-
公开(公告)号：US11047901B2
公开(公告)日：2021-06-29
申请号：US16437675
申请日：2019-06-11
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Mee-Hyun Lim , Sung-Yeol Kim , Seong-Keun Cho , Won-Don Joo , Jae-Hong Kim , Taek-Jin Kim , Kyung-Min Lee , Sang-Min Lee
IPC: G01R31/26 , G01N21/21 , G01R1/07 , G01R31/308
Abstract: In a method of testing an interconnection substrate, a blocking condition of a reference light reflected from a probe having an intrinsic optical characteristic may be set. An electric field emitted from a test interconnection substrate having a plurality of circuits may change the intrinsic optical characteristics of the probe into test optical characteristics. Light may be irradiated to the probe having the test optical characteristics. The reference light reflected from the probe having the test optical characteristic may be blocked in accordance with the blocking condition. The remaining reflected light that may be due to an abnormal circuit may be detected.
-
2.发明授权Method of aligning an exposure apparatus, method of exposing a photoresist film using the same and exposure apparatus for performing the method of exposing a photoresist film 有权曝光装置的对准方法，使用其的光致抗蚀剂膜的曝光方法以及用于进行曝光光刻胶膜的方法的曝光装置公开(公告)号：US09329504B2
公开(公告)日：2016-05-03
申请号：US13681068
申请日：2012-11-19
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Sang-Hyun Park , Sang-Don Jang , Dong-Seok Baek , Ki-Hyun Kim , Sang-Min Lee , Dong-Min Kim
CPC classification number: G03F9/7069 , G03B27/32 , G03B27/42 , G03F7/70258 , G03F7/70275 , G03F7/70791 , G03F9/7003 , G03F9/7011 , G03F9/7015 , G03F9/7019 , G03F9/7088
Abstract: An origin of a reference coordinate system is assigned to one of a plurality of center points, and center point coordinates according to the reference coordinate system are assigned to remaining center points, so that reference marks successively correspond to center points of a plurality of microscopes fixed to a base. Beam position detection marks disposed between the reference marks with exposure points of exposure heads fixed to the base are crossed to assign beam coordinates according to the reference coordinate system to the exposure points. Thus, alignment may be easily and accurately performed, and is effective for increasingly larger apparatuses.
Abstract translation: 参考坐标系的原点被分配给多个中心点之一，并且根据参考坐标系的中心点坐标被分配给剩余的中心点，使得参考标记连续对应于固定的多个显微镜的中心点 到一个基地 将布置在参考标记与固定到基座的曝光头的曝光点之间的光束位置检测标记交叉，以将根据参考坐标系的光束坐标分配给曝光点。 因此，可以容易且准确地进行对准，并且对于越来越大的装置是有效的。
-
3.发明授权公开(公告)号：US09271275B2
公开(公告)日：2016-02-23
申请号：US14244239
申请日：2014-04-03
Applicant: Samsung Electronics Co., Ltd.
Inventor： Sang-Min Lee , Eun-Yong Kim , Joon-Young Cho , Ju-Ho Lee , Tak-Ki Yu
CPC classification number: H04W72/0406 , H04L1/001 , H04L1/0038 , H04L1/1812 , H04L1/1816 , H04L1/1854 , H04L5/0037 , H04L5/0044 , H04L5/0053 , H04L27/2601
Abstract: An apparatus and method for resource allocation information transmission is provided. The method includes determining a search space for use in a second frequency band using resource allocation information of a first process detected in a first frequency band, detecting resource allocation information using the search space in the second frequency band, and when failing to decode received data according to the resource allocation information detected in the second frequency band, re-detecting resource allocation information of the first process in the second frequency band in a first time interval using the search space without detecting the resource allocation information of the first process in the first frequency band.
Abstract translation: 提供了一种用于资源分配信息传输的装置和方法。 该方法包括使用在第一频带中检测到的第一进程的资源分配信息来确定在第二频带中使用的搜索空间，使用第二频带中的搜索空间检测资源分配信息，以及当不能解码接收到的数据时 根据在第二频带中检测到的资源分配信息，使用搜索空间在第一时间间隔内重新检测第二频带中的第一处理的资源分配信息，而不检测第一处理中的第一处理的资源分配信息 频带。
-
公开(公告)号：US10816480B2
公开(公告)日：2020-10-27
申请号：US16364251
申请日：2019-03-26
Applicant: Samsung Electronics Co., Ltd.
Inventor： Eun-Hee Jeang , Aleksandr Shorokhov , Anton Medvedev , Maksim Riabko , Sang-Woo Bae , Akinori Okubo , Sang-Min Lee , Seong-Keun Cho , Won-Don Joo
Abstract: In a method of detecting a defect on a substrate, an incident beam may be radiated to a surface of the substrate to generate reflected light beams. A second harmonic generation (SHG) beam among the reflected light beams may be detected. The SHG beam may be generated by a defect on the substrate. A nano size defect may be detected by examining the SHG beam.
-
公开(公告)号：US10674112B2
公开(公告)日：2020-06-02
申请号：US16415100
申请日：2019-05-17
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Young-Bae Moon , Junho Park , Sang-Min Lee , Seongmin Cheon , Kyoung Hwan Kwon
IPC: G06F1/3234 , H04N7/01 , H04N7/56 , G06F3/047 , G06F3/041
Abstract: A display driver circuit includes a source driver configured to output display data to data lines, a controller configured to control the source driver, based on a synchronization signal, and a frequency adjusting circuit configured to extend a first time interval of the synchronization signal from a first length to a second length, such that time interval in which the display data is not output to the data lines is extended, when second image data are not received from an external device during a reference time interval after first image data are received from the external device, and shorten the first time interval, from the second length to a third length, when an instruction is received from the external device after the first time interval is extended to the second length.
