摘要:
First and second ferroelectric capacitors are selectively connected with a first bit line. Data is read to the first bit line from a first ferroelectric capacitor by applying a first voltage in a coordinate increasing direction of an axis or from the second ferroelectric capacitor by applying a second voltage having a sign opposite to the first voltage in the coordinate increasing direction. Third and fourth ferroelectric capacitors are selectively connected with a second bit line. Data is read to the second bit line from the third ferroelectric capacitor by applying a third voltage having the same sign as the first voltage in the coordinate increasing direction or from the fourth ferroelectric capacitor by applying a fourth voltage having the same sign as the second voltage in the coordinate increasing direction. A sense amplifier amplifies the potential difference between the first and second bit lines.
摘要:
Potential of a word line connected to any selected one of memory cells is lowered and potential of word lines connected to non-selected memory cells are raised. The potential of the plate line is raised and lowered. The potential of the bit line is raised and lowered. After this, reading data from the memory cells after potential raising and lowering of the plate line and potential raising and lowering of the bit line have been alternately performed at least one time, thereby to determine attenuation of polarization in the ferroelectric capacitor.
摘要:
A ferroelectric memory device includes a memory cell array having memory cells arranged in a matrix form. Each of the memory cells includes a cell transistor and a ferroelectric capacitor. It further includes a first dummy bit line arranged outside a bit line arranged on an end portion of the memory cell array and separated from the bit line arranged on the end portion of the memory cell array with an interval which is the same as a pitch between the bit lines in the memory cell array and having the same width as the bit line, and a first dummy memory cell connected to the first dummy bit line and having the same structure as the memory cell.
摘要:
The memory cell array includes a memory cell, the memory cell including a ferroelectric capacitor and a transistor. The memory cell array includes a word line selecting the memory cell, a plate line applying a drive voltage to the ferroelectric capacitor, and a bit line reading data from the ferroelectric capacitor. A selection transistor selectively connects the memory cell to the bit line. A dummy cell provides a reference potential, the reference potential being referred to for a potential read from the memory cell. A sense amplifier circuit includes a plurality of amplification circuits amplifying the potential difference between a bit-line pair. A decoupling circuit electrically cuts off the bit line between the amplification circuits.
摘要:
A semiconductor memory device includes a memory cell including a ferroelectric capacitor and a cell transistor and storing binary data at a first potential level and a second potential level which is higher than the first potential level, a bit line which reads the binary data from the memory cell, a correction circuit which corrects an error of the binary data read from the memory cell via the bit line, and a setting circuit which sets to the first potential a potential of the bit line connected to the memory cell from which at least the binary data is read, after the binary data is transferred to the correction circuit. The device further includes a control circuit which controls the potential of the bit line connected to the memory cell from which the binary data is read, in accordance with a result of error correction of the binary data.
摘要:
A semiconductor integrated circuit device includes unit cells, memory cell blocks, bit lines, word lines, block select signal lines, plate lines, and a plate line driver. The unit cell includes a cell transistor and a ferroelectric capacitor connected between a source and a drain of the cell transistor. The memory cell block includes the unit cells connected in series between a first terminal and a second terminal and a block select transistor connected between the second terminal and a third terminal. The bit line connects commonly the third terminals of the blocks. The word line connects commonly gates of cell transistors in the blocks. The block select signal line connects commonly gates of block select transistors in the blocks. The plate line connects commonly the first terminals of the blocks. The plate line driver is connected to the plate lines and applies a potential to the plate lines.
摘要:
A ferroelectric memory device includes a memory cell array having memory cells arranged in a matrix form. Each of the memory cells includes a cell transistor and a ferroelectric capacitor. It further includes a first dummy bit line arranged outside a bit line arranged on an end portion of the memory cell array and separated from the bit line arranged on the end portion of the memory cell array with an interval which is the same as a pitch between the bit lines in the memory cell array and having the same width as the bit line, and a first dummy memory cell connected to the first dummy bit line and having the same structure as the memory cell.
摘要:
A series connected unit type ferroelectric memory device is provided, in which a substantially constant read signal margin can be obtained regardless of the position of the selected word line. A memory cell includes a parallel-connected ferroelectric capacitor and cell transistor. Cell blocks each include a plurality of series-connected memory cells arranged between terminals along a pair of bit lines. Some terminals are connected to the bit lines via block selecting transistors. Other terminals are connected to the plate lines. A gate of each cell transistor is connected to a word line. A sense amplifier is connected to the bit lines. When data is read, an offset voltage applying circuit compensates for the imbalance in read signal margin caused by the difference in position of the word line by applying to the bit line an offset voltage which differs depending on the position of the selected word line.
摘要:
The memory cell array includes a memory cell, the memory cell including a ferroelectric capacitor and a transistor. The memory cell array includes a word line selecting the memory cell, a plate line applying a drive voltage to the ferroelectric capacitor, and a bit line reading data from the ferroelectric capacitor. A selection transistor selectively connects the memory cell to the bit line. A dummy cell provides a reference potential, the reference potential being referred to for a potential read from the memory cell. A sense amplifier circuit includes a plurality of amplification circuits amplifying the potential difference between a bit-line pair. A decoupling circuit electrically cuts off the bit line between the amplification circuits.
摘要:
A semiconductor integrated circuit device includes unit cells, memory cell blocks, bit lines, word lines, block select signal lines, plate lines, and a plate line driver. The unit cell includes a cell transistor and a ferroelectric capacitor connected between a source and a drain of the cell transistor. The memory cell block includes the unit cells connected in series between a first terminal and a second terminal and a block select transistor connected between the second terminal and a third terminal. The bit line connects commonly the third terminals of the blocks. The word line connects commonly gates of cell transistors in the blocks. The block select signal line connects commonly gates of block select transistors in the blocks. The plate line connects commonly the first terminals of the blocks. The plate line driver is connected to the plate lines and applies a potential to the plate lines.