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公开(公告)号:US20240257873A1
公开(公告)日:2024-08-01
申请号:US18162728
申请日:2023-02-01
Applicant: MACRONIX INTERNATIONAL CO., LTD.
Inventor: Po-Hao TSENG , Yu-Hsuan LIN , Tian-Cih BO , Feng-Min LEE , Yu-Yu LIN
IPC: G11C15/04
CPC classification number: G11C15/046
Abstract: A hybrid in-memory search (IMS) content addressable memory (CAM) cell includes: a first IMS CAM cell; and a second IMS CAM cell, coupled to the first IMS CAM cell. The first IMS CAM cell and the second IMS CAM cell are of different types. When the hybrid IMS CAM cell stores a storage data, the first IMS CAM cell stores a first part of the storage data and the second IMS CAM cell stores the storage data or a second part of the storage data.
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2.
公开(公告)号:US20210224041A1
公开(公告)日:2021-07-22
申请号:US16807194
申请日:2020-03-03
Applicant: MACRONIX INTERNATIONAL CO., LTD.
Inventor: Po-Hao TSENG , Ming-Hsiu LEE , Yu-Hsuan LIN
Abstract: A random number generator, a random number generating circuit, and a random number generating method are provided. The random number generating circuit includes the random number generator and executes the random number generating method. The random number generator includes a shift register having N storage elements and a combinational logic circuit. The N storage elements receive a random seed in a static state and repetitively perform a bit shift operation in a plurality of clock cycles. The combinational logic circuit generates an output sequence based on the random seed and a random bitstream received from an external source.
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公开(公告)号:US20210193201A1
公开(公告)日:2021-06-24
申请号:US17195712
申请日:2021-03-09
Applicant: MACRONIX INTERNATIONAL CO., LTD.
Inventor: Yu-Hsuan LIN , Chao-Hung WANG
Abstract: A semiconductor circuit and an operating method for the same are provided. The method includes the following steps. A memory circuit is operated during a first timing to obtain a first memory state signal S1. The memory circuit is operated during a second timing after the first timing to obtain a second memory state signal S2. A difference between the first memory state signal S1 and the second memory state signal S2 is calculated to obtain a state difference signal SD. A calculating is performed to obtain an un-compensated output data signal OD relative with an input data signal ID and the second memory state signal S2. The state difference signal SD and the un-compensated output data signal OD are calculated to obtain a compensated output data signal OD′.
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公开(公告)号:US20240184464A1
公开(公告)日:2024-06-06
申请号:US18302942
申请日:2023-04-19
Applicant: MACRONIX INTERNATIONAL CO., LTD.
Inventor: Yu-Hsuan LIN , Hsiang-Lan LUNG , Cheng-Lin SUNG
IPC: G06F3/06
CPC classification number: G06F3/0632 , G06F3/0604 , G06F3/0679
Abstract: A method for operating a memory device is provided. The method includes following steps. First, a priority of a refresh operation and a priority of an inference operation for at least a portion of a memory array of the memory device are determined. The refresh operation and the inference operation are performed according to a determination result of the priority of the refresh operation and the priority of the inference operation. If the priority of the refresh operation is lower than the priority of inference operation, perform the inference operation in the at least a portion, and perform the refresh operation after performing the inference operation. If the priority of the refresh operation is higher than the priority of inference operation, perform the refresh operation in the at least a portion, and perform the inference operation after performing the refresh operation.
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公开(公告)号:US20230045495A1
公开(公告)日:2023-02-09
申请号:US17392365
申请日:2021-08-03
Applicant: MACRONIX INTERNATIONAL CO., LTD.
Inventor: Feng-Min LEE , Erh-Kun LAI , Dai-Ying LEE , Yu-Hsuan LIN , Po-Hao TSENG , Ming-Hsiu LEE
Abstract: A memory device includes a stack and a plurality of memory strings. The stack is disposed on the substrate, and the stack includes a plurality of conductive layers and a plurality of insulating layers alternately stacked. The memory strings pass through the stack along a first direction, wherein a first memory string in the memory strings includes a first conductive pillar and a second conductive pillar, a channel layer, and a memory structure. The first conductive pillar and the second conductive pillar respectively extend along the first direction and are separated from each other. The channel layer is disposed between the first conductive pillar and the second conductive pillar. The memory structure surrounds the second conductive pillar, and the memory structure includes a resistive memory material.
