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公开(公告)号:US11566319B2
公开(公告)日:2023-01-31
申请号:US15844251
申请日:2017-12-15
发明人: Jennifer Y. Sun , Vahid Firouzdor , Biraja Prasad Kanungo , Tom K. Cho , Vedapuram S. Achutharaman , Ying Zhang
IPC分类号: C04B41/89 , C04B41/00 , C04B41/52 , C04B35/505 , C04B35/622 , C04B41/45 , C04B35/00 , C23C14/08 , C04B41/50 , C23C14/46 , C23C14/58 , H01J37/32 , C04B41/87
摘要: An article comprises a body and a conformal protective layer on at least one surface of the body. The conformal protective layer is a plasma resistant rare earth oxide film having a thickness of less than 1000 μm, wherein the plasma resistant rare earth oxide film consists essentially of 40 mol % to less than 100 mol % of Y2O3, over 0 mol % to 60 mol % of ZrO2, and 0 mol % to 9 mol % of Al2O3.
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公开(公告)号:US20200325073A1
公开(公告)日:2020-10-15
申请号:US16912428
申请日:2020-06-25
IPC分类号: C04B35/10 , C04B35/515 , C23C4/04 , C23C4/02 , C23C4/18 , C23C24/10 , C23C28/04 , C23C4/11 , C04B35/488 , C04B35/505 , C04B35/44 , C04B35/50 , C04B35/486 , C04B35/16
摘要: Disclosed herein are methods for producing an ultra-dense and ultra-smooth ceramic coating. A method includes feeding a slurry of ceramic particles into a plasma sprayer. The plasma sprayer generates a stream of particles directed toward the substrate, forming a ceramic coating on the substrate upon contact.
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公开(公告)号:US10730798B2
公开(公告)日:2020-08-04
申请号:US14704742
申请日:2015-05-05
IPC分类号: C23C4/02 , C23C4/04 , C23C4/10 , C04B35/10 , C04B35/515 , C23C4/12 , C23C4/18 , C23C24/10 , C23C28/04 , C23C4/11 , C04B35/488 , C04B35/505 , C04B35/44 , C04B35/50 , C04B35/486 , C04B35/16
摘要: Disclosed herein are methods for producing an ultra-dense and ultra-smooth ceramic coating. A method includes feeding a slurry of ceramic particles into a plasma sprayer. The plasma sprayer generates a stream of particles directed toward the substrate, forming a ceramic coating on the substrate upon contact.
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公开(公告)号:US20190194817A1
公开(公告)日:2019-06-27
申请号:US16293549
申请日:2019-03-05
发明人: Jennifer Y. Sun , Vahid Firouzdor
CPC分类号: C25D11/34 , C23C24/04 , C23C28/321 , C23C28/322 , C23C28/345 , C23C28/3455 , C25D11/04 , C25D11/16 , C25D11/18 , C25D11/26 , Y10T428/12736 , Y10T428/12743 , Y10T428/12757 , Y10T428/12764
摘要: An article comprises a component for a manufacturing chamber, a coating on the component, and an anodization layer formed on the coating. The anodization layer has a thickness of about 2-10 mil, comprises a low porosity layer portion having a density of greater than 99% and a porous columnar layer portion having a higher porosity than the low porosity layer portion. The porous columnar layer portion comprises a plurality of columnar nanopores having a diameter of about 10-50 nm.
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公开(公告)号:US20180151401A1
公开(公告)日:2018-05-31
申请号:US15874495
申请日:2018-01-18
IPC分类号: H01L21/683 , H01L21/687
CPC分类号: H01L21/6831 , H01L21/6875 , H01L21/68757 , Y10T156/1041 , Y10T428/24322 , Y10T428/24997
摘要: A substrate support assembly comprises a ceramic body and a thermally conductive base bonded to a lower surface of the ceramic body. The substrate support assembly further comprises a protective layer covering an upper surface of the ceramic body, wherein the protective layer comprises at least one of yttrium aluminum garnet (YAG) or a ceramic compound comprising Y4Al2O9 and a solid-solution of Y2O3—ZrO2.
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公开(公告)号:US09916998B2
公开(公告)日:2018-03-13
申请号:US14086799
申请日:2013-11-21
IPC分类号: H01L21/683 , H01L21/687
CPC分类号: H01L21/6831 , H01L21/6875 , H01L21/68757 , Y10T156/1041 , Y10T428/24322 , Y10T428/24997
摘要: A substrate support assembly comprises a ceramic body and a thermally conductive base bonded to a lower surface of the ceramic body. The substrate support assembly further comprises a protective layer covering an upper surface of the ceramic body, wherein the protective layer comprises at least one of yttrium aluminum garnet (YAG) or a ceramic compound comprising Y4Al2O9 and a solid-solution of Y2O3—ZrO2.
