摘要:
A modified hybrid Hall effect device is provided which is the combination of a conventional Hall effect device and a second Hall effect device having a Hall plate coupled to a ferromagnetic layer. The hybrid Hall effect device can be used to determine the independent magnetic field vector components comprising a vector magnetic field, such as for determining the x and the z components of a magnetic field, or for measuring the total magnitude of a vector magnetic field of any orientation. The modified Hall Effect device can be adapted for use as a magnetic field sensor for the detection of macroscopic objects that have associated magnetic fields, or for microscopic objects that have been tagged by microscopic magnetic particles. In one specific form, a plurality of hybrid Hall devices are electrically connected together to form an array in which a plurality of rows of hybrid Hall devices are electrically coupled to each other along a current axis, and the array is used for the detection of microscopic objects.
摘要:
Magnetic resonance force microscopy (MRFM) is a technology capable of detecting the magnetic resonance of a small number of spins and, potentially, a single spin of an electron or nucleus. Most methods use soft cantilevers with microscopic dimensions (microns) which have been developed for atomic force microscopy. Cantilevers have been both a solution and problem of high sensitivity force detection. They are difficult to fabricate and it is difficult to achieve the right sensitivity and stiffness with them. The proposed invention eliminates the cantilever and replaces it with small, magnetically sensitive objects called birdies, which are manipulated above a sample using electromagnetic field control. The basic principles of the cantilever-free MRFM are the same as those of traditional, cantilever-based systems. Motion of the birdie induced by magnetic resonance is monitored using optical interferometry. The magnetic resonance force microscope should have application in both material and biological research at the nanoscale level.
摘要:
A nano-magnetic head for inputting and outputting magnetic signals with nano-region precision on a magnetic recording medium such as magnetic tapes, magnetic cards, magnetic disks, magnetic drums, etc. The nano-magnetic head uses a nanotube with its base end portion fastened to a holder that is at an end of an AFM cantilever. The tip end portion of the nanotube protrudes from the holder, and a nanocoil is wound around the outer circumference of the tip end portion of the nanotube so that signals are inputted and outputted at both ends of the nanocoil. By way of lining up ferromagnetic metal atoms in the hollow portion of the nanotube, it is possible to strengthen the magnetic signal. The nano-magnetic head is combinable with a signal controller, thus forming a nano-magnetic head device.
摘要:
An apparatus for measuring a characteristic of a specimen, includes a probe for scanning a surface of the specimen in a noncontacting state, a vibrating unit for vibrating the probe, an excitation field generating unit for generating an amplitude modulation signal which is amplitude-modulated with a modulation frequency and a carrier frequency and producing an excitation field at the surface of the specimen on the basis of the generated amplitude modulation signal, and a measuring unit for measuring a force interaction between the probe and the specimen caused by the excitation field generated at the surface of the specimen.
摘要:
A method for calibrating magnetic force microscopes (MFM) or scanning Hall probe microscopes (SHPM) is disclosed, wherein an instrument response function IRF is determined for correcting arbitrary raw MFM- or SHPM-images Si. According to one aspect of the invention a sample with an irregular magnetization pattern M over an extended area is provided, a raw MFM- or SHPM-image S is measured, an approximate sample magnetization pattern M0 and therefrom an approximate magnetic stray field distribution H0 are determined and an instrument response function IRF is calculated using the raw MFM- or SHPM-image S and the approximate magnetic stray field distribution H0. Other aspects of the calibration method consist in that the instrument response function IRF is calculated in Fourier space as IRF(k)=S(k)H0(k) and/or that averages or iterative calculations of instrument response functions IRFj (j=1 . . . m) are performed. Preferably a tip calibration function qtip (k), characterizing the magnetic stray field distribution of the tip of a magnetic force microscope (MFM), is derived from the IRF by eliminating cantilever effects caused by tilt and mechanical properties of the cantilever.
摘要:
An apparatus for measuring a characteristic of a specimen, includes a probe for scanning a surface of the specimen in a noncontacting state, a vibrating unit for vibrating the probe, an excitation field generating unit for generating an amplitude modulation signal which is amplitude-modulated with a modulation frequency and a carrier frequency and producing an excitation field at the surface of the specimen on the basis of the generated amplitude modulation signal, and a measuring unit for measuring a force interaction between the probe and the specimen caused by the excitation field generated at the surface of the specimen.
摘要:
A method for controlling a force acting on a scanning probe of a cantilever by setting bandwidth of a feedback loop constituted by detecting minute displacement of the cantilever and controlling a force of the scanning probe to be greater than a primary resonant frequency of the cantilever.
摘要:
A method and apparatus of magnetic force control for a scanning probe, wherein a first magnetic source having a magnetic moment is provided on the scanning probe and a second magnetic source is disposed external to the scanning probe to apply a magnetic field in a direction other than parallel, and preferably perpendicular, to the orientation of the magnetic moment, from the second magnetic source to the first magnetic source to produce a torque related to the amplitude of the applied magnetic field acting on the probe. By controlling the amplitude of the applied magnetic field, the deflection of the scanning probe is maintained constant during scanning by the scanning probe. An output signal related to the amplitude of the magnetic field applied by the second magnetic source is produced and is indicative of a surface force applied to the probe. The invention can also be used to apply large forces during scanning for applications such as nanolithography or elasticity mapping.
摘要:
A thin film of a magnetic material is applied to one or both surfaces of a force sensing cantilever for use in a scanning force microscope. The cantilevers are then placed between the poles of an electromagnet and a magnetizing field applied in the direction of the soft axis of the cantilevers. The field is chosen so as to be bigger than the saturation field for the magnetic film.
摘要:
In a scanning force microscope a thin film of a magnetic material is applied to one or both surfaces of a force sensing cantilever. The cantilevers are then placed between the poles of an electromagnet and a magnetizing field applied in the direction of the soft axis of the cantilevers. The field is chosen so as to be bigger than the saturation field for the magnetic film. A small electromagnet is placed in the housing of the microscope so as to generate a field normal to the soft axis of the cantilever. The field is generated by an ac voltage and causes a time varying force to be applied to the cantilever. The corresponding modulation of the cantilever position is sensed by reflection of a laser beam into a position sensitive detector. The magnitude and phase of this signal are determined by a synchronous detector. Images of the sample surface are made at constant force gradient by scanning the cantilever over the surface while adjusting the gap between the probe and sample so as to maintain a constant output from the synchronous detector.