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公开(公告)号:US11658090B2
公开(公告)日:2023-05-23
申请号:US17232495
申请日:2021-04-16
Applicant: Samsung Electronics Co., Ltd.
Inventor: Heungkyu Kwon
IPC: H01L23/31 , H01L23/373 , H01L23/367 , H01L23/433 , H01L23/498 , H01L25/16
CPC classification number: H01L23/3675 , H01L23/3128 , H01L23/3735 , H01L25/16
Abstract: A semiconductor package system includes a substrate, a first and a second semiconductor package, a first thermal conductive layer, a first passive device, and a heat radiation structure. The first and second semiconductor package and first passive device may be mounted on a top surface of the substrate. The first semiconductor package may include a first semiconductor chip that includes a plurality of logic circuits. The first thermal conductive layer may be on the first semiconductor package. The heat radiation structure may be on the first thermal conductive layer, the second semiconductor package, and the first passive device. The heat radiation structure may include a first bottom surface physically contacting the first thermal conductive layer, and a second bottom surface at a higher level than that of the first bottom surface. The second bottom surface may be on the second semiconductor package and/or the first passive device.
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公开(公告)号:US11075138B2
公开(公告)日:2021-07-27
申请号:US16397278
申请日:2019-04-29
Applicant: Samsung Electronics Co., Ltd.
Inventor: Heungkyu Kwon
IPC: H01L23/373 , H01L23/31 , H01L23/367 , H01L23/00
Abstract: Provided is a semiconductor package system. The system includes a substrate, a first semiconductor package on the substrate, a second semiconductor package on the substrate, a first passive element on the substrate, a heat dissipation structure on the first semiconductor package, the second semiconductor package, and the first passive element, and a first heat conduction layer between the first semiconductor package and the heat dissipation structure. A sum of a height of the first semiconductor package and a thickness of the first heat conduction layer may be greater than a height of the first passive element. The height of the first semiconductor package may be greater than a height of the second semiconductor package.
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公开(公告)号:US11600607B2
公开(公告)日:2023-03-07
申请号:US16744437
申请日:2020-01-16
Applicant: Samsung Electronics Co., Ltd.
Inventor: Heungkyu Kwon
IPC: H01L25/16 , H01L23/538 , H01L23/498 , H01L23/367
Abstract: A semiconductor module may include a system board including a top surface and a bottom surface, a module substrate provided on the top surface of the system board, a system semiconductor package mounted on the module substrate, and first and second power management semiconductor packages mounted on the module substrate. The first and second power management semiconductor packages may be spaced apart from each other in a first direction, which is parallel to a top surface of the module substrate, with the system semiconductor package interposed therebetween.
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公开(公告)号:US11069623B2
公开(公告)日:2021-07-20
申请号:US16385089
申请日:2019-04-16
Applicant: Samsung Electronics Co., Ltd.
Inventor: Heungkyu Kwon
Abstract: Provided is a semiconductor package. The semiconductor package may include a substrate, a semiconductor chip on the substrate, a passive element on the substrate, a conductive structure on the substrate, and an interposer substrate on the semiconductor chip, the passive element, and the conductive structure. The interposer substrate may be electrically connected to the conductive structure. A height of the passive element may be greater than a height of the semiconductor chip.
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公开(公告)号:US09859237B2
公开(公告)日:2018-01-02
申请号:US14843326
申请日:2015-09-02
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Heungkyu Kwon , Inhyuk Kim
CPC classification number: H01L24/05 , G06F21/30 , H01L21/561 , H01L21/568 , H01L22/32 , H01L23/3114 , H01L23/3128 , H01L23/3192 , H01L24/03 , H01L24/06 , H01L24/11 , H01L24/13 , H01L24/19 , H01L24/20 , H01L24/48 , H01L24/85 , H01L25/0657 , H01L2224/0231 , H01L2224/0237 , H01L2224/02375 , H01L2224/02381 , H01L2224/0392 , H01L2224/0401 , H01L2224/04042 , H01L2224/04105 , H01L2224/05024 , H01L2224/05548 , H01L2224/06515 , H01L2224/12105 , H01L2224/13024 , H01L2224/131 , H01L2224/16227 , H01L2224/32145 , H01L2224/32225 , H01L2224/48091 , H01L2224/48227 , H01L2224/48247 , H01L2224/73253 , H01L2224/73265 , H01L2225/0651 , H01L2225/06517 , H01L2225/06558 , H01L2225/06568 , H01L2225/1023 , H01L2225/1035 , H01L2225/1041 , H01L2225/1058 , H01L2924/00014 , H01L2924/15311 , H01L2924/181 , H01L2924/18162 , H01L2924/00012 , H01L2224/45015 , H01L2924/207 , H01L2224/45099 , H01L2924/00 , H01L2924/014
Abstract: A chip includes a core layer, at least one redistribution layer formed on the core layer, and at least one triple pad connected to a pad of the core layer through the at least one redistribution layer or at least one via connected to the at least one redistribution layer. The at least one triple pad includes a bonding pad, a redistribution layer pad connected to the at least one redistribution layer, and a test pad configured to perform a wafer level test. The bonding pad, the redistribution layer pad and the test pad are connected to one another through the at least one redistribution layer, and the test pad is disposed in a core area that overlaps the core layer.
