公开(公告)号：US20130254454A1

公开(公告)日：2013-09-26

申请号：US13600578

申请日：2012-08-31

申请人： Takashi IDE ,  Kiyotaka IWASAKI ,  Kouji WATANABE ,  Hiroyuki NANJOU ,  Makoto MORIYA

发明人： Takashi IDE ,  Kiyotaka IWASAKI ,  Kouji WATANABE ,  Hiroyuki NANJOU ,  Makoto MORIYA

IPC分类号： G06F12/06

CPC分类号： G06F3/0611 ,  G06F3/0659 ,  G06F3/0688 ,  G06F12/0246 ,  G06F12/0607 ,  G06F13/14 ,  G06F13/18 ,  G06F2212/7208

摘要： According to embodiments, a memory system includes a plurality of memory chips configuring banks, an instruction generator, and a memory controller. The instruction generator generates a plurality of instructions. The memory controller is configured to execute memory accesses to the banks based on the instructions. Each memory access comprises a first command sequence and a second command sequence. The first command sequence causes in-bank processing shortly subsequent to the first command. The second command sequence is executed subsequent to the in-bank processing. The memory controller executes successively a second command sequence to a first bank based on a first instruction and a first command sequence to the first bank based on a second instruction subsequent to the first instruction, and then starts a memory access to a second bank based on a third instruction while the first bank is executing the in-bank processing caused by the first command sequence.

公开(公告)号：US06603937B2

公开(公告)日：2003-08-05

申请号：US09908325

申请日：2001-07-17

申请人： Sohichi Yoshimura ,  Hiroki Eto ,  Kouichi Eto ,  Michiyuki Suzuki ,  Takashi Ide ,  Koji Tsukamoto ,  Kenji Tani ,  Hirohito Morioka ,  Kimiko Watanabe ,  Kazuya Masuda ,  Yoshinori Nakahira ,  Masaaki Kawakami ,  Takashi Sugitoh ,  Yoshikazu Kondoh ,  Mariko Arai ,  Takahiro Kawakami ,  Toshinori Tsujii

发明人： Sohichi Yoshimura ,  Hiroki Eto ,  Kouichi Eto ,  Michiyuki Suzuki ,  Takashi Ide ,  Koji Tsukamoto ,  Kenji Tani ,  Hirohito Morioka ,  Kimiko Watanabe ,  Kazuya Masuda ,  Yoshinori Nakahira ,  Masaaki Kawakami ,  Takashi Sugitoh ,  Yoshikazu Kondoh ,  Mariko Arai ,  Takahiro Kawakami ,  Toshinori Tsujii

IPC分类号： G03G1500

CPC分类号： H04N1/00405 ,  G03G15/502 ,  G03G15/5087 ,  G03G2215/00109 ,  H04N1/0001 ,  H04N1/00013 ,  H04N1/00037 ,  H04N1/0005 ,  H04N1/00063 ,  H04N1/00076 ,  H04N1/00408 ,  H04N1/0049

摘要： An object of the invention is to provide a display device of an image forming apparatus capable of displaying information that the user wants to obtain in a visually easy-to-recognize manner. In a complex image forming apparatus provided with: one of original reading means for reading image information from an original, image receiving means for receiving image information from a terminal connected to a network and a line image receiving means for receiving image information from a telephone line; image forming means for forming an image based on the image information obtained by the means; and a display portion for displaying the condition of the apparatus, a display condition control portion is provided that changes the display condition of the display portion to a visually easy-to-recognize condition when the condition of the complex image forming apparatus is changed.

公开(公告)号：US4714343A

公开(公告)日：1987-12-22

申请号：US848229

申请日：1986-04-04

申请人： Takashi Ide

发明人： Takashi Ide

IPC分类号： G02B6/00 ,  G01M11/00 ,  G01M11/08 ,  G01N21/84

CPC分类号： G01M11/088

摘要： An optical fiber characteristic measuring device for automatically measuring, at successive measuring stages, various characteristics of optical fiber samples. Each measuring stage has optical system incident and emergent ends. An optical fiber sample is set in a carrier which moves from measuring stage to measuring stage. At each stage the set fiber sample is coupled to the incident and emergent ends of the stage and automatically subjected to the measurement to which the stage is dedicated. Bending units provide a desired degree of curvature to the fiber sample under test to control light propagation therein.

摘要翻译： 一种光纤特性测量装置，用于在连续的测量阶段自动测量光纤样品的各种特性。 每个测量台都有光学系统入射和紧急端。 将光纤样品放置在从测量级移动到测量级的载体中。 在每个阶段，设定的光纤样品耦合到舞台的入射端和紧急端，并自动进行舞台专用的测量。 弯曲单元为被测纤维样品提供所需的曲率，以控制其中的光传播。

公开(公告)号：US08058695B2

公开(公告)日：2011-11-15

申请号：US12984885

申请日：2011-01-05

申请人： Tomoko Matsuda ,  Takashi Ide ,  Hiroshi Kimura

发明人： Tomoko Matsuda ,  Takashi Ide ,  Hiroshi Kimura

IPC分类号： H01L29/78

CPC分类号： H01L21/28518 ,  H01L29/665 ,  H01L29/6659 ,  H01L29/7833 ,  H01L2924/0002 ,  H01L2924/00

摘要： A semiconductor device includes a silicon substrate, and a NiSi layer provided on the silicon substrate aiming to suppress oxidation of the surface of a NiSi layer and the resistivity increase. The NiSi layer includes a bottom NiSi region and a top NiSi region. The bottom NiSi region provided in contact with silicon surface, and containing substantially no nitrogen. The top NiSi region is a nitrided NiSi region provided in contact with the bottom NiSi region, and containing nitrogen. The NiSi layer has a total thickness of 50 nm or below.

