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公开(公告)号:US20240290676A1
公开(公告)日:2024-08-29
申请号:US18174039
申请日:2023-02-24
发明人: Masamitsu Matsuura , Makoto Shibuya , Daiki Komatsu , Kengo Aoya
IPC分类号: H01L23/31 , H01L21/56 , H01L23/367 , H01L23/495 , H01L23/498 , H01L25/16
CPC分类号: H01L23/3135 , H01L21/56 , H01L23/367 , H01L23/49555 , H01L23/49562 , H01L23/49811 , H01L25/16 , H01L23/49589 , H01L23/49833 , H01L24/06 , H01L24/29 , H01L24/32 , H01L24/40 , H01L24/45 , H01L24/48 , H01L24/49 , H01L24/73 , H01L2224/05553 , H01L2224/05554 , H01L2224/0603 , H01L2224/06051 , H01L2224/2919 , H01L2224/32227 , H01L2224/32245 , H01L2224/40137 , H01L2224/40475 , H01L2224/45124 , H01L2224/45144 , H01L2224/45147 , H01L2224/45664 , H01L2224/48091 , H01L2224/48106 , H01L2224/48108 , H01L2224/48175 , H01L2224/48229 , H01L2224/49113 , H01L2224/49175 , H01L2224/73221 , H01L2224/73253 , H01L2224/73265 , H01L2924/0665 , H01L2924/10253 , H01L2924/10272 , H01L2924/1033 , H01L2924/13091
摘要: A microelectronic device includes one or more electronic components attached to a package substrate which has an exposed surface to provide an area for mounting a heatsink. The microelectronic device includes one or more leads that are electrically connected to the electronic component. The lead extends away from the exposed surface of the package substrate. The microelectronic device includes a shielding dielectric material that laterally surrounds the lead and extends over the lead between the lead and the exposed surface of the package substrate. An electronic system includes the microelectronic device and a circuit board electrically connected to the lead. The electronic system also includes a heatsink attached to the exposed surface of the package substrate.
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公开(公告)号:US11601065B1
公开(公告)日:2023-03-07
申请号:US17461423
申请日:2021-08-30
摘要: A power converter module includes power transistors and a substrate having a first surface and a second surface that opposes the first surface. A thermal pad is situated on the second surface of the substrate, and the thermal pad is configured to be thermally coupled to a heat sink. The power converter module also includes a control module mounted on a first surface of the substrate. The control module also includes control IC chips coupled to the power transistors. A first control IC chip controls a first switching level of the power converter module and a second control IC chip controls a second switching level of the power converter module. Shielding planes overlay the substrate. A first shielding plane is situated between the thermal pad and the first control IC chip and a second shielding plane is situated between the thermal pad and a second control IC chip.
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公开(公告)号:US11387179B2
公开(公告)日:2022-07-12
申请号:US16827455
申请日:2020-03-23
IPC分类号: H01L23/498 , H01L23/64 , H01L49/02 , H01L23/00 , H01L21/8234 , H01L21/48
摘要: An integrated circuit (IC) package includes a substrate having a first region and a second region. The substrate includes a conductive path between the first region and the second region. The IC package also includes a lead frame having a first member and a second member that are spaced apart. The IC package further includes a half-bridge power module. The half-bridge power module includes a capacitor having a first node coupled to the first member of the lead frame and a second node coupled to the second member of the lead frame. The half-bridge power module also includes a high side die having a high side field effect transistor (FET) embedded therein and a low side die having a low side FET embedded therein. A source of the high side FET is coupled to a drain of the low side FET through the conductive path of the substrate.
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公开(公告)号:US20200058570A1
公开(公告)日:2020-02-20
申请号:US16540943
申请日:2019-08-14
IPC分类号: H01L23/31 , H01L23/16 , H01L23/498 , H01L23/053 , H01L21/56 , H01L21/78 , H01L23/00
摘要: A semiconductor package includes a semiconductor die including an active side, a redistribution layer over the active side of the semiconductor die, the redistribution layer including metal traces electrically connecting die pads on the active side of the semiconductor die to electrical contacts on an external surface of the semiconductor package, and a layered mold covering the semiconductor die opposite the redistribution layer. The layered mold includes a first resin layer adjacent to the redistribution layer, a fiber layer adjacent to the first resin layer and opposite the redistribution layer, and a second resin layer adjacent to the fiber layer and opposite the redistribution layer. A coefficient of thermal expansion (CTE) of the first resin layer is substantially different than a CTE of the second resin layer.
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公开(公告)号:US20240178164A1
公开(公告)日:2024-05-30
申请号:US17994446
申请日:2022-11-28
发明人: Masamitsu Matsuura , Kengo Aoya , Daiki Komatsu , Ko Shibata
IPC分类号: H01L23/00 , H01L21/768 , H01L23/48
CPC分类号: H01L24/05 , H01L21/76898 , H01L23/481 , H01L24/02 , H01L24/04 , H01L24/13 , H01L24/94 , H01L27/144
摘要: An electronic device includes a semiconductor substrate having a first conductive routing structure on a first side of the semiconductor substrate, and a low aspect ratio via opening extending from the first side to an opposite second side. The electronic device includes a transparent cover over a portion of the first side and covering the patterned first conductive routing structure, as well as an insulator layer including a photo-imageable material on the second side and along a sidewall of the via opening, and a second conductive routing structure on an outer side of the insulator layer and extending through the via opening and directly contacting a portion of the first conductive routing structure.
