公开(公告)号：US20040245985A1

公开(公告)日：2004-12-09

申请号：US10453319

申请日：2003-06-03

Inventor： Glenn Mayfield ,  Chuanyang Wang ,  Indumini Ranmuthu ,  Bryan E. Bloodworth ,  James Nodar

IPC: G01R033/12 ,  G01R033/02

CPC classification number: G01R33/09

Abstract: An apparatus for monitoring changes in a magnetic field using a magneto-resistive device situated in the field includes a first and second input locus coupled with the magneto-resistive device. An amplifier means for amplifying electrical signals has input terminals and output terminals. A first input terminal is coupled with the first input locus with a first capacitor coupled in series between the first input locus and the first input terminal. A second input terminal is coupled with the second input locus with a second capacitor coupled in series between the second input locus and the second input terminal. The apparatus receives a bias current at the first input locus that cooperates with the magneto-resistive element to affect electrical potential at the first input locus. The amplifier device presents at least one output signal at the output terminals indicating changes in the magnetic field.

Abstract translation: 使用位于场中的磁阻装置来监测磁场变化的装置包括与磁阻装置耦合的第一和第二输入轨迹。 用于放大电信号的放大器装置具有输入端和输出端。 第一输入端与第一输入轨迹耦合，其中第一电容器串联耦合在第一输入轨迹和第一输入端之间。 第二输入端子与第二输入轨迹耦合，第二输入端与第二输入轨迹和第二输入端串联耦合。 该装置在第一输入轨迹处接收与磁阻元件配合的偏置电流，以影响第一输入轨迹处的电位。 放大器装置在输出端呈现至少一个指示磁场变化的输出信号。

公开(公告)号：US20040104721A1

公开(公告)日：2004-06-03

申请号：US10676935

申请日：2003-10-01

Applicant: FUJITSU LIMITED

Inventor： Taketoshi Aratani ,  Tetsuya Mukunoki ,  Kazuteru Hashizume ,  Takao Sugawara ,  Kiyoharu Yagyu

IPC: G01R033/12 ,  G01N027/82 ,  G01R033/10

CPC classification number: G11B5/455 ,  G11B5/09 ,  G11B2005/0013 ,  G11B2005/0016

Abstract: A magnetic head testing apparatus includes reference information storing means for holding a predetermined reference sampling period and a number of reference samplings, sampling means for sampling reproduced data read a plurality of times from a magnetic medium in the reference sampling period, sampling number acquiring means for acquiring a sampling number of measured data from a reproduced data base on a sampling result, sampling number radio calculating means for calculating a ratio of the sampling number of the measured data and the number of reference samplings, sampling data re-acquiring means for changing the sampling period of the measured data depending on the calculated ratio and re-acquiring the sampling data and a measured data overlap-displaying means for overlap-display of the sampling data re-acquired from the measured data a plurality of times.

Abstract translation: 一种磁头测试装置，包括用于保持预定参考采样周期和多个参考采样的参考信息存储装置，用于在参考采样周期中从磁介质读取多次的再现数据采样的采样装置，用于 从取样结果的再现数据库获取测量数据的采样数，采样数无线电计算装置，用于计算测量数据的采样数与参考采样数之比，采样数据重新获取装置，用于改变 取决于所计算的比率的测量数据的采样周期，并重新获取采样数据;以及测量数据重叠显示装置，用于多次重复显示从测量数据重新获取的采样数据。

公开(公告)号：US20040036471A1

公开(公告)日：2004-02-26

申请号：US10226464

申请日：2002-08-22

Applicant: INTERNATIONAL BUSINESS MACHINES

Inventor： Kenneth Donald Mackay ,  Antonio Perez JR.

IPC: G01R033/12 ,  G11B005/127

CPC classification number: B82Y25/00 ,  B82Y10/00 ,  G11B5/00 ,  G11B5/012 ,  G11B5/127 ,  G11B5/3967 ,  G11B5/455 ,  G11B2005/0016 ,  G11B2005/3996

Abstract: A structure is integrated into the design and manufacture of a magnetic head that allows self-generation of magnetic fields. The structure includes a conductor or conductors placed in close proximity to the read portion of a magnetic head and connected to an externally accessible connection. