Method of forming deposited patterns on a surface
    52.
    发明授权
    Method of forming deposited patterns on a surface 有权
    在表面上形成沉积图案的方法

    公开(公告)号:US09105800B2

    公开(公告)日:2015-08-11

    申请号:US14100048

    申请日:2013-12-09

    CPC classification number: H01L31/18 B81C1/00373 B81C2201/0188 H01L31/02327

    Abstract: A method for forming a coating of material on selected portions of a surface of a substrate having a plurality of cavities, each cavity having outer, peripheral sidewalls extending outwardly from the surface. The method includes: providing a structure having a release agent thereon; contacting top surface of the wafer with the release agent to transfer portions of the release agent to the top surface of the wafer while bottom portions of the cavities remain spaced from the release agent to produce an intermediate structure; the release agent disposed on the top surface of the wafer and with the bottom portions of the cavities void of the release agent; exposing the intermediate structure to the material to blanket coat the material on both the release agent and the bottom portions of the cavities; and selectively removing the release agent together with the coating material while leaving the coating material on the bottom portions of the cavities.

    Abstract translation: 一种用于在具有多个空腔的基板的表面的选定部分上形成材料涂层的方法,每个空腔具有从表面向外延伸的外部周边侧壁。 该方法包括:提供其上具有脱模剂的结构; 使所述晶片的顶表面与所述脱模剂接触以将所述脱模剂的部分转移到所述晶片的顶表面,同时所述空腔的底部保持与所述脱模剂间隔开以产生中间结构; 所述脱模剂设置在所述晶片的顶表面上,并且所述空腔的底部部分脱离所述脱模剂; 将所述中间结构暴露于所述材料以在所述空腔的所述脱模剂和所述底部两者上均匀地涂覆所述材料; 并且与涂料一起选择性地除去脱模剂,同时将涂料留在空腔的底部。

    FREE FORM PRINTING OF SILICON MICRO- AND NANOSTRUCTURES
    55.
    发明申请
    FREE FORM PRINTING OF SILICON MICRO- AND NANOSTRUCTURES 审中-公开
    自由形式印刷硅微结构和纳米结构

    公开(公告)号:US20130029480A1

    公开(公告)日:2013-01-31

    申请号:US13639221

    申请日:2011-04-05

    Abstract: A method of making a three-dimensional structure in semiconductor material includes providing a substrate (20) is provided having at least a surface including semiconductor material. Selected areas of the surface of the substrate are exposed to a focussed ion beam whereby the ions are implanted in the semiconductor material in the selected areas. Several layers of a material selected from the group consisting of mono-crystalline, poly-crystalline or amorphous semiconductor material, are deposited on the substrate surface and between depositions focussed ion beam is used to expose the surface so as to define a three-dimensional structure. Material not part of the final structure (30) defined by the focussed ion beam is etched away so as to provide a three-dimensional structure on the substrate (20).

    Abstract translation: 在半导体材料中制造三维结构的方法包括提供至少具有包括半导体材料的表面的基底(20)。 将基板的表面的选定区域暴露于聚焦的离子束,由此将离子注入到所选择的区域中的半导体材料中。 选自由单晶,多晶或非晶半导体材料组成的组的几层材料沉积在衬底表面上,并且在沉积之间聚焦离子束以暴露表面以便限定三维结构 。 不会被聚焦的离子束限定的最终结构(30)的部分的材料被蚀刻掉,以便在衬底(20)上提供三维结构。

    Method of fabrication of fibers, textiles and composite materials
    56.
    发明授权
    Method of fabrication of fibers, textiles and composite materials 有权
    纤维,纺织品和复合材料的制造方法

    公开(公告)号:US08361566B2

    公开(公告)日:2013-01-29

    申请号:US12099556

    申请日:2008-04-08

    Inventor: James L. Maxwell

    Abstract: A method of growing a plurality of free-standing structures comprises providing a plurality of free-standing structures, each free-standing structure having a first end coupled to a substrate, and a terminal end; providing at least one laser beam, the laser beam having a beam waste at a point proximate to the terminal end of the free-standing structure; and moving one of the plurality of freestanding structures or the beam waste to provide a growth zone proximate to the terminal end of each of the free-standing structures such that the free-standing structures grow into the growth zones by addition of decomposing precursor components. The growth rates of each of the free-standing structures are substantially the same.

    Abstract translation: 生长多个独立结构的方法包括提供多个独立结构,每个独立结构具有耦合到衬底的第一端和终端; 提供至少一个激光束,所述激光束在靠近所述独立结构的终端的点处具有光束废料; 并且移动所述多个独立结构或束废料中的一个以提供靠近每个独立结构的末端的生长区,使得通过添加分解的前体组分而使自立结构生长到生长区中。 每个独立结构的增长率基本相同。

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