Life Estimation Circuit and Semiconductor Device Made Using the Same
    1.
    发明申请
    Life Estimation Circuit and Semiconductor Device Made Using the Same 审中-公开
    寿命估算电路和使用其的半导体器件

    公开(公告)号:US20170074921A1

    公开(公告)日:2017-03-16

    申请号:US15180383

    申请日:2016-06-13

    摘要: A life estimation circuit includes a temperature detector configured to detect temperature of a power element unit, an inflection point detection unit configured to detect an inflection point of temperature variation in the power element unit based on an output signal from the temperature detector, an operation unit configured to determine an absolute value of a difference between the temperature of the power element unit at an inflection point detected this time and the temperature of the power element unit at an inflection point detected last time, a count circuit configured to count the number of times that the absolute value of the difference in temperature has reached a threshold temperature, and a signal generation unit configured to output, when a count value from the count circuit reaches a threshold number of times, an alarm signal indicating that the power element is about to reach the end of its life.

    摘要翻译: 寿命估计电路包括:温度检测器,被配置为检测功率元件单元的温度;拐点检测单元,被配置为基于来自温度检测器的输出信号检测功率元件单元中的温度变化的拐点;操作单元 被配置为确定在此时检测的拐点处的功率元件单元的温度与上次检测到的拐点处的功率单元的温度之间的差的绝对值,配置为计数次数的计数电路 温度差的绝对值达到阈值温度,并且信号生成单元被配置为当来自计数电路的计数值达到阈值次数时,输出表示功率元件即将到达的报警信号 到达终身。