number: G01J3/506 ,  G01B21/16 ,  G01B21/20 ,  G01B21/22 ,  G01J3/0202 ,  G06T7/0004 ,  G06T7/90 ,  G06T2207/10024 ,  G06T2207/30121

Abstract: Disclosed are display panel test device and method. The device comprises: a color analyser including a host and a measuring probe, wherein the measuring probe can obtain optical information of a positional point of a light emitting surface of display panel, the positional point being a point to which the measuring probe is aligned on the light emitting surface, and the host can determine optical characteristics of the positional point according to the optical information; and a position determination component, configured to determine a positional identifier of the positional point on the light emitting surface, the positional identifier being capable of indicating a relative position of the positional point on the light emitting surface. Since the position determination component determines the position of the to-be-tested point, it is not necessary to visually place the measuring probe over the to-be-tested point, thereby improving the determination accuracy of the to-be-tested point.

公开(公告)号：US20180354725A1

公开(公告)日：2018-12-13

申请号：US15570713

申请日：2016-03-10

Applicant: The Yokohama Rubber Co., LTD.

Inventor： Gang Hou

IPC: B65G43/02 ,  G01B21/16

CPC classification number: B65G43/02 ,  B65G45/12 ,  B65G2203/043 ,  B65G2203/044 ,  B65G2207/48 ,  G01B21/16

Abstract: Provided is a conveyor belt wear monitoring system including a non-contact sensor arranged facing a surface of an upper cover rubber. A distance to the surface of the upper cover rubber is detected using the non-contact sensor in a predetermined range in a belt width direction of the upper cover rubber of the traveling conveyor belt. An amount of wear of the upper cover rubber is obtained by comparing the detection data with pre-stored reference data.

公开(公告)号：US20180335089A1

公开(公告)日：2018-11-22

申请号：US15596122

申请日：2017-05-16

Applicant: Schaeffler Technologies AG & Co. KG

Inventor： Shakeel Shaikh ,  Alaa Makke ,  Andreas Woellner ,  Gerhard Meyer

IPC: F16C35/04 ,  B23P19/10 ,  F16C19/10 ,  G01B21/16 ,  B60G15/06

CPC classification number: F16C35/042 ,  B23P19/10 ,  B60G15/067 ,  B60G2204/128 ,  B60G2204/418 ,  F16C19/10 ,  F16C2226/12 ,  F16C2326/05 ,  G01B21/16

Abstract: A strut bearing, including: an axis of rotation; cap; a body portion; and a bearing fixed to the strut bearing cap and to the body portion. The cap includes: a first radial surface facing in a first axial direction; a plurality of ribs; a plurality of spaces, each space circumferentially disposed between a respective pair of ribs; and a plurality of radial recess surfaces. Each rib includes: a radial rib surface extending radially outwardly from the first radial surface; and a slant surface extending from the radial rib surface partly radially outwardly and partly in a second axial direction, opposite the first axial direction. Each radial recess surface: faces in the first axial direction; is circumferentially disposed between two respective ribs; and is off-set, in the second axial direction, from the first radial surface.

公开(公告)号：US20180333857A1

公开(公告)日：2018-11-22

申请号：US15925883

申请日：2018-03-20

Applicant: Fanuc Corporation

Inventor： Toshiyuki Ando

IPC: B25J9/16 ,  B25J13/08 ,  G01B21/16

CPC classification number: B25J9/1684 ,  B25J9/0096 ,  B25J9/1612 ,  B25J9/1694 ,  B25J9/1697 ,  B25J13/08 ,  B25J13/088 ,  B25J19/02 ,  G01B21/16 ,  G05B2219/39058 ,  G05B2219/39473 ,  G05B2219/39484 ,  G05B2219/39527 ,  G05B2219/40053

Abstract: A workpiece picking system including: a robot; a hand, attached to a hand tip portion of the robot, for picking workpieces; a three-dimensional sensor, attached to the hand tip portion, for acquiring positional information of a three-dimensional point group in a partial region in a container; a workpiece state calculation unit which calculates a position and posture of a workpiece based on positional information of a three-dimensional point group in an acquired first partial region; a data acquisition position calculation unit which calculates a robot corresponding to a second partial region where positional information is to be acquired next, based on the positional information of the three-dimensional point group in the acquired first partial region; and a control unit which controls the robot and the hand based on the calculated position and posture of the workpiece and based on the calculated robot position corresponding to the second partial region.

公开(公告)号：US10072927B2

公开(公告)日：2018-09-11

申请号：US14989907

申请日：2016-01-07

Applicant: RareCyte, Inc.

Inventor： Paulina Varshavskaya ,  Edward Shafer ,  Steve Quarre ,  Ronald C. Seubert

IPC: G01B21/16

CPC classification number: G01B21/16 ,  G01B21/04 ,  G01N35/04 ,  G01N2035/0493

Abstract: This disclosure is directed to a system and method for detecting a surface of a substrate within a scanner.

公开(公告)号：US09989353B2

公开(公告)日：2018-06-05

申请号：US15683892

申请日：2017-08-23

Applicant: FARO Technologies, Inc.

Inventor： Sebastian Bartmann ,  Helmut Kramer ,  Daniel Pompe ,  Michael Schanz

IPC: G01B11/24 ,  G01B11/00 ,  G01S17/89 ,  G01S17/02 ,  G01S7/48 ,  G01B11/25 ,  G01B21/16 ,  G01S17/06

CPC classification number: G01B11/002 ,  G01B11/2518 ,  G01B21/16 ,  G01S7/4808 ,  G01S17/023 ,  G01S17/06 ,  G01S17/89

Abstract: A method for optically scanning and measuring a scene by a laser scanner includes generating multiple scans; tracking scanner positions with a position-tracking device for the multiple scans and providing tracked scanner positions in response; registering sequentially scans selected from the multiple scans into clusters using registration points or targets and confirming registration of the scans into the clusters according to specified quality criteria being fulfilled; selecting scans from the clusters and forming pairs of scans; forming an intersection of the selected pairs and comparing a size of the intersection with a threshold value obtained based at least in part on the tracked scanner positions; and attempting to register the pairs of scans if the size of the intersection exceeds the threshold value and accepting the registered pairs of scans if the registration is successful.

公开(公告)号：US20180043445A1

公开(公告)日：2018-02-15

申请号：US15674637

申请日：2017-08-11

Applicant: Philip E. Ross ,  Douglas A. Ross, JR.

Inventor： Philip E. Ross ,  Douglas A. Ross, JR.

IPC: B23D59/00 ,  G01B21/16

CPC classification number: B23D59/001 ,  B23D59/008 ,  G01B21/16

Abstract: An apparatus and method for ensuring the accuracy and utility of cut-to-length systems. Multiple channels of measurement are employed, by which a first channel of measurement produces a first measurement of a work piece taken between a cutting mechanism and a limit stopper. A second channel of measurement produces a second measurement, wherein cutting of the work piece by the cutting mechanism cannot be made unless the first measurement agrees with the second measurement.