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公开(公告)号:US12131103B2
公开(公告)日:2024-10-29
申请号:US17211011
申请日:2021-03-24
申请人: KLA Corporation
发明人: Anuj Pandey , Wing-Shan Ribi Leung
摘要: A device design file and material properties are inputted into a neural network module configured to operate a generative adversarial network. A process parameter is determined based on a device design file and material properties inputs using the generative adversarial network. This can be used to provide process parameters during semiconductor device design or manufacturing.
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公开(公告)号:US20240346216A1
公开(公告)日:2024-10-17
申请号:US18426033
申请日:2024-01-29
发明人: Baoxuan LI
IPC分类号: G06F30/30
CPC分类号: G06F30/30
摘要: The present application provides an auxiliary coloring method for an aperiodic pattern quad-color split, including: analyzing a split rule and a pattern design rule according to a lithography capability; finding a general solution of the split rule that satisfies the lithography capability, wherein the general solution covers a pattern distribution allowed by the pattern design rule; extracting a partial rule from the general solution, and pre-coloring patterns; and writing a script to split remaining uncolored patterns using software. According to the present application, by analyzing the rules, the amount of computer computation can be reduced greatly, thereby limiting the problem within the reach of the computer computation capability and obtaining a correct split solution within short running time.
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公开(公告)号:US20240330564A1
公开(公告)日:2024-10-03
申请号:US18741003
申请日:2024-06-12
发明人: Jung-Chan YANG , Hui-Zhong ZHUANG , Ting-Wei CHIANG , Chi-Yu LU
IPC分类号: G06F30/398 , G03F1/36 , G03F1/70 , G06F30/30 , G06F30/392 , G06F30/394 , G06F30/3953 , G06F119/18
CPC分类号: G06F30/398 , G03F1/36 , G03F1/70 , G06F30/30 , G06F30/392 , G06F30/394 , G06F30/3953 , G06F2119/18
摘要: A semiconductor device includes a plurality of active regions extending in a first direction. The semiconductor device further includes a gate electrode over the plurality of active regions, wherein the gate electrode extends in a second direction perpendicular to the first direction. The semiconductor device further includes a power rail extending in the first direction. The power rail includes a first power rail portion adjacent to the first boundary, wherein the first power rail portion has a first inner edge, and a second power rail portion adjacent to the second boundary, wherein the second power rail portion has a second inner edge, and the first inner edge is offset from the second inner edge in the second direction.
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公开(公告)号:US12095000B2
公开(公告)日:2024-09-17
申请号:US17035913
申请日:2020-09-29
发明人: Michael Shur , Grigory Simin , Alexander Dobrinsky
IPC分类号: H01L33/06 , G06F30/30 , H01L31/02 , H01L31/0224 , H01L31/0232 , H01L31/0304 , H01L31/0352 , H01L31/0392 , H01L31/18 , H01L33/00 , H01L33/08 , H01L33/12 , H01L33/30 , H01L33/32 , H01L33/40 , H01L33/42 , H01L33/46 , H01L33/64 , H01L33/38 , H01S5/30 , H01S5/343
CPC分类号: H01L33/06 , G06F30/30 , H01L31/02005 , H01L31/022466 , H01L31/02327 , H01L31/03048 , H01L31/035227 , H01L31/035236 , H01L31/0392 , H01L31/1848 , H01L31/1852 , H01L33/007 , H01L33/08 , H01L33/12 , H01L33/30 , H01L33/32 , H01L33/405 , H01L33/42 , H01L33/46 , H01L33/642 , H01L33/382 , H01L2933/0091 , H01S5/3054 , H01S5/3086 , H01S5/34333
摘要: An optoelectronic device configured for improved light extraction through a region of the device other than the substrate is described. A group III nitride semiconductor layer of a first polarity is located on the substrate and an active region can be located on the group III nitride semiconductor layer. A group III nitride semiconductor layer of a second polarity, different from the first polarity, can located adjacent to the active region. A first contact can directly contact the group III nitride semiconductor layer of the first polarity and a second contact can directly contact the group III nitride semiconductor layer of the second polarity. Each of the first and second contacts can include a plurality of openings extending entirely there through and the first and second contacts can form a photonic crystal structure. Some or all of the group III nitride semiconductor layers can be located in nanostructures.
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公开(公告)号:US12039232B2
公开(公告)日:2024-07-16
申请号:US17134030
申请日:2020-12-24
发明人: Chun-An Lin , Wen-Che Shen , Chih-Wei Yeh , Po-Huan Chou , Chun-Chieh Chang , Yu-Hsun Wu
CPC分类号: G06F30/20 , G01R19/0084 , G01R29/023 , G06F30/30 , H03M1/66
摘要: A hardware-in-the-loop (HIL) simulation device is provided, which includes a processing circuit and a pulse-width modulation (PWM) signal observation circuit. The PWM signal observation circuit includes an energy storage unit and the energy storage unit is coupled to the processing circuit. A signal source transmits a PWM signal to the processing circuit and the PWM signal observation circuit, and the energy storage unit is charged when the PWM signal is at high level. The processing circuit detects the voltage of the energy storage unit when detecting the falling edge of the PWM signal so as to calculate the duty cycle of the PWM signal.