-
Patent Agency Ranking
公开(公告)号：US09953598B2
公开(公告)日：2018-04-24
申请号：US14723636
申请日：2015-05-28
Applicant: Samsung Electronics Co., Ltd.
Inventor： Sang-Min Lee
CPC classification number: G09G3/3648 , G09G3/3611 , G09G5/003 , G09G2370/08
Abstract: Provided is a method of controlling a display driver IC. The method includes controlling an application processor to operate in a frequency range, which is changed from an operating frequency range of a preset specification and is a range in which data noise is decreased, through a plurality of frequency noise filtering operations.
-
7.发明授权Semiconductor device including first and second trenches having substantially equal depths 有权半导体器件包括具有基本上相同深度的第一和第二沟槽公开(公告)号：US09484458B2
公开(公告)日：2016-11-01
申请号：US14602716
申请日：2015-01-22
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Jin-Wook Lee , Myeong-Cheol Kim , Sang-Min Lee , Young-Ju Park , Hyung-Yong Kim , Myung-Hoon Jung
IPC: H01L29/78 , H01L21/265 , H01L21/306 , H01L21/3065 , H01L21/8234 , H01L21/8238 , H01L29/66 , H01L27/11
CPC classification number: H01L29/7848 , H01L21/26506 , H01L21/30608 , H01L21/3065 , H01L21/823412 , H01L21/823425 , H01L21/823807 , H01L21/823814 , H01L27/11 , H01L29/66636 , H01L29/78
Abstract: A fabricating method of a semiconductor device includes providing a substrate having a first region and a second region, forming a plurality of first gates in the first region of the substrate, such that the first gates are spaced apart from each other at a first pitch, forming a plurality of second gates in the second region of the substrate, such that the second gates are spaced apart from each other at a second pitch different from the first pitch, implanting an etch rate adjusting dopant into the second region to form implanted regions, while blocking the first region, forming a first trench by etching the first region between the plurality of first gates, and forming a second trench by etching the second region between the plurality of second gates.
Abstract translation: 半导体器件的制造方法包括提供具有第一区域和第二区域的衬底，在衬底的第一区域中形成多个第一栅极，使得第一栅极以第一间距相互间隔开， 在所述衬底的所述第二区域中形成多个第二栅极，使得所述第二栅极以不同于所述第一间距的第二间距彼此间隔开，将蚀刻速率调节掺杂剂注入所述第二区域以形成注入区域， 同时阻挡第一区域，通过蚀刻多个第一栅极之间的第一区域形成第一沟槽，并且通过蚀刻多个第二栅极之间的第二区域形成第二沟槽。
-
公开(公告)号：US11095838B2
公开(公告)日：2021-08-17
申请号：US15870314
申请日：2018-01-12
Applicant: Samsung Electronics Co., Ltd.
Inventor： Dong-Soo Kim , Hwa-Young Kang , Shuichi Shimokawa , Young-Kwon Yoon , Sang-Min Lee , Jong-Hun Won
Abstract: An electronic device includes an image capturing device and a processor electrically connected with the image capturing device, wherein the processor is configured to obtain a first portion of a video at a first capturing speed during a first period using the image capturing device, control a first notification to indicate obtaining a second portion of the video at a set second capturing speed when the second capturing speed is set as a speed of capturing the video based on a result of analyzing the first obtained portion, and obtain the second portion at the second capturing speed during a second period following the first period using the image capturing device.
-
公开(公告)号：US09320037B2
公开(公告)日：2016-04-19
申请号：US14087456
申请日：2013-11-22
Applicant: Samsung Electronics Co., Ltd.
Inventor： Sang-Min Lee , Young-Ho Jung , Myeon-Kyun Cho
CPC classification number: H04W72/0446 , H04W16/14 , H04W72/10 , H04W74/0866
Abstract: An apparatus and method for supporting Peer-to-Peer (P2P) communications in a broadband wireless communication system are provided. A frame used by the terminal in P2P communications includes a plurality of P2P contention channels overlapping with a region for cellular communications and at least one P2P dedicated channel allocated by a base station only for the P2P communications. The method includes establishing a P2P connection with a correspondent terminal through the at least one P2P dedicated channel, and exchanging P2P communication data with the correspondent terminal through at least one of the plurality of P2P contention channels.
-
10.发明授权公开(公告)号：US10670968B2
公开(公告)日：2020-06-02
申请号：US16109054
申请日：2018-08-22
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Sang-Min Lee , Sang-Hyun Park , Won-Don Joo
IPC: G03F7/20 , H01L21/027
Abstract: A maskless exposure method includes spatially modulating a light output from a light source into a pattern beam having a mask pattern, condensing the modulated pattern beam into a first group of spot beams having a first focal position on a Z-axis substantially perpendicular to an exposure surface of an object layer, and into a second group of spot beams having a second focal position different from the first focal position, and scanning the object layer with the first and second groups of spot beams. The object layer has a first height and a second height different from the first height.
-
-
-
-
-
-
-
-
-
Search Results
16
records
(took 0.016 seconds)