摘要翻译： 半导体器件包括硅衬底和设置在硅衬底上的NiSi层，旨在抑制NiSi层的表面的氧化和电阻率增加。 NiSi层包括底部NiSi区域和顶部NiSi区域。 提供与硅表面接触并且基本上不含氮的底部NiSi区。 顶部NiSi区域是与底部NiSi区域接触并且含有氮气的氮化NiSi区域。 NiSi层的总厚度为50nm以下。

公开(公告)号：US07879722B2

公开(公告)日：2011-02-01

申请号：US11790747

申请日：2007-04-27

申请人： Tomoko Matsuda ,  Takashi Ide ,  Hiroshi Kimura

发明人： Tomoko Matsuda ,  Takashi Ide ,  Hiroshi Kimura

IPC分类号： H01L21/84 ,  H01L21/44 ,  H01L23/48

CPC分类号： H01L21/28518 ,  H01L29/665 ,  H01L29/6659 ,  H01L29/7833 ,  H01L2924/0002 ,  H01L2924/00

摘要： A semiconductor device includes a silicon substrate, and a NiSi layer provided on the silicon substrate aiming to suppress oxidation of the surface of a NiSi layer and the resistivity increase. The NiSi layer includes a bottom NiSi region and a top NiSi region. The bottom NiSi region provided in contact with silicon surface, and containing substantially no nitrogen. The top NiSi region is a nitrided NiSi region provided in contact with the bottom NiSi region, and containing nitrogen. The NiSi layer has a total thickness of 50 nm or below.

摘要翻译： 半导体器件包括硅衬底和设置在硅衬底上的NiSi层，旨在抑制NiSi层的表面的氧化和电阻率增加。 NiSi层包括底部NiSi区域和顶部NiSi区域。 提供与硅表面接触并且基本上不含氮的底部NiSi区。 顶部NiSi区域是与底部NiSi区域接触并且含有氮气的氮化NiSi区域。 NiSi层的总厚度为50nm以下。

公开(公告)号：US20080320375A1

公开(公告)日：2008-12-25

申请号：US12143114

申请日：2008-06-20

申请人： Kiyohide Hori ,  Hiroshi Benno ,  Takashi Ide

发明人： Kiyohide Hori ,  Hiroshi Benno ,  Takashi Ide

IPC分类号： H03M13/09 ,  G06F11/10

CPC分类号： H04L1/0061 ,  H03M13/09 ,  H04L9/06 ,  H04L2209/34

摘要： To provide a data transmitting apparatus and the like capable of enhancing error detection accuracy without increasing a bandwidth unnecessarily used for the error detection performed on encrypted data and minimizing deterioration in sound quality of the data by effectively reducing noises in the transmission of the data through networks for cars and the like even though the data transmitting apparatus has been simply structured. The present invention makes it possible to perform error detection on audio data according to the sizes of encrypted blocks or packets using simple error check codes embedded in the audio data, or to perform error detection using a variation sequence of attribute information to be transmitted together with the audio data. In this case, output of the sound resulting from the audio data having an error is stopped.

摘要翻译： 为了提供能够提高错误检测精度的数据发送装置等，而不增加不必要地用于对加密数据进行的错误检测的带宽，并且通过有效减少通过网络传输数据的噪声来最小化数据的声音质量的劣化 对于汽车等，即使数据发送装置已经简单地构造。 本发明可以根据嵌入在音频数据中的简单错误校验码根据加密块或分组的大小对音频数据执行错误检测，或者使用将要传送的属性信息的变化序列进行错误检测 音频数据。 在这种情况下，停止由具有错误的音频数据产生的声音的输出。

公开(公告)号：US20070254480A1

公开(公告)日：2007-11-01

申请号：US11790747

申请日：2007-04-27

申请人： Tomoko Matsuda ,  Takashi Ide ,  Hiroshi Kimura

发明人： Tomoko Matsuda ,  Takashi Ide ,  Hiroshi Kimura

IPC分类号： H01L21/84 ,  H01L21/44 ,  H01L23/48

CPC分类号： H01L21/28518 ,  H01L29/665 ,  H01L29/6659 ,  H01L29/7833 ,  H01L2924/0002 ,  H01L2924/00

摘要： A semiconductor device includes a silicon substrate, and a NiSi layer provided on the silicon substrate aiming to suppress oxidation of the surface of a NiSi layer and the resistivity increase. The NiSi layer includes a bottom NiSi region and a top NiSi region. The bottom NiSi region provided in contact with silicon surface, and containing substantially no nitrogen. The top NiSi region is a nitrided NiSi region provided in contact with the bottom NiSi region, and containing nitrogen. The NiSi layer has a total thickness of 50 nm or below.

