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公开(公告)号:US20190081166A1
公开(公告)日:2019-03-14
申请号:US16028612
申请日:2018-07-06
Inventor: Jae Won DO , Dong Min KANG , Dong-Young KIM , SEONG-IL KIM , Hae Cheon KIM , Byoung-Gue MIN , Min Jeong SHIN , Hokyun AHN , Hyung Sup YOON , Sang-Heung LEE , Jongmin LEE , Jong-Won LIM , Sungjae CHANG , Yoo Jin JANG , Hyunwook JUNG , Kyu Jun CHO , Hong Gu JI
IPC: H01L29/778 , H01L29/423 , H01L29/66 , H01L29/06 , H01L29/10 , H01L29/205
Abstract: Provided is a gate-all-around device. The gate-all-around device includes a substrate, a pair of heterojunction source/drain regions provided on the substrate, a heterojunction channel region provided between the pair of heterojunction source/drain regions, and a pair of ohmic electrodes provided on the pair of heterojunction source/drain regions, respectively. Each of the pair of heterojunction source/drain regions includes a pair of two-dimensional electron gas layers. The pair of ohmic electrodes extends toward an upper surface of the substrate and pass through the pair of heterojunction source/drain regions, respectively.
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公开(公告)号:US20180145684A1
公开(公告)日:2018-05-24
申请号:US15654792
申请日:2017-07-20
Inventor: Woojin CHANG , Jong-Won LIM , Dong Min KANG , Dong-Young KIM , Seong-il KIM , Hae Cheon KIM , Jae Won DO , BYOUNG-GUE MIN , Min Jeong SHIN , Hokyun AHN , Hyung Sup YOON , Sang-Heung LEE , JONGMIN LEE , Sungjae CHANG , Yoo Jin JANG , HYUNWOOK JUNG , Kyu Jun CHO , Hong Gu JI
IPC: H03K17/687 , H03K17/693 , G11C5/14 , H03K19/0175 , H03K3/353
CPC classification number: H03K17/687 , G11C5/14 , H03K3/353 , H03K17/08122 , H03K17/102 , H03K17/122 , H03K17/145 , H03K17/162 , H03K17/28 , H03K17/693 , H03K19/0175
Abstract: Provided is a cascode circuit including first and second transistors connected between a drain terminal and a source terminal in cascode form, a level sifter configured to change a voltage level of a switching control signal applied to a gate terminal and provide the changed switching control signal to a gate of the first transistor, a buffer configured to delay the switching control signal and provide the delayed switching control signal to a gate of the second transistor, and a first resistor connected between the level shifter and the gate of the first transistor.
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公开(公告)号:US20170237171A1
公开(公告)日:2017-08-17
申请号:US15229891
申请日:2016-08-05
Inventor: Dong-Young KIM , Dong Min KANG , SEONG-IL KIM , Hae Cheon KIM , Jae Won DO , Byoung-Gue MIN , Ho Kyun AHN , Hyung Sup YOON , Sang-Heung LEE , Jong Min LEE , Jong-Won LIM , Yoo Jin JANG , Hyun Wook JUNG , Kyu Jun CHO , Chull Won JU
CPC classification number: H01Q9/0407 , H01Q1/50 , H01Q9/0442
Abstract: Provided herein is a patch antenna including a multilayered substrate on which a plurality of dielectric layers are laminated; at least one metal pattern layer disposed between the plurality of dielectric layers outside a central area of the multilayered substrate; an antenna patch disposed on an upper surface of the multilayered substrate and within the central area; a ground layer disposed on a lower surface of the multilayered substrate; a plurality of connection via patterns penetrating the plurality of dielectric layers to connect the metal pattern layer and the ground layer, and surrounding the central area; a transmission line comprising a first transmission line unit disposed on the upper surface of the multilayered substrate and located outside the central area, and a second transmission line unit disposed on the upper surface of the multilayered substrate and located within the central area; and an impedance transformer located below the second transmission line unit within the central area of the multilayered substrate.
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14.
公开(公告)号:US20140035044A1
公开(公告)日:2014-02-06
申请号:US14049816
申请日:2013-10-09
Inventor: Hokyun AHN , Jong-Won LIM , Hyung Sup YOON , Byoung-Gue MIN , Sang-Heung LEE , Hae Cheon KIM , Eun Soo NAM
IPC: H01L29/78
CPC classification number: H01L29/7831 , H01L29/2003 , H01L29/404 , H01L29/42316 , H01L29/66462 , H01L29/66863 , H01L29/7787 , H01L29/812
Abstract: Disclosed are a field-effect transistor and a manufacturing method thereof. The disclosed field-effect transistor includes: a semiconductor substrate; a source ohmic metal layer formed on one side of the semiconductor substrate; a drain ohmic metal layer formed on another side of the semiconductor substrate; a gate electrode formed between the source ohmic metal layer and the drain ohmic metal layer, on an upper portion of the semiconductor substrate; an insulating film formed on the semiconductor substrate's upper portion including the source ohmic metal layer, the drain ohmic metal layer and the gate electrode; and a plurality of field electrodes formed on an upper portion of the insulating film, wherein the insulating film below the respective field electrodes has different thicknesses.
Abstract translation: 公开了场效应晶体管及其制造方法。 所公开的场效应晶体管包括:半导体衬底; 源极欧姆金属层,形成在半导体衬底的一侧上; 形成在所述半导体衬底的另一侧上的漏极欧姆金属层; 在所述源极欧姆金属层和所述漏极欧姆金属层之间形成的栅电极,位于所述半导体衬底的上部; 形成在包括源极欧姆金属层,漏极欧姆金属层和栅电极的半导体衬底的上部上的绝缘膜; 以及形成在绝缘膜的上部的多个场电极,其中,各个场电极下方的绝缘膜具有不同的厚度。
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