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公开(公告)号:US20180030589A1
公开(公告)日:2018-02-01
申请号:US15717844
申请日:2017-09-27
摘要: A chamber component comprises a body, a first protective layer and a conformal second protective layer over the first protective layer. The first protective layer comprises a plasma resistant ceramic, has a thickness of greater than approximately 50 microns and comprises a plurality of cracks and pores. The conformal second protective layer comprises a plasma resistant rare earth oxide, has a thickness of less than 50 microns, has a porosity of less than 1%, and seals the plurality of cracks and pores of the first protective layer.
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公开(公告)号:US20180010235A1
公开(公告)日:2018-01-11
申请号:US15712094
申请日:2017-09-21
发明人: Jennifer Y. Sun , Vahid Firouzdor , Biraja Prasad Kanungo , Tom K. Cho , Vedapuram S. Achutharaman , Ying Zhang
IPC分类号: C23C14/08 , C04B35/00 , C04B35/505 , C04B35/622 , C04B41/50 , C04B41/52 , C04B41/87 , C04B41/89 , H01J37/32 , C23C14/46 , C23C14/58 , C04B41/00
CPC分类号: C23C14/088 , C04B35/00 , C04B35/505 , C04B35/62222 , C04B41/009 , C04B41/4529 , C04B41/5045 , C04B41/52 , C04B41/87 , C04B41/89 , C04B2235/3217 , C04B2235/3222 , C04B2235/3225 , C04B2235/3246 , C04B2235/3418 , C04B2235/3826 , C04B2235/3873 , C04B2235/428 , C04B2235/445 , C23C14/08 , C23C14/083 , C23C14/46 , C23C14/5806 , H01J37/32477 , Y10T428/26 , Y10T428/265 , C04B35/10 , C04B35/50 , C04B35/14 , C04B35/584 , C04B35/565 , C04B41/5032 , C04B41/5042 , C04B41/5035 , C04B2103/54
摘要: An article comprises a body and a conformal protective layer on at least one surface of the body. The conformal protective layer is a plasma resistant rare earth oxide film having a thickness of less than 1000 μm, wherein the plasma resistant rare earth oxide film is selected from a group consisting of an Er—Y composition, an Er—Al—Y composition, an Er—Y—Zr composition, and an Er—Al composition.
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公开(公告)号:US09687953B2
公开(公告)日:2017-06-27
申请号:US14318518
申请日:2014-06-27
IPC分类号: B24B31/116 , B24B33/02 , B24B31/00 , B24B5/40
CPC分类号: B24B31/006 , B23B35/00 , B23B2220/445 , B23B2226/18 , B24B5/40 , B24B31/003 , B24B31/116 , B24B33/02
摘要: Disclosed herein are systems and methods for polishing internal surfaces of apertures in semiconductor processing chamber components. A method includes providing a ceramic article having at least one aperture, the ceramic article being a component for a semiconductor processing chamber. The method further includes polishing the at least one aperture based on flowing an abrasive media through the at least one aperture of the ceramic article, the abrasive media including a polymer base and a plurality of abrasive particles.
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公开(公告)号:US20170130319A1
公开(公告)日:2017-05-11
申请号:US15413198
申请日:2017-01-23
CPC分类号: H01L21/67023 , B65D43/02 , C23C4/01 , C23C4/04 , C23C4/10 , C23C4/11 , C23C4/12 , C23C4/134 , C23C4/14 , C23C4/16 , C23C14/0015 , C23C14/0021 , C23C14/0031 , C23C14/0036 , C23C14/0052 , C23C14/0084 , C23C14/0094 , C23C14/08 , C23C14/081 , C23C14/083 , C23C14/088 , H01J37/32477 , H01J37/32495 , H01J37/32513 , H01J2237/334 , H01L21/67063 , H01L21/67069 , H01L21/6708 , H01L21/67086 , Y10T428/131 , Y10T428/1317 , Y10T428/139 , Y10T428/1393
摘要: A method of manufacturing an article comprises performing ion assisted deposition (IAD) to deposit a protective layer on at least one surface of the article, wherein the protective layer is a plasma resistant rare earth oxide film having a thickness of less than 300 μm and an average surface roughness of 10 micro-inches or less.
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