SPECTROMETER FOR ANALYSING THE SPECTRUM OF A LIGHT BEAM
    39.
    发明申请
    SPECTROMETER FOR ANALYSING THE SPECTRUM OF A LIGHT BEAM 有权
    用于分析光束光谱的光谱仪

    公开(公告)号:US20150300876A1

    公开(公告)日:2015-10-22

    申请号:US14649065

    申请日:2013-11-29

    Abstract: A spectrometer (100) for analyzing the spectrum of an upstream light beam (1) includes an entrance slit (101) and angular dispersing elements (130). The angular dispersing elements include at least one polarization-dependent diffraction grating that is suitable for, at the plurality of wavelengths (1, 2, 3), diffracting a corrected light beam (20) into diffracted light beams (31, 32, 33) in a given particular diffraction order of the polarization-dependent diffraction grating, which is either the +1 diffraction order or the −1 diffraction order, when the corrected light beam has a preset corrected polarization state that is circular; and the spectrometer includes elements for modifying polarization (1100) placed between the entrance slit and the angular dispersion elements, which are suitable for modifying the polarization state of the upstream light beam in order to generate the corrected light beam with a preset corrected polarization state.

    Abstract translation: 用于分析上游光束(1)的光谱的光谱仪(100)包括入射狭缝(101)和角度分散元件(130)。 角分散元件包括至少一个偏振相关衍射光栅,其适于在多个波长(1,2,3)处将经校正的光束(20)衍射成衍射光束(31,32,33) 在偏光相关衍射光栅的给定特定衍射级中,其为+1衍射级或-1衍射级,当校正光束具有预设的校正偏振态为圆形时; 并且光谱仪包括用于改变放置在入射狭缝和角分散元件之间的偏振(1100)的元件,其适于修改上游光束的偏振状态,以便产生具有预设校正偏振状态的校正光束。

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