摘要翻译： 半导体器件包括硅衬底和设置在硅衬底上的NiSi层，旨在抑制NiSi层的表面的氧化和电阻率增加。 NiSi层包括底部NiSi区域和顶部NiSi区域。 提供与硅表面接触并且基本上不含氮的底部NiSi区。 顶部NiSi区域是与底部NiSi区域接触并且含有氮气的氮化NiSi区域。 NiSi层的总厚度为50nm以下。

公开(公告)号：US07187388B2

公开(公告)日：2007-03-06

申请号：US09781963

申请日：2001-02-14

申请人： Takashi Ide

发明人： Takashi Ide

IPC分类号： G09G5/00

CPC分类号： G06F17/30595 ,  G06F17/246 ,  G06F17/3033

摘要： In a two-dimensional data processing technique according to the present invention, there is provided a mechanism for inputting two-dimensional data, and for outputting a piece of two-dimensional data after subjected selectively to one of a plurality of predefined operations to a row or a column of the two-dimensional data; operation contents comprising an operation type which specifies the operation to be performed by the mechanism, an input target and an output target are designated; and at least one piece of operation contents is recorded in the designation order of the operation contents.

摘要翻译： 在根据本发明的二维数据处理技术中，提供了一种用于输入二维数据的机制，并且用于在经过选择性地对多个预定义操作中的一个进行行后输出一条二维数据 或一列二维数据; 指定包括指定要由机构执行的操作的操作类型的操作内容，输入目标和输出目标; 并且以操作内容的指定顺序记录至少一个操作内容。

公开(公告)号：US06546313B2

公开(公告)日：2003-04-08

申请号：US09855740

申请日：2001-05-16

申请人： Yoshinori Nakahira ,  Hirohito Morioka ,  Takashi Ide ,  Mariko Arai ,  Kazuya Masuda

发明人： Yoshinori Nakahira ,  Hirohito Morioka ,  Takashi Ide ,  Mariko Arai ,  Kazuya Masuda

IPC分类号： G06F700

CPC分类号： B65H39/11 ,  B65H2511/412 ,  B65H2511/415 ,  B65H2557/12 ,  B65H2557/23 ,  G03G15/6538 ,  G03G2215/00907

摘要： An image forming apparatus having a plurality of discharge trays is provided, from which a user can readily obtain printed sheets he has requested. The user inputs a secret code at an operating and displaying section, which secret code the user specified at the terminal device at the time of print request (S301). When a coincidence between the inputted secret code and a secret code stored in secret code storage section is judged (S303), the target discharge tray information corresponding to the secret code is read out from a secret code storage section (memory) and displayed on the operating and displaying section (S304). Accordingly, the user can visually recognize information about a discharge tray on which the user's requested printed sheets are discharged.

摘要翻译： 提供具有多个排出托盘的图像形成装置，用户可以从中容易地获得他所要求的印张。 用户在操作和显示部分输入密码，该密码是在打印请求时在终端设备处指定的用户密码（S301）。 当判断输入的秘密码与秘密码存储部中存储的秘密码之间的一致时（S303），从密码存储部（存储器）中读出与秘密码对应的目标排出托盘信息，并显示在 操作和显示部分（S304）。 因此，用户可以在视觉上识别关于用户所要求的印刷品排出的排出托盘的信息。

公开(公告)号：US06323484B1

公开(公告)日：2001-11-27

申请号：US09416780

申请日：1999-10-13

申请人： Takashi Ide ,  Hiroshi Itoh

发明人： Takashi Ide ,  Hiroshi Itoh

IPC分类号： H05H302

CPC分类号： H01J37/252

摘要： An apparatus and a method for sample current spectroscopy surface measurement to inspect crystailnity of a sample surface. An electron beam is irradiated onto a surface of a sample by an electron gun. A variable voltage source supplies an acceleration voltage which is variable to change an acceleration energy of the electron beam irradiated from the electron gun onto the sample surface. A sample current measurement means measures a sample current which flows into a sample when the electron beam is irradiated from the electron gun onto the sample surface. Variation of the sample current is detected by measuring the sample current by the sample current measurement means when the acceleration energy of the electron beam irradiated by the electron gun onto the sample surface is changed by the variable voltage source, thereby crystallinity of the sample surface is inspected.

摘要翻译： 用于样本电流光谱表面测量的装置和方法，以检查样品表面的结晶度。 电子束通过电子枪照射到样品的表面上。 可变电压源提供可变的加速电压，以将从电子枪照射的电子束的加速能量改变到样品表面上。 样本电流测量装置测量当电子束从电子枪照射到样品表面上时流入样品的样品电流。 当由电子枪照射到样品表面上的电子束的加速能量被可变电压源改变时，通过采样电流测量装置测量样品电流来检测样品电流的变化，从而样品表面的结晶度为 检查。