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公开(公告)号:US20230137762A1
公开(公告)日:2023-05-04
申请号:US17515234
申请日:2021-10-29
IPC分类号: H01L23/31 , H01L23/495 , H01L23/00
摘要: A semiconductor package including a leadframe has a plurality of leads, and a semiconductor die including bond pads attached to the leadframe with the bond pads electrically coupled to the plurality of leads. The semiconductor die includes a substrate having a semiconductor surface including circuitry having nodes coupled to the bond pads. A mold compound encapsulates the semiconductor die. The mold compound is interdigitated having alternating extended mold regions over the plurality of leads and recessed mold regions in between adjacent ones of the plurality of leads.
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公开(公告)号:US11158595B2
公开(公告)日:2021-10-26
申请号:US16028741
申请日:2018-07-06
发明人: Woochan Kim , Masamitsu Matsuura , Mutsumi Masumoto , Kengo Aoya , Hau Thanh Nguyen , Vivek Kishorechand Arora , Anindya Poddar
IPC分类号: H01L23/48 , H01L23/00 , H01L25/065 , H01L23/532 , H01L21/56 , H01L23/31 , H01L25/00 , H01L23/29 , H01L23/528 , H01L23/522 , H01L23/538 , H01L23/433 , H01L23/367
摘要: An embedded die package includes a first die having an operating voltage between a first voltage potential and a second voltage potential that is less than the first voltage potential. A via, including a conductive material, is electrically connected to a bond pad on a surface of the first die, the via including at least one extension perpendicular to a plane along a length of the via. A redistribution layer (RDL) is electrically connected to the via, at an angle with respect to the via defining a space between the surface and a surface of the RDL. A build-up material is in the space.
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公开(公告)号:US20210134729A1
公开(公告)日:2021-05-06
申请号:US16669666
申请日:2019-10-31
发明人: Woochan Kim , Masamitsu Matasuura , Mutsumi Masumoto , Kengo Aoya , Hau Thanh Nguyen , Vivek Kishorechand Arora , Anindya Poddar , Hideaki Matsunaga
IPC分类号: H01L23/538 , H01L23/31 , H01L23/00 , H01L21/56 , H01L21/48
摘要: In one example, embedded die package, including a layer having an exposed boundary, wherein at least a portion of the exposed boundary comprises organic material. The package also includes at least one integrated circuit die positioned in the layer and within the exposed boundary. The package also includes a dielectric material positioned in the layer and between the at least one integrated circuit and structure adjacent the at least one integrated circuit.
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9.
公开(公告)号:US20150008566A1
公开(公告)日:2015-01-08
申请号:US14320803
申请日:2014-07-01
发明人: Mark A. Gerber , Mutsumi Masumoto , Kenji Masumoto , Anindya Poddar , Kengo Aoya , Masamitsu Matsuura , Takeshi Onogami
IPC分类号: H01L23/00 , H01L23/495
CPC分类号: H01L24/97 , H01L21/561 , H01L21/568 , H01L21/6835 , H01L23/3128 , H01L23/5389 , H01L23/544 , H01L24/19 , H01L24/96 , H01L2221/68327 , H01L2221/6834 , H01L2221/68372 , H01L2221/68381 , H01L2223/54426 , H01L2224/04105 , H01L2224/12105 , H01L2224/32225 , H01L2224/73267 , H01L2224/92244 , H01L2224/97 , H01L2924/12042 , H01L2924/18162 , H01L2924/3511 , H01L2224/83 , H01L2224/82 , H01L2924/00
摘要: A method for fabricating packaged semiconductor devices in panel format; placing a panel-sized metallic grid with openings on an adhesive tape (292); attaching semiconductor chips—coated with a polymer layer having windows for chip terminals —face-down onto the tape (293); laminating low CTE insulating material to fill gaps between chips and grid (294); turning over assembly to place carrier under backside of chips and lamination and to remove tape (295); plasma-cleaning assembly front side, sputtering uniform metal layer across assembly (296); optionally plating metal layer (297); and patterning sputtered layer to form rerouting traces and extended contact pads for assembly (298).
摘要翻译: 一种以面板格式制造封装半导体器件的方法; 将具有开口的面板尺寸的金属网格放置在胶带(292)上; 将具有用于芯片端子的具有窗口的聚合物层的半导体芯片附接到带(293)上; 层压低CTE绝缘材料以填充芯片和网格之间的间隙(294); 翻转组件以将载体放置在芯片的背面和层压之下并去除带(295); 等离子体清洁组件正面,横跨组装的溅射均匀金属层(296); 可选地镀金属层(297); 并且图案化溅射层以形成重新布线迹线和用于组装的扩展接触垫(298)。
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公开(公告)号:US11848244B2
公开(公告)日:2023-12-19
申请号:US17491394
申请日:2021-09-30
发明人: Makoto Shibuya , Masamitsu Matsuura , Kengo Aoya
IPC分类号: H01L23/31 , H01L23/528 , H01L23/00
CPC分类号: H01L23/3114 , H01L23/528 , H01L24/08 , H01L24/96 , H01L2224/08245 , H01L2224/08501
摘要: In examples, a wafer chip scale package (WCSP) comprises a semiconductor die including a device side having circuitry formed therein. The WCSP includes a redistribution layer (RDL) including an insulation layer abutting the device side and a metal trace coupled to the device side and abutting the insulation layer. The WCSP includes a conductive member coupled to the metal trace, the conductive member in a first vertical plane that is positioned no farther than a quarter of a horizontal width of the semiconductor die from a vertical axis extending through a center of the semiconductor die. The WCSP includes a lead coupled to the conductive member and extending horizontally past a second vertical plane defined by a perimeter of the semiconductor die.
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