Abstract:
Disclosed is a semiconductor memory device which operates based on voltages from a high voltage power source and a low voltage power source. A plurality of memory cells are formed in a memory cell array. Plural pairs of bit lines are connected to the memory cells to transfer data signals read from the memory cells. A sense amplifier, which has a pair of input terminals, amplifies the data signal. A level shifter is selectively connected to plural pairs of bit lines to shift the level of the data signal of a selected pair of bit lines to a level near the operation point of the sense amplifier, and supplies a resultant data signal to the sense amplifier. The level shifter includes a first transistor for receiving the data signal, and a plurality of second transistors connected between the first transistor and the low voltage power source. The first transistor has a first terminal to be supplied with the data signal, a second terminal and a control electrode for receiving a control signal for transferring the data signal to the sense amplifier. The second transistors are connected between the second terminal of the first transistor and the low voltage power source. The output of the second terminal of the first transistor is input to the input terminals of the sense amplifier.
Abstract:
An integrated semiconductor circuit has a boost circuit that may improve boost operation speed. The boost circuit employs a P-channel type transistor as a driver. The back gate of the P-channel type transistor is connected to a charge-up circuit so that the back gate may be charged to a predetermined level before a boost signal is applied to the driver.
Abstract:
A semiconductor device with an expanded range of a recommended condition for an input voltage is disclosed. In embodiment, the semiconductor device having input protection on an input terminal thereto, includes: a semiconductor region having a first conducting type, first and second diffusion regions defined in the semiconductor region and respectively having a second conducting type, and a transistor formed by using the semiconductor region as a base, the first diffusion region as a collector, and the second diffusion region as an emitter. The first diffusion region is connected to one of a high-potential power supply and a low-potential power supply, the second diffusion region is connected to the input terminal, and the semiconductor region is connected to another power supply having a voltage high enough to reverse bias the junction between the semiconductor region and the first diffusion region.
Abstract:
An initialization setting circuit (20) is adapted to set an initial condition of a latch circuit in a semiconductor device upon ON-set of the power supply, comprises a detecting circuit (TR1, TR2, R, 21) responsive to ON-set of power supply to detect the power source voltage (Vcc) reaching a given voltage, and an output level control circuit (22) responsive to the detecting signal output from the detecting circuit, for elevating up the level of an output signal of the initialization setting circuit to a high potential level or lowering the level of the output signal of the initialization setting circuit to a low potential level. By supplying the output signal controlled by said output level control circuit of the latch circuit as the power source voltage; the operation of the latch circuit is synchronized when the power source voltage is shut down, and a malfunction can be successfully prevented upon resetting of the power supply.
Abstract:
An input signal is received by a level shift circuit to generate a plurality of level-shifted output signals which have different shift amounts to each other. A switch circuit, selectively outputs the level-shifted output signals in response to a logic level of the input signal. The switch circuit selects a signal having a higher potential from the level-shifted output signals when the logic level of the input signal indicates a first level, and selects a signal having a lower potential from the level-shifted output signals when the logic level of the input signals indicates a second level.
Abstract:
A delay circuit having two or more first switching transistors connected in series between an output terminal and a power source line, and two or more second switching transistors connected in series between the output terminal and another power source line, the first and the second switching transistors operating in a complementary manner in response to an input signal, one or more nodes of each switching transistor being connected by one or more current paths each connecting at least one capacitor, whereby an input signal is transmitted to the output terminal at a specified interval defined by the capacitance of the capacitor.
Abstract:
A decoder circuit receives decoder inputs and producing decoder outputs. The decoder inputs are applied, as control inputs, to respective input transistors connected in parallel with each other. The outputs thereof are commonly connected to a node. The node is connected to a gate transistor and latch transistors. The gate transistor is operative to invert the level at the node momentarily every time the decoder circuit is switched from a nonselection state to a selection state. The latch transistors maintain the level at the node as the decoder output level.
Abstract:
A output buffer circuit incorporates an output controller and voltage controller between a first and a second voltage potential to buffer the output of data produced by a semiconductor device. The output controller provides switching control signals to transistors in the voltage controller in order to prevent the first potential from being effected by the potential at the output of the output buffer.
Abstract:
A load generator is disclosed, which controls the voltage swing of the complementary logic signals generated in a semiconductor memory device. The load generator includes a first load circuit for controlling the potential levels of the signals appearing on a pair of complementary input signal lines. The first load circuit includes a first and second voltage dividers connected to the complementary input signal lines. Each of the first and second voltage dividers include a first voltage dividing transistor and a first voltage dividing resistive element connected in series between the semiconductor's low and high potential power supplies. The two first voltage dividing transistors are connected to each other in such a manner that a voltage, divided by one of the two transistors, is applied to the gate of the other transistor. The load generator further includes a second load circuit for controlling the potential levels of the signals appearing on a pair of complementary output signal lines. The second load circuit includes a third and fourth voltage dividing circuits associated with the first and second voltage dividing circuits and connected to the complementary output signal lines, respectively. Each of the third and fourth voltage dividing circuits includes a second voltage dividing transistor and a second voltage dividing resistive element, connected in series between the low and high potential power supplies.
Abstract:
A static-type semiconductor memory device having a three-layer structure: gate-electrode wiring lines being formed from a first conductive layer of, for example, polycrystalline silicon; word lines, ground lines, and power supply lines being formed from a second conductive layer of, for example, aluminum; and bit lines being formed from a third conductive layer of, for example, aluminum. The bit lines extending in a column direction, and the ground lines extending in a row direction. Thus, providing an improved degree of integration, an improved operating speed, an improved manufacturing yield, and a countermeasure for soft errors due to alpha particles.