摘要:
PLANAR TRANSISTOR HAVING REDUCED JUNCTION AREA FOR SMALL CAPACITANCE. A THIN LAYER OF SEMICONDUCTOR MATERIAL IS PLACED ON A SUBSTRATE MATERIAL WHICH IS NEARLY IMPENETRABLE BARRIER AGAINST DIFFUSION BY NORMALLY USED IMPURITY ATOMS. THE DEPTH OF THE JUNCTION IS LIMITED TO APPROXIMATELY THE THICKNESS OF THE THIN LAYER OF SEMICONDUCTOR MATERIAL, THUS LIMITING THE JUNCTION AREA AND CAPACTANCE.
摘要:
A PLURALITY OF CONNECTIONS FROM ELECTRICALLY CONDUCTIVE LANDS ON AN INSULATING SUBSTRATE TO THE CONTACTS OF A SOLID STATE DEVICE ARE FORMED IN ONE OPERATION BY FIXEDLY POSITIONING THE DEVICE ON, OR IN A CAVITY WITHIN, THE SUBSTRATE. A DECAL, INCLUDING A BACKING PLATE WITH A PLURALITY OF CONDUCTIVE STRIPS WHICH CAN BE ADHERED TO THE PLATE BY MEANS OF A SOLUBLE ADHESIVE, IS POSITIONED OVER THE DEVICE BEARING SUBSTRATE WITH THE STRIPS IN REGISTRY WITH RESPECTIVE CONTACTS AND LANDS. THE STRIPS ARE BROUGHT INTO CONTACT WITH RESPECTIVE CONTACT AND LAND SURFACE PORTIONS AND SUBJECTED TO HEAT AND PRESSURE SUFFICIENT TO CAUSE BONDING THEREBETWEEN. THEREAFTER, THE DECAL BACKING PLATE MAY BE REMOVED FROM THE STRIPS, AS BY DISSOLVING THE ADHESIVE, LEAVING THE STRIPS FIRMLY BONDED TO THE CONTACTS AND LANDS AND BRIDGING THE SPACE THEREBETWEEN, WHEREBY THE LANDS ARE CONNECTED TO THE CONTACTS THROUGH THE STRIPS.
摘要:
A METHOD OF FORMING AN OHMIC CONTACT UPON AN AREA TO BE CONTACTED UPON A SUBSTRATE, SUCH AS AN ACTIVE AREA UPON A SEMICONDUCTOR DEVICE, COMPRISING THE STEPS OF DEPOSITING FROM THE VAPOR PHASE A METAL TO BE DEPOSITED, WHILE SAID AREA IS MAINTAINED AT A FIRST TEMPERATURE AT WHICH GOOD ADHESION BETWEEN SAID AREA AND SAID METAL OCCURS; THEN COMPLETING THE DEPOSITION AT A SECOND LOWER TEMPERATURE, FOR A TIME DURING WHICH NO CONTACT-IMPAIRING REACTIONS MAY OCCUR BETWEEN SAID METAL AND SAID AREA; THEN COOLING THE AREA. EXAMPLES OF GIVEN MATERIALS AND TEMPERATURES ARE INCLUDED.