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公开(公告)号:US12094541B2
公开(公告)日:2024-09-17
申请号:US17452463
申请日:2021-10-27
Applicant: Kioxia Corporation
Inventor: Tsukasa Tokutomi , Masanobu Shirakawa , Kengo Kurose , Marie Takada , Ryo Yamaki , Kiyotaka Iwasaki , Yoshihisa Kojima
IPC: G11C7/00 , G06F3/06 , G06F11/10 , G11C11/56 , G11C16/04 , G11C16/26 , G11C29/52 , G11C16/08 , H10B43/27 , H10B43/35
CPC classification number: G11C16/26 , G06F3/0604 , G06F3/0659 , G06F3/0679 , G06F11/1068 , G11C11/5671 , G11C16/0483 , G11C29/52 , G11C16/08 , H10B43/27 , H10B43/35
Abstract: According to one embodiment, a memory system includes a nonvolatile memory and a memory controller. The memory controller is configured: to store, in a buffer, a data set read from a cell unit, and an expected data set generated by an error correction on the data set; to count a number of first and second memory cells corresponding to a first and a second combination of data in the data set and the expected data set, respectively, among the memory cells in the cell unit; to calculate a shift amount of a read voltage used in a read operation from the cell unit, based on the number of the first and second memory cells; and to apply the shift amount to a next read operation from the first cell unit.
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公开(公告)号:US11869596B2
公开(公告)日:2024-01-09
申请号:US18117520
申请日:2023-03-06
Applicant: Kioxia Corporation
Inventor: Suguru Nishikawa , Yoshihisa Kojima , Riki Suzuki , Masanobu Shirakawa , Toshikatsu Hida
IPC: G06F12/00 , G11C16/10 , G11C16/04 , G11C16/14 , G06F3/06 , G11C11/56 , G11C16/08 , G11C16/34 , G11C29/02 , G11C29/42 , G11C16/32 , H10B43/27 , H10B43/35
CPC classification number: G11C16/10 , G06F3/0604 , G06F3/0659 , G06F3/0679 , G11C11/5628 , G11C11/5635 , G11C16/0483 , G11C16/08 , G11C16/14 , G11C16/32 , G11C16/349 , G11C16/3459 , G11C16/3495 , G11C29/021 , G11C29/028 , G11C29/42 , G11C11/5671 , H10B43/27 , H10B43/35
Abstract: According to one embodiment, a memory system includes a nonvolatile semiconductor memory, and a controller. The semiconductor memory includes a memory cell, and a write circuit configured to write data to the memory cell by applying a program voltage to the memory cell and comparing a threshold voltage of the memory cell with a first reference voltage corresponding to the write data. The write circuit is configured to execute a first programming operation to obtain a value of a write parameter by comparing the threshold voltage with a second reference voltage different from the first reference voltage.
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公开(公告)号:US20230367487A1
公开(公告)日:2023-11-16
申请号:US18088129
申请日:2022-12-23
Applicant: Kioxia Corporation
Inventor: Yoshihisa Kojima , Shunichi Igahara , Toshikatsu Hida
IPC: G06F3/06
CPC classification number: G06F3/0619 , G06F3/0659 , G06F3/064 , G06F3/0679
Abstract: According to one embodiment, a memory system includes a non-volatile memory and a memory controller. The non-volatile memory includes a first block that includes first and second sub-blocks. The memory controller instructs the non-volatile memory to execute a data erase process in units of sub-blocks on data stored in the non-volatile memory. In response to a first value corresponding to the first sub-block having reached a first threshold value, the memory controller reads first data from the first sub-block, executes an error correction process on the first data read from the first sub-block, and writes the first data on which the error correction process has been executed into the non-volatile memory.
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公开(公告)号:US11790993B2
公开(公告)日:2023-10-17
申请号:US18075601
申请日:2022-12-06
Applicant: KIOXIA CORPORATION
Inventor: Riki Suzuki , Yoshihisa Kojima
CPC classification number: G11C16/10 , G11C7/1045 , G11C16/08 , G11C16/22 , G11C16/26 , G11C16/30 , G11C29/42 , G11C29/44
Abstract: A memory system includes a non-volatile memory having a plurality of memory cells and a controller. The controller is configured to switch a mode for controlling an access operation to the non-volatile memory from a first mode to a second mode, in response to receiving from a host, a first command for instructing the controller to switch the mode from the first mode to the second mode. The access operation controlled according to the second mode improves data retention relative to the access operation controlled according to the first mode.
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公开(公告)号:US11776638B2
公开(公告)日:2023-10-03
申请号:US18149373
申请日:2023-01-03
Applicant: KIOXIA CORPORATION
Inventor: Yoshihisa Kojima
CPC classification number: G11C16/32 , G11C7/04 , G11C11/5628 , G11C16/0483 , G11C16/08 , G11C16/10 , G11C16/26 , G11C16/3495 , G11C2211/5648
Abstract: A memory system includes a nonvolatile memory configured to execute one of a plurality of read operations, including a first read operation and a second read operation, and a memory controller configured to issue a read command to the nonvolatile memory to cause the nonvolatile memory to execute one of the plurality of read operations. The memory controller is configured to receive a read request, estimate a reliability level of a result of a read operation to be executed by the nonvolatile memory to read data from a physical address specified in the read request, select one of the first and second read operations to be executed first in a read sequence corresponding to the read request by the nonvolatile memory based on the estimated reliability level, and instruct the nonvolatile memory to execute the selected read operation.
