SYSTEM AND METHOD FOR ULTRASONIC TESTING AND WELD INSPECTION

    公开(公告)号:US20240167981A1

    公开(公告)日:2024-05-23

    申请号:US18057612

    申请日:2022-11-21

    CPC classification number: G01N29/265 G01N29/04 G01N2291/0289 G01N2291/267

    Abstract: System and method are described herein relating to weld inspection. In an example, an ultrasonic inspection system can include a scanning head, an output device, and a weld tracker. The scanning head can be used to position a probe relative to a weld during weld inspection. The scanning head can include a location determination device that can be configured to determine a location for the scanning head that can be an approximate location for the weld during the weld inspection. The weld tracker can be configured to receive the location for the scanning head that can be the approximate location for the weld during the weld and cause the output device to render the approximate location for the weld. In some examples, the ultrasonic inspection system includes an access controller that can control access to using one of the scanning head and weld testing software.

    METHOD AND SYSTEM USING PRE-QUALIFIED REFERENCE DATA IN VIBRATION SYSTEM

    公开(公告)号:US20240133842A1

    公开(公告)日:2024-04-25

    申请号:US18485853

    申请日:2023-10-11

    CPC classification number: G01N29/04 G01N29/22

    Abstract: A method used in a system allows an operator to use pre-qualified reference data to determine limits in the same statistical domain for one or more outputs, which can be used to qualify reference data for use during a test. With this method, each drive is applied to the system where a controller receives the data. The controller automatically scrutinizes the data received comparing each output received to its associated set of acceptable limits. If one or more of the limits are violated, the output(s) will be identified to the operator and the received data will be disqualified or otherwise not used. When received response data does indeed meet all limits, the data can be considered qualified reference data that is then used during testing.

    Pulse stretching technique for laser bond inspection, laser ultrasonic inspection, and laser peening

    公开(公告)号:US11906469B2

    公开(公告)日:2024-02-20

    申请号:US17514555

    申请日:2021-10-29

    Inventor: Morteza Safai

    CPC classification number: G01N29/2418 G01N29/04 H01S3/0057 H01S3/225

    Abstract: An example laser system includes a laser, a plurality of pulse stretchers coupled together in series, a feedback module, and a lens assembly. The plurality of pulse stretchers is configured to stretch pulse widths of laser pulses provided by the laser and to output stretched laser pulses. The feedback module includes a pulse delay comparator that is configured to compare a first laser pulse of the laser pulses to a corresponding first stretched laser pulse of the stretched laser pulses. The feedback module also includes a computing device that is configured to determine, based on a result of the comparing by the pulse delay comparator, an adjustment to a pulse stretcher of the plurality of pulse stretchers, and apply the adjustment to the pulse stretcher so as to modify a shape of a second stretched laser pulse of the stretched laser pulses.

    ULTRASONIC INSPECTION APPARATUS
    20.
    发明公开

    公开(公告)号:US20230375508A1

    公开(公告)日:2023-11-23

    申请号:US18133335

    申请日:2023-04-11

    CPC classification number: G01N29/223 G01N29/04 G01N2291/102 G01N2291/023

    Abstract: An ultrasonic inspection apparatus includes a transmitting and a receiving probe. The transmitting probe includes a first contact part having a first convex cylindrical surface in line contact with the curved surface, and a transmitting element configured to transmit an ultrasonic wave to the first surface. The receiving probe includes a second contact part having a second convex cylindrical surface, and a receiving element configured to receive an ultrasonic wave incident from the second surface. The transmitting element is provided along a first attachment surface perpendicular to a first transmitting virtual line that passes a first contact position and is slanted away from the receiving probe with respect to the line. The receiving element is provided along a second attachment surface perpendicular to a second receiving virtual line that passes a second contact position and is slanted away from the transmitting probe with respect to the second line.

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