WAVEFORM GENERATOR
    2.
    发明申请

    公开(公告)号:US20250060466A1

    公开(公告)日:2025-02-20

    申请号:US18940049

    申请日:2024-11-07

    Abstract: A waveform generator includes a system control unit and signal channels controlled by the system control unit and configured to supply driving signals for driving a respective transducer of an array of transducers. Each signal channel includes a sequential access memory having rows, where each row contains an instruction word configured to generate a respective step of a waveform to be generated. A memory output of the sequential access memory is defined by an output row at a fixed location. The waveform to be generated is defined by a block of instruction words. Each signal channel also includes an internal control unit that is configured to sequentially move the content of the sequential access memory, based on the instruction word currently at the memory output, so that sequences of instruction words are provided at the output row.

    Microelectromechanical device having a structure tiltable by piezoelectric actuation about two rotation axes

    公开(公告)号:US12222492B2

    公开(公告)日:2025-02-11

    申请号:US17487166

    申请日:2021-09-28

    Abstract: A microelectromechanical device includes a fixed structure having a frame defining a cavity, a tiltable structure elastically suspended above the cavity with main extension in a horizontal plane, a piezoelectrically driven actuation structure which can be biased to cause a desired rotation of the tiltable structure about a first and second rotation axes, and a supporting structure integral with the fixed structure and extending in the cavity starting from the frame. Lever elements are elastically coupled to the tiltable structure at a first end by elastic suspension elements and to the supporting structure at a second end by elastic connecting elements which define a lever rotation axis. The lever elements are elastically coupled to the actuation structure so that their biasing causes the desired rotation of the tiltable structure about the first and second rotation axes.

    Photonic wafer level testing systems, devices, and methods of operation

    公开(公告)号:US12216020B2

    公开(公告)日:2025-02-04

    申请号:US17318831

    申请日:2021-05-12

    Abstract: A method of testing a photonic device includes providing a plurality of optical test signals at respective inputs of a first plurality of inputs of an optical input circuit located on a substrate, combining the plurality of optical test signals into a combined optical test signal at an output of the optical input circuit, transmitting the combined optical test signal through the output to an input waveguide of an optical device under test, the optical device under test being located on the substrate, and measuring a response of the optical device under test to the combined optical test signal. Each of the plurality of optical test signals comprises a respective dominant wavelength of a plurality of dominant wavelengths.

    Sensor device and related method and system

    公开(公告)号:US12212648B2

    公开(公告)日:2025-01-28

    申请号:US18453018

    申请日:2023-08-21

    Abstract: A sensor includes detection circuitry and control circuitry coupled to the detection circuitry. The detection circuitry generates a detection signal indicative of a detected physical quantity. The control circuitry, in operation receives the detection signal and a frequency-indication signal, and generates a trigger signal based on the frequency-indication signal and a set of local reference signals. The sensor generates a digital output signal and a locking signal based on the trigger signal and the detection signal. The generating the digital output signal includes outputting a sample of the digital output signal based on the trigger signal. The locking signal is temporally aligned with the digital output signal.

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