-
1.
公开(公告)号:US11705210B2
公开(公告)日:2023-07-18
申请号:US17570676
申请日:2022-01-07
Applicant: Kioxia Corporation
Inventor: Akio Sugahara , Takaya Handa , Ryosuke Isomura , Kazuto Uehara , Junichi Sato , Norichika Asaoka , Masashi Yamaoka , Bushnaq Sanad , Yuzuru Shibazaki , Noriyasu Kumazaki , Yuri Terada
CPC classification number: G11C16/30 , G11C16/0483 , G11C16/08 , G11C16/32 , G11C16/12 , G11C16/26 , H10B69/00
Abstract: A memory device includes a memory cell array, a voltage generation circuit generating one or more voltages supplied to the memory cell array, an input/output circuit receiving an address indicating a region in the memory cell array and a control circuit controlling operations of the memory cell array. The voltage generation circuit generates the voltages before a ready/busy signal changing from a ready state to a busy state.
-
公开(公告)号:US11915760B2
公开(公告)日:2024-02-27
申请号:US18299505
申请日:2023-04-12
Applicant: Kioxia Corporation
Inventor: Sanad Bushnaq , Noriyasu Kumazaki , Masashi Yamaoka
CPC classification number: G11C16/08 , G11C16/0483 , G11C16/14 , G11C16/24 , H10B41/27 , G11C16/10 , G11C16/26
Abstract: According to one embodiment, a semiconductor storage device includes a first memory string including a first memory transistor, a first word line connected to a gate electrode of the first memory transistor, a source line connected to one end of the memory string, and a first connection transistor connected between the first word line and the source line.
-
公开(公告)号:US11658155B2
公开(公告)日:2023-05-23
申请号:US17007797
申请日:2020-08-31
Applicant: KIOXIA CORPORATION
Inventor: Masashi Yamaoka , Kazuhiro Tomishige , Naoki Yamamoto
IPC: H01L27/1157 , H01L25/065 , H01L23/538 , G11C16/04 , G11C5/06
CPC classification number: H01L25/0657 , G11C5/06 , G11C16/0483 , H01L23/5386 , H10B43/35
Abstract: A semiconductor storage device includes a substrate, a plurality of conductive layers arranged in a first direction intersecting a surface of the substrate, and a semiconductor layer extending in the first direction and penetrating the plurality of conductive layers. The plurality of conductive layers includes a first conductive layer and a second conductive layer that are adjacent to each other, a third conductive layer and a fourth conductive layer that are adjacent to each other, and a fifth conductive layer and a sixth conductive layer that are adjacent to each other. When a distance between the first conductive layer and the second conductive layer in the first direction is a first distance, a distance between the third conductive layer and the fourth conductive layer in the first direction is a second distance, and a distance between the fifth conductive layer and the sixth conductive layer in the first direction is a third distance, the second distance is smaller than the first distance, and the third distance is smaller than the second distance.
-
4.
公开(公告)号:US12159677B2
公开(公告)日:2024-12-03
申请号:US18205915
申请日:2023-06-05
Applicant: Kioxia Corporation
Inventor: Akio Sugahara , Takaya Handa , Ryosuke Isomura , Kazuto Uehara , Junichi Sato , Norichika Asaoka , Masashi Yamaoka , Bushnaq Sanad , Yuzuru Shibazaki , Noriyasu Kumazaki , Yuri Terada
Abstract: A memory device includes a memory cell array, a voltage generation circuit generating one or more voltages supplied to the memory cell array, an input/output circuit receiving an address indicating a region in the memory cell array, and a control circuit controlling operations of the memory cell array. The control circuit supplies a non-selection voltage of the voltages before a ready/busy signal changes from a ready state to a busy state.
-
公开(公告)号:US11657874B2
公开(公告)日:2023-05-23
申请号:US17480858
申请日:2021-09-21
Applicant: KIOXIA CORPORATION
Inventor: Sanad Bushnaq , Noriyasu Kumazaki , Masashi Yamaoka
CPC classification number: G11C16/08 , G11C16/0483 , G11C16/14 , G11C16/24 , H01L27/11556 , G11C16/10 , G11C16/26
Abstract: According to one embodiment, a semiconductor storage device includes a first memory string including a first memory transistor, a first word line connected to a gate electrode of the first memory transistor, a source line connected to one end of the memory string, and a first connection transistor connected between the first word line and the source line.
-
-
-
-