Planar double gate semiconductor device

    公开(公告)号:US10205018B1

    公开(公告)日:2019-02-12

    申请号:US15676494

    申请日:2017-08-14

    Abstract: Certain aspects of the present disclosure generally relate to a semiconductor device. The semiconductor device generally includes a substrate, a channel disposed above the substrate, and a first dielectric layer disposed adjacent to a first side of the channel. The semiconductor device may also include a first non-insulative region disposed between the first dielectric layer and the substrate, and a second dielectric layer disposed adjacent to a second side of the channel, wherein the first dielectric layer and the second dielectric layer comprise high-k layers. In certain aspects, a second non-insulative region may be disposed above the second dielectric layer, and a third non-insulative region may be disposed adjacent to a third side of the channel.

    Compound semiconductor transistor integration with high density capacitor

    公开(公告)号:US10026731B1

    公开(公告)日:2018-07-17

    申请号:US15488108

    申请日:2017-04-14

    Abstract: A metal-insulator-metal (MIM) capacitor includes a compound semiconductor substrate. The MIM capacitor includes a collector contact layer on the compound semiconductor substrate, a first dielectric layer on the collector contact layer, a conductive electrode layer on the first dielectric layer, and a second dielectric layer on the conductive electrode layer. The MIM capacitor includes a first conductive interconnect on the second dielectric layer, a third dielectric layer on the first conductive interconnect, and a second conductive interconnect on the third dielectric layer. A first capacitive component includes the collector contact layer, the conductive electrode layer, and the first dielectric layer. A second capacitive component includes the first conductive interconnect, the conductive electrode layer and the second dielectric layer. A third capacitive component includes the second conductive interconnect, the first conductive interconnect, and the third dielectric layer. The first, second, and third capacitive components are arranged in parallel with each other.

    Heterojunction bipolar transistor with field plates

    公开(公告)号:US11515406B2

    公开(公告)日:2022-11-29

    申请号:US16379904

    申请日:2019-04-10

    Abstract: Aspects generally relate to a heterojunction bipolar transistor (HBT), and method of manufacturing the same. The HBT including an emitter a first, a first side of a base coupled to a second side of the emitter opposite the first side of the emitter. A collector coupled to the base on a second side of the base opposite the emitter, wherein an area of a junction between the base and the collector is less than or equal to an area of a junction between the base and the emitter. A dielectric coupled to the collector. A first conductive base contact coupled to the base and adjacent to the collector and extending over a base-collector junction, the conductive base contact operative as a field plate.

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