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公开(公告)号:US11696441B2
公开(公告)日:2023-07-04
申请号:US17725638
申请日:2022-04-21
Applicant: Kioxia Corporation
Inventor: Takehiko Amaki , Yoshihisa Kojima , Toshikatsu Hida , Marie Grace Izabelle Angeles Sia , Riki Suzuki , Shohei Asami
IPC: G11C16/08 , H10B41/27 , G11C16/10 , G11C16/04 , G11C16/16 , G11C7/04 , G11C16/26 , H10B43/27 , H10B43/35
CPC classification number: H10B41/27 , G11C7/04 , G11C16/0483 , G11C16/08 , G11C16/107 , G11C16/16 , G11C16/26 , H10B43/27 , H10B43/35
Abstract: According to one embodiment, a memory system includes a semiconductor memory and a controller. The semiconductor memory includes blocks each containing memory cells. The controller is configured to instruct the semiconductor memory to execute a first operation and a second operation. In the first operation and the second operation, the semiconductor memory selects at least one of the blocks, and applies at least one voltage to all memory cells contained in said selected blocks. A number of blocks to which said voltage is applied per unit time in the second operation is larger than that in the first operation.
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公开(公告)号:US11693603B2
公开(公告)日:2023-07-04
申请号:US17858294
申请日:2022-07-06
Applicant: Kioxia Corporation
Inventor: Suguru Nishikawa , Yoshihisa Kojima , Takehiko Amaki
CPC classification number: G06F3/0659 , G06F3/0619 , G06F3/0679 , G11C16/0483 , G11C16/26 , G11C16/3427 , G11C11/5642 , G11C11/5671
Abstract: A memory system includes a memory device having a memory cell array, and a controller. The memory cell array includes a plurality of first units and at least one second unit. The second unit includes the plurality of first units. The controller counts a first number of times of read operation for each of the plurality of first units, and, in response to the first number of times for one first unit among the plurality of first units reaching a first value, updates a second number of times for the second unit that includes the one first unit. In response to the second number of times reaching a second value, the controller determines whether to rewrite data stored in at least one of the first units included in the second unit.
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公开(公告)号:US11693463B2
公开(公告)日:2023-07-04
申请号:US17878788
申请日:2022-08-01
Applicant: Kioxia Corporation
Inventor: Yoshihisa Kojima , Katsuhiko Ueki
CPC classification number: G06F1/263 , G06F12/0246 , G06F2212/205 , G06F2212/2028
Abstract: In a memory system in an embodiment, in a case of normal operation, a control unit returns a write completion response upon completion of reception of write data from a host, and writes the write data into nonvolatile memory in a multiple values. In a case of unordinary power-off, changeover to operation using a backup battery is conducted and the control unit writes dirty data that is not completed in writing into the nonvolatile memory, into the nonvolatile memory with two values. When next boot, the control unit reads the dirty data from the nonvolatile memory into the volatile memory, and thereafter writes the dirty data into the nonvolatile memory in a multiple values.
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公开(公告)号:US11615851B2
公开(公告)日:2023-03-28
申请号:US17572279
申请日:2022-01-10
Applicant: Kioxia Corporation
Inventor: Suguru Nishikawa , Takehiko Amaki , Yoshihisa Kojima , Shunichi Igahara
Abstract: According to one embodiment, the semiconductor memory medium includes a first memory cell, a first word line coupled to the first memory cell, and a row decoder coupled to the first word line. A write operation is executed multiple times on the first memory cell within a first period from after an execution of an erase operation to an execution of a next erase operation. The write operation includes at least one of program loops each including a program operation and a verify operation. In the verify operation, the row decoder applies a verify voltage to the first word line. The verify voltage is set in accordance with a number of executed write operations on the first memory cell within the first period.
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公开(公告)号:US11574688B2
公开(公告)日:2023-02-07
申请号:US17410872
申请日:2021-08-24
Applicant: KIOXIA CORPORATION
Inventor: Yoshihisa Kojima
Abstract: A memory system includes a nonvolatile memory configured to execute one of a plurality of read operations, including a first read operation and a second read operation, and a memory controller configured to issue a read command to the nonvolatile memory to cause the nonvolatile memory to execute one of the plurality of read operations. The memory controller is configured to receive a read request, estimate a reliability level of a result of a read operation to be executed by the nonvolatile memory to read data from a physical address specified in the read request, select one of the first and second read operations to be executed first in a read sequence corresponding to the read request by the nonvolatile memory based on the estimated reliability level, and instruct the nonvolatile memory to execute the selected read operation.
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