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公开(公告)号:US20190164985A1
公开(公告)日:2019-05-30
申请号:US16027887
申请日:2018-07-05
Applicant: Samsung Electronics Co., Ltd.
Inventor: Kiseok LEE , Junsoo KIM , Hui-Jung KIM , Bong-Soo KIM , Satoru YAMADA , Kyupil LEE , Sunghee HAN , HyeongSun HONG , Yoosang HWANG
IPC: H01L27/11556 , H01L23/532 , H01L27/11524 , H01L49/02 , G11C8/14 , G11C7/18
Abstract: A semiconductor memory device comprises a stack structure including a plurality of layers vertically stacked on a substrate. Each of the plurality of layers includes a first dielectric layer, a semiconductor layer, and a second dielectric layer that are sequentially stacked, and a first conductive line in the second dielectric layer and extending in a first direction. The device also comprises a second conductive line extending vertically through the stack structure, and a capacitor in the stack structure and spaced apart from the second conductive line. The semiconductor layer comprises semiconductor patterns extending in a second direction intersecting the first direction between the first conductive line and the substrate. The second conductive line is between a pair of the semiconductor patterns adjacent to each other in the first direction. An end of each of the semiconductor patterns is electrically connected to a first electrode of the capacitor.
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公开(公告)号:US20180146387A1
公开(公告)日:2018-05-24
申请号:US15568090
申请日:2016-04-27
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Dohy HONG , Dojun BYUN , Sinseok SEO , Kiseok LEE , Daekyu CHOI
CPC classification number: H04W24/10 , H04W4/00 , H04W4/02 , H04W4/023 , H04W4/029 , H04W4/80 , H04W8/20 , H04W24/08 , H04W88/02 , H04W88/18 , H04W88/184
Abstract: According to one embodiment of the present disclosure, a method and a terminal can be provided, and a beacon service method of the terminal comprises the steps of: transmitting a beacon including identification information of the terminal; receiving beacon-related information from a reception device having received the beacon; receiving a beacon-related information report request message from an information collection device; and transmitting stored beacon-related information to the information collection device. In addition, the present disclosure can provide a beacon reception device communicating with the terminal and an operation method therefor, an information collection device communicating with the terminal and an operation method therefor, and a server for providing a beacon service and an operation method of the server.
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公开(公告)号:US20170336916A1
公开(公告)日:2017-11-23
申请号:US15598576
申请日:2017-05-18
Applicant: Samsung Electronics Co., Ltd.
Inventor: Kiseok LEE , Kyungwhoon CHEUN , Dohy HONG , Sungkee KIM , Sungil PARK , Changmin HA
IPC: G06F3/041 , G06F3/0488 , G06F3/0484
CPC classification number: G06F3/0418 , G06F3/04842 , G06F3/0488
Abstract: A method of processing an input in an electronic device having a touch screen is provided. The method includes identifying attribute information of a geometric figure corresponding to an area of a touch input detected through the touch screen, determining a user input from the attribute information, based on a stored user input distinction rule, and executing a function corresponding to the determined user input.
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公开(公告)号:US20240422961A1
公开(公告)日:2024-12-19
申请号:US18640513
申请日:2024-04-19
Applicant: Samsung Electronics Co., Ltd.
Inventor: Joongchan SHIN , Seokhan PARK , Kiseok LEE , Moonyoung JEONG , Jinwoo HAN
IPC: H10B12/00
Abstract: A semiconductor memory device includes a plurality of word lines extending in a first horizontal direction, a plurality of back gate lines extending in the first horizontal direction and alternately arranged with the plurality of word lines in a second horizontal direction different from the first horizontal direction, a plurality of channel layers extending in a vertical direction between a word line and a back gate line adjacent to each other among the plurality of word lines and the plurality of back gate lines, to correspond to columns in the first horizontal direction, a plurality of bit lines extending in the second horizontal direction on the plurality of word lines, the plurality of back gate lines, and the plurality of channel layers and electrically connected to the plurality of channel layers, and a plurality of memory structures electrically connected to the plurality of channel layers.
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公开(公告)号:US20240421223A1
公开(公告)日:2024-12-19
申请号:US18631839
申请日:2024-04-10
Applicant: Samsung Electronics Co., Ltd.
Inventor: Joongchan SHIN , Seokhan PARK , Kiseok LEE , Moonyoung JEONG , Jinwoo HAN
Abstract: A semiconductor device includes a substrate, a bit line extending in a first direction on the substrate, a first active pattern and a second active pattern on the bit line, a back gate electrode extending in a second direction perpendicular to the first direction across the bit line, and a word line extending in the second direction, wherein the first active pattern and the second active pattern have a minor symmetrical shape with respect to the back gate electrode when viewed in a third direction perpendicular to the first direction and the second direction.