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公开(公告)号:US12020978B2
公开(公告)日:2024-06-25
申请号:US17137500
申请日:2020-12-30
发明人: Sam Gnana Sabapathy
IPC分类号: G01R31/317 , G01R31/3187 , G06F30/30 , H01L21/70
CPC分类号: H01L21/70 , G01R31/31716 , G06F30/30 , G01R31/3187
摘要: A packaged integrated circuit (IC) chip that provides input/output (I/O) signal fail safe verification is disclosed. The packaged IC chip includes a first processing unit, a first control peripheral coupled to receive a first processed signal from the processing unit and to provide an output signal, and compare logic. The compare logic is coupled to receive the output signal and a comparison signal, to compare the output signal and the comparison signal, and to provide an error signal responsive to a difference between the output signal and the comparison signal.
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公开(公告)号:US12014131B2
公开(公告)日:2024-06-18
申请号:US18337245
申请日:2023-06-19
发明人: Sheng-Hsiung Chen , Wen-Hao Chen , Hung-Chih Ou , Chun-Yao Ku , Shao-Huan Wang
IPC分类号: G06F30/30 , G06F30/3315 , G06F30/337 , G06F30/396 , G06F30/398 , G06F30/392 , G06F115/06 , G06F119/06 , G06F119/12
CPC分类号: G06F30/398 , G06F30/3315 , G06F30/337 , G06F30/396 , G06F30/392 , G06F2115/06 , G06F2119/06 , G06F2119/12
摘要: A multi-bit flip-flop includes a first flip-flop, a second flip-flop and a first inverter. The first flip-flop has a first driving capability, and includes a first reset pin configured to receive a first reset signal. The second flip-flop has a second driving capability different from the first driving capability. The second flip-flop includes a second reset pin configured to receive the first reset signal, and the first reset pin and the second reset pin are coupled together. The first inverter is configured to receive a first clock signal on a first clock pin, and configured to generate a second clock signal inverted from the first clock signal. The first flip-flop and the second flip-flop are configured to share at least the first clock pin.
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公开(公告)号:US12001771B2
公开(公告)日:2024-06-04
申请号:US17412404
申请日:2021-08-26
发明人: Peter Foelsche
IPC分类号: G06F30/30 , G06F30/323 , G06F30/367
CPC分类号: G06F30/367 , G06F30/323
摘要: A computing system implementing a design verification system can detect multiple analog design blocks in a circuit design describing an electronic device. The design verification system can generate equivalent networks for the analog design blocks using different sets of the parameters of the analog design blocks by selectively collapsing nodes and branches in the analog design blocks based on values of the different sets of the parameters. The equivalent networks can correspond to behavioral topologies of the analog design blocks having the different sets of the parameters. The design verification system can selectively compile a subset of the analog design blocks into multiple compiled variant models based on a comparison of the equivalent networks. The design verification system can include an analog simulator to simulate the analog design blocks in the circuit design using the compiled variant models.
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公开(公告)号:US11977327B2
公开(公告)日:2024-05-07
申请号:US17749952
申请日:2022-05-20
申请人: Synopsys, Inc.
IPC分类号: G06F30/30 , G03F1/36 , G03F1/44 , G03F1/70 , G06F16/51 , G06F30/392 , G06F111/20
CPC分类号: G03F1/70 , G03F1/36 , G03F1/44 , G06F16/51 , G06F30/392 , G06F2111/20
摘要: A system generates a mask for a circuit design while enforcing symmetry and consistency across random areas of the mask. The system builds a mask solutions database mapping circuit patterns to mask patterns. The system uses the mask solutions database to replace circuit patterns of the circuit design with mask patterns. The system identifies properties in circuit patterns of the circuit design and enforces the same property in the corresponding mask patterns. Examples of properties enforced include symmetry within circuit patterns and similarity across circuit patterns. The system combines mask patterns in different regions of the circuit and resolves conflicts that occur when there are multiple masks within a region.
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公开(公告)号:US11966675B2
公开(公告)日:2024-04-23
申请号:US17529742
申请日:2021-11-18
申请人: The MathWorks, Inc.
发明人: Tao Cheng , Pieter J. Mosterman , Haihua Feng , Fu Zhang
CPC分类号: G06F30/30 , G06F11/076 , G06F11/079 , G06F11/0793 , G06F30/20
摘要: A model including a first co-simulation component and a second co-simulation component is analyzed. During execution of the model, the first co-simulation component outputs data to the second co-simulation component via a connection. The connection is declared as a continuous-time rate connection for input of the data into the second co-simulation component. Based on analyzing the model, the connection is identified as a discrete-continuous sample time connection based on data being communicated from the first co-simulation component to the second co-simulation component via the connection at a discrete-time rate when the model is executed in a co-simulation manner.
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