-
1.
公开(公告)号:US12159677B2
公开(公告)日:2024-12-03
申请号:US18205915
申请日:2023-06-05
Applicant: Kioxia Corporation
Inventor: Akio Sugahara , Takaya Handa , Ryosuke Isomura , Kazuto Uehara , Junichi Sato , Norichika Asaoka , Masashi Yamaoka , Bushnaq Sanad , Yuzuru Shibazaki , Noriyasu Kumazaki , Yuri Terada
Abstract: A memory device includes a memory cell array, a voltage generation circuit generating one or more voltages supplied to the memory cell array, an input/output circuit receiving an address indicating a region in the memory cell array, and a control circuit controlling operations of the memory cell array. The control circuit supplies a non-selection voltage of the voltages before a ready/busy signal changes from a ready state to a busy state.
-
公开(公告)号:US11694754B2
公开(公告)日:2023-07-04
申请号:US17469095
申请日:2021-09-08
Applicant: Kioxia Corporation
Inventor: Yuzuru Shibazaki
CPC classification number: G11C16/32 , G11C16/0483 , G11C16/10 , G11C16/3459
Abstract: ABSTRACT A semiconductor memory device provides a first memory cell array including a plurality of first memory blocks, a second memory cell array comprising a plurality of second memory blocks, and a voltage supply line electrically connected to the plurality of first memory blocks and the plurality of second memory blocks. Moreover, this semiconductor memory device is configured to execute a write operation. At a first timing of this write operation, the voltage supply line is not electrically continuous with the first and second memory blocks. Moreover, a voltage of the voltage supply line at the first timing in the case of the write operation being executed on the first and second memory blocks is larger than a voltage of the voltage supply line at the first timing in the case of the write operation being executed on the first memory block.
-
公开(公告)号:US11869597B2
公开(公告)日:2024-01-09
申请号:US17464297
申请日:2021-09-01
Applicant: Kioxia Corporation
Inventor: Takeshi Nakano , Yuzuru Shibazaki , Hideyuki Kataoka , Junichi Sato , Hiroki Date
CPC classification number: G11C16/102 , G11C16/0433 , G11C16/08 , G11C16/24 , G11C16/26 , G11C16/30 , G11C29/42
Abstract: A semiconductor storage device in an embodiment includes a plurality of planes each including a memory cell array, a voltage generation circuit configured to apply a first intermediate voltage to an adjacent word line adjacent to a selected word line in a former half of a program period and apply a second intermediate voltage higher than the first intermediate voltage to the adjacent word line in a latter half of the program period, a discharge circuit configured to feed a discharge current from the selected word line in a period corresponding to a period in which the second intermediate voltage is applied to the adjacent word line, and a control circuit configured to set a discharge characteristic of the discharge circuit according to a number of the planes.
-
4.
公开(公告)号:US11705210B2
公开(公告)日:2023-07-18
申请号:US17570676
申请日:2022-01-07
Applicant: Kioxia Corporation
Inventor: Akio Sugahara , Takaya Handa , Ryosuke Isomura , Kazuto Uehara , Junichi Sato , Norichika Asaoka , Masashi Yamaoka , Bushnaq Sanad , Yuzuru Shibazaki , Noriyasu Kumazaki , Yuri Terada
CPC classification number: G11C16/30 , G11C16/0483 , G11C16/08 , G11C16/32 , G11C16/12 , G11C16/26 , H10B69/00
Abstract: A memory device includes a memory cell array, a voltage generation circuit generating one or more voltages supplied to the memory cell array, an input/output circuit receiving an address indicating a region in the memory cell array and a control circuit controlling operations of the memory cell array. The voltage generation circuit generates the voltages before a ready/busy signal changing from a ready state to a busy state.
-
-
-