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公开(公告)号:US20240421039A1
公开(公告)日:2024-12-19
申请号:US18652381
申请日:2024-05-01
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Hyungeun CHOI , Kiseok LEE
IPC: H01L23/48 , H01L23/00 , H01L25/065 , H10B80/00
Abstract: A semiconductor device includes a lower chip structure including a memory structure and a lower wiring structure connected to the memory structure and an upper chip structure on the lower chip structure, where the upper chip structure includes an upper base, peripheral transistors below the upper base, an intermediate wiring structure below the upper base and connected to the peripheral transistors, an upper wiring structure on the upper base, a first through-via penetrating the upper base between the upper wiring structure and the intermediate wiring structure, the first through-via connecting the upper wiring structure and the intermediate wiring structure, and a second through-via extending respectively downward and penetrating the upper base between the upper wiring structure and the lower wiring structure, the second through-via connecting the upper wiring structure and the lower wiring structure.
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公开(公告)号:US20240304691A1
公开(公告)日:2024-09-12
申请号:US18668743
申请日:2024-05-20
Applicant: Samsung Electronics Co., Ltd.
Inventor: Hoin LEE , Kiseok LEE
IPC: H01L29/423 , H01L29/40
CPC classification number: H01L29/423 , H01L29/402
Abstract: A semiconductor device includes lower electrodes, a first supporter structure including first supporter patterns interconnecting the lower electrodes, wherein side surfaces of the first supporter patterns and side surfaces of the lower electrodes that are exposed by the first supporter patterns at least partially define a first open region, the first supporter patterns being spaced apart from one another, the first open region extending among the first supporter patterns in a horizontal direction, a dielectric layer covering the first supporter structure and the lower electrodes, and an upper electrode on the dielectric layer. A distance between adjacent ones of the first supporter patterns is smaller than or equal to a pitch of the lower electrodes.
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公开(公告)号:US20240276712A1
公开(公告)日:2024-08-15
申请号:US18435263
申请日:2024-02-07
Applicant: Samsung Electronics Co., Ltd.
Inventor: Hongjun LEE , Keunnam KIM , Kiseok LEE
CPC classification number: H10B12/482 , H01L29/7827
Abstract: A semiconductor device may include a substrate, a bit line structure, first and second gate electrodes spaced apart from each other, and first and second gate dielectric layers. The substrate may include a first upper active region and a second upper active region spaced apart from each other and protruding upwardly from a lower active region, a first vertical active pillar protruding upwardly from the first upper active region, and a second vertical active pillar protruding upwardly from the second upper active region. The bit line structure may be between the first and second upper active regions. The first and second gate electrodes respectively may surround channel regions of the first and second vertical active pillars. First and second gate dielectric layers respectively may be between the first vertical active pillar and the first gate electrode and between the second vertical active pillar and the second gate electrode.
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公开(公告)号:US20240098985A1
公开(公告)日:2024-03-21
申请号:US18219229
申请日:2023-07-07
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Kiseok LEE
IPC: H10B12/00
CPC classification number: H10B12/485 , H10B12/05 , H10B12/315 , H10B12/34
Abstract: A semiconductor device includes a substrate having at least one active region, the at least one active region being defined by an isolation layer, at least one word line extending in a first horizontal direction inside the substrate, the at least one word line crossing the at least one active region, at least one bit line extending in a second horizontal direction orthogonal to the first horizontal direction, the at least one bit line being at a higher vertical level than the at least one word line, and at least one direct contact electrically connecting the at least one bit line to the at least one active region, the at least one direct contact having a maximum width in a third horizontal direction, the third horizontal direction intersecting each of the first horizontal direction and the second horizontal direction at an acute angle.
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公开(公告)号:US20230354588A1
公开(公告)日:2023-11-02
申请号:US18117604
申请日:2023-03-06
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Kiseok LEE , Junhyeok AHN , Keunnam KIM , Chan-Sic YOON , Myeong-Dong LEE
IPC: H10B12/00
CPC classification number: H10B12/485 , H10B12/315 , H10B12/34 , H10B12/482 , H10B12/02
Abstract: A semiconductor memory device includes a semiconductor substrate; a device isolation layer defining an active portion in the semiconductor substrate; a bit line structure intersecting the active portion on the semiconductor substrate; a first conductive pad between the bit line structure and the active portion; a bit line contact pattern between the first conductive pad and the bit line structure; a first bit line contact spacer covering a first sidewall of the first conductive pad; and a second bit line contact spacer covering a second sidewall of the first conductive pad, wherein the first conductive pad has a flat bottom surface that is in contact with a top surface of the active portion, and a width of the first bit line contact spacer is different from a width of the second bit line contact spacer.
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