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公开(公告)号:US20220359016A1
公开(公告)日:2022-11-10
申请号:US17388079
申请日:2021-07-29
Applicant: MACRONIX INTERNATIONAL CO., LTD.
Inventor: Yu-Hsuan LIN , Dai-Ying LEE , Ming-Hsiu LEE
Abstract: A storage device for generating an identity code and an identity code generating method are disclosed. The storage device includes a first storage circuit, a second storage circuit and a reading circuit. The first storage circuit stores a plurality of first data and the first data have a plurality of bits. The second storage circuit stores a plurality of second data and the second data have a plurality of bits. The reading circuit reads the second data from the second storage circuit to form a first sequence, selects a first portion of the first data according to the first sequence, reads the first portion of the first data from the first storage circuit to form a target sequence and outputs the target sequence to serve as an identity code.
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公开(公告)号:US20220012586A1
公开(公告)日:2022-01-13
申请号:US17079341
申请日:2020-10-23
Applicant: MACRONIX INTERNATIONAL CO., LTD.
Inventor: Yu-Hsuan LIN , Po-Kai HSU , Dai-Ying LEE
Abstract: An inference engine for a neural network uses a compute-in-memory array storing a kernel coefficients. A clamped input matrix is provided to the compute-in-memory array to produce an output vector representing a function of the clamped input vector and the kernel. A circuit is included receiving an input vector, where elements of the input vector have values in a first range of values. The circuit clamps the values of the elements of the input vector a limit of a second range of values to provide the clamped input vector. The second range of values is more narrow than the first range of values, and set according to the characteristics of the compute-in-memory array. The first range of values can be used in training using digital computation resources, and the second range of values can be used in inference using the compute-in-memory array.
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公开(公告)号:US20200349428A1
公开(公告)日:2020-11-05
申请号:US16522986
申请日:2019-07-26
Applicant: MACRONIX INTERNATIONAL CO., LTD.
Inventor: Chao-Hung WANG , Yu-Hsuan LIN , Ming-Liang WEI , Dai-Ying LEE
Abstract: Provided is an operation method for a memory device, the memory device being used for implementing an Artificial Neural Network (ANN). The operation method includes: reading from the memory device a weight matrix of a current layer of a plurality of layers of the ANN to extract a plurality of neuro values; determining whether to perform calibration; when it is determined to perform calibration, recalculating and updating a mean value and a variance value of the neuro values; and performing batch normalization based on the mean value and the variance value of the neuro values.
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公开(公告)号:US20200058859A1
公开(公告)日:2020-02-20
申请号:US16102985
申请日:2018-08-14
Applicant: MACRONIX INTERNATIONAL CO., LTD.
Inventor: Chao-Hung WANG , Dai-Ying LEE , Kuang-Hao CHIANG , Yu-Hsuan LIN , Tsung-Ming CHEN
IPC: H01L45/00
Abstract: A resistive memory device includes a first electrode, a resistance switching layer and a second electrode. The resistance switching layer is disposed on the first electrode and includes a ternary transition metal oxide. The second electrode is disposed on the resistance switching layer.
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10.
公开(公告)号:US20240365541A1
公开(公告)日:2024-10-31
申请号:US18765437
申请日:2024-07-08
Applicant: MACRONIX INTERNATIONAL CO., LTD.
Inventor: Yu-Hsuan LIN , Feng-Min LEE , Po-Hao TSENG
CPC classification number: H10B41/35 , H01L29/40114 , H01L29/66825
Abstract: The application discloses an integrated memory device, a manufacturing method and an operation method thereof. The integrated memory cell includes: a first memory cell; and an embedded second memory cell, serially coupled to the first memory cell, wherein the embedded second memory cell is formed on any one of a first side and a second side of the first memory cell.
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