摘要:
According to one embodiment, a semiconductor storage device includes a cell array including resistance change elements formed above a semiconductor substrate; first cell transistors formed on the semiconductor substrate and provided in association with the resistance change elements; first gate electrodes included in the first cell transistor and extending in a first direction; a first bit lines electrically connected to the resistance change elements respectively and extending in a second direction perpendicular to the first direction; a second bit lines electrically connected to one end of a current path of the first cell transistors respectively and extending in the second direction; and first active areas in which the first cell transistors are formed, and which extend in a direction crossing the first direction at a first angle.
摘要:
A semiconductor storage device according to the present embodiment includes a plurality of memory units respectively comprising a plurality of memory cells. A data bus is shared by the memory units and transfers data from the memory units or to the memory units. A timing controller includes a delay time unit shared by the memory units sharing the data bus. The timing controller is configured to output a control signal for driving the memory units after a predetermined delay time elapses since receiving an input signal.
摘要:
A semiconductor storage device includes plural bit lines and plural word lines. The memory cell array has plural memory cells that are connected with the bit lines and word lines, and can store data. Plural sense amplifiers detect the data stored in the memory cells. Plural write drivers write data in the memory cells. A comparison buffer temporarily stores the write data to be written in the memory cells by the write driver. In a series of write sequences, the comparison buffer stores the read data from the memory cells selected as the write object and the write data to be written in the selected memory cells. After a series of write sequences, when the pre-charge command for resetting the voltage of the bit lines is received, the write execution command is executed so that the comparison buffer executes write in the selected memory cells.
摘要:
A memory cell array has memory cells, each of which has a ferroelectric capacitor and a selection transistor. A plate line is connected to one end of the ferroelectric capacitor and applied a certain plate line voltage. A sense amplifier circuit senses and amplifies voltage of the bit line. An error correction circuit corrects any error in retained data in the memory cells sensed by the sense amplifier. A plate line control circuit controls the timing for switching a potential of the plate line to a ground potential, based on absence or presence of error correction by the error correction circuit.
摘要:
A semiconductor memory device includes a row of memory cells connected in series, each of the memory cells including a ferroelectric capacitor and a cell transistor having a gate terminal and source/drain terminals, the source/drain terminals being connected in parallel with two electrodes of the ferroelectric capacitor, a word line connected to the gate terminal, memory cell blocks each including the row of memory cells and a block select transistor, a drain terminal of the block select transistor being connected to one end of the row of memory cells, a plate line connected to another end thereof, a bit line connected to a source terminal of the block select transistor, and a block select line connected to a gate terminal of the block select transistor, wherein a contact is provided under the plate line to connect the source terminal of the block select transistor and the bit line.
摘要:
A semiconductor device includes a first latch unit that latches write data based on a strobe signal, a second latch unit that receives the write data latched in the first latch unit based on a first clock signal, and a strobe generation unit that generates the strobe signal and supplies it to the first latch unit. The strobe generation unit includes a bit shift counter, which receives a second clock signal and outputs a bit shift signal having a logic level that is inverted every plural clock cycles of the second clock signal, and a logic gate that outputs the second clock signal as the strobe signal according to the bit shift signal. The latch period of the write data in the first latch part is determined by the period of the strobe signal and also the period of the bit shift signal.
摘要:
A memory according to an embodiment includes bit lines, word lines, source lines, magnetic tunnel junction elements and transistors that are serially connected between the bit lines and the source lines, respectively, and a sense amplifier that detects data stored in the magnetic tunnel junction elements. The semiconductor storage device includes multiplexers between the bit lines and the sense amplifier in order to select one of the bit lines to be connected to the sense amplifier, and write amplifiers that are located corresponding to memory cell blocks each of which includes memory cells each including the magnetic tunnel junction element and the transistor and are connected to the bit lines or connected via the multiplexers to the bit lines. To write data, the sense amplifier applies a write voltage to the bit lines and then the write amplifiers hold the write voltage.
摘要:
A semiconductor storage device according to the present embodiment comprises a plurality of bit lines, a plurality of word lines, and a plurality of memory cells corresponding to intersections between the bit lines and the word lines, respectively, and including magnetic tunnel junction elements capable of storing data. A plurality of sense amplifiers respectively correspond to the bit lines and are configured to detect data stored in the memory cells via a bit line selected from among the corresponding bit lines. A plurality of read latch parts correspond to the sense amplifiers, respectively, and are configured to latch data detected by the corresponding sense amplifiers. A plurality of read global data buses are connected to the read latch parts, respectively, and are configured to consecutively transmit data latched by the read latch parts at a time of a data read operation.
摘要:
According to one embodiment, in a semiconductor storage device, a first internal bus, a second internal bus, and a third internal bus have bus widths decreasing stepwise from a memory cell array side to a data output circuit side. A first selection circuit and a second selection circuit divide the data, which is input via the first or second internal bus, according to a rate of a decrease in bus width in an input and an output, time-divide the divided data, and output the divided data to the second or third internal bus.
摘要:
First and second ferroelectric capacitors are selectively connected with a first bit line. Data is read to the first bit line from a first ferroelectric capacitor by applying a first voltage in a coordinate increasing direction of an axis or from the second ferroelectric capacitor by applying a second voltage having a sign opposite to the first voltage in the coordinate increasing direction. Third and fourth ferroelectric capacitors are selectively connected with a second bit line. Data is read to the second bit line from the third ferroelectric capacitor by applying a third voltage having the same sign as the first voltage in the coordinate increasing direction or from the fourth ferroelectric capacitor by applying a fourth voltage having the same sign as the second voltage in the coordinate increasing direction. A sense amplifier amplifies the potential difference between the first and second bit lines.