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公开(公告)号:US12167312B2
公开(公告)日:2024-12-10
申请号:US17675307
申请日:2022-02-18
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Heungkyu Kwon , Yongchul Choi , Jungcheon Choi
Abstract: An electronic device mounted in a vehicle and including; a temperature sensor configured to measure a temperature associated with a measurement target to generate a measured temperature, and a controller configured to operate in a normal operating mode if the measured temperature is less than a first reference temperature, and further configured to operate in a limited control mode if the measured temperature is greater than or equal to the first reference temperature. During the normal operating mode, the controller is enabled to perform a performance limiting function, and during the limited control mode, the controller is enabled to perform an emergency call (eCall) function and is disabled to perform a performance limiting function.
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公开(公告)号:US10991638B2
公开(公告)日:2021-04-27
申请号:US16390585
申请日:2019-04-22
Applicant: Samsung Electronics Co., Ltd.
Inventor: Heungkyu Kwon
IPC: H01L23/367 , H01L23/31 , H01L23/373 , H01L23/433 , H01L23/498 , H01L23/10 , H01L23/00 , H01L25/065 , H01L25/16 , H01L25/10 , H01L23/36 , H01L23/34
Abstract: A semiconductor package system includes a substrate, a first and a second semiconductor package, a first thermal conductive layer, a first passive device, and a heat radiation structure. The first and second semiconductor package and first passive device may be mounted on a top surface of the substrate. The first semiconductor package may include a first semiconductor chip that includes a plurality of logic circuits. The first thermal conductive layer may be on the first semiconductor package. The heat radiation structure may be on the first thermal conductive layer, the second semiconductor package, and the first passive device. The heat radiation structure may include a first bottom surface physically contacting the first thermal conductive layer, and a second bottom surface at a higher level than that of the first bottom surface. The second bottom surface may be on the second semiconductor package and/or the first passive device.
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公开(公告)号:US20190355667A1
公开(公告)日:2019-11-21
申请号:US16385089
申请日:2019-04-16
Applicant: Samsung Electronics Co., Ltd.
Inventor: Heungkyu Kwon
Abstract: Provided is a semiconductor package. The semiconductor package may include a substrate, a semiconductor chip on the substrate, a passive element on the substrate, a conductive structure on the substrate, and an interposer substrate on the semiconductor chip, the passive element, and the conductive structure. The interposer substrate may be electrically connected to the conductive structure. A height of the passive element may be greater than a height of the semiconductor chip.
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公开(公告)号:US10198049B2
公开(公告)日:2019-02-05
申请号:US15459403
申请日:2017-03-15
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Heungkyu Kwon , Jae Choon Kim , Eunseok Cho , Jichul Kim
Abstract: A surface temperature management method of mobile device is provided. The method includes sensing a temperature of an application processor in an operation mode of the mobile device; and controlling the application processor using the sensed temperature and a surface temperature management table to manage a surface temperature of a target part of the mobile device. The surface temperature management table includes information related to the temperature of the application processor corresponding to the surface temperature of the target part in the operation mode.
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公开(公告)号:US09698088B2
公开(公告)日:2017-07-04
申请号:US15135364
申请日:2016-04-21
Applicant: Samsung Electronics Co., Ltd.
Inventor: Heungkyu Kwon , Kang Joon Lee , JaeWook Yoo , Su-Chang Lee
IPC: H01L23/498 , H01L23/488 , H01L23/16 , H01L23/18 , H01L25/065 , H01L25/10 , H01L23/00 , H01L23/31 , H01L23/13
CPC classification number: H01L23/49811 , H01L23/13 , H01L23/16 , H01L23/18 , H01L23/3157 , H01L23/488 , H01L23/49816 , H01L23/49838 , H01L24/13 , H01L24/14 , H01L24/16 , H01L24/17 , H01L24/73 , H01L25/0652 , H01L25/0657 , H01L25/105 , H01L2224/0401 , H01L2224/0557 , H01L2224/13025 , H01L2224/131 , H01L2224/1319 , H01L2224/13541 , H01L2224/13561 , H01L2224/13583 , H01L2224/13609 , H01L2224/13611 , H01L2224/13616 , H01L2224/13624 , H01L2224/13639 , H01L2224/13644 , H01L2224/13647 , H01L2224/13649 , H01L2224/13655 , H01L2224/13657 , H01L2224/1366 , H01L2224/13664 , H01L2224/13666 , H01L2224/13669 , H01L2224/1367 , H01L2224/13671 , H01L2224/13672 , H01L2224/13679 , H01L2224/1368 , H01L2224/13681 , H01L2224/13684 , H01L2224/1401 , H01L2224/1403 , H01L2224/14135 , H01L2224/14136 , H01L2224/14181 , H01L2224/14505 , H01L2224/16146 , H01L2224/16225 , H01L2224/1703 , H01L2224/1712 , H01L2224/17181 , H01L2224/175 , H01L2224/1751 , H01L2224/2919 , H01L2224/32225 , H01L2224/48227 , H01L2224/73204 , H01L2224/73265 , H01L2225/06513 , H01L2225/06517 , H01L2225/06541 , H01L2225/06555 , H01L2225/06565 , H01L2225/1023 , H01L2225/1058 , H01L2225/1082 , H01L2924/00014 , H01L2924/15153 , H01L2924/15156 , H01L2924/15311 , H01L2924/15321 , H01L2924/15787 , H01L2924/18161 , H01L2924/3511 , H01L2924/00012 , H01L2924/00 , H01L2924/0665 , H01L2924/206 , H01L2924/014 , H01L2224/05552
Abstract: Semiconductor packages include a first substrate including a central portion and a peripheral portion, at least one first central connection member attached to the central portion of the first substrate, and at least one first peripheral connection member attached to the peripheral portion of the first substrate. The first central connection member includes a first supporter and a first fusion conductive layer surrounding the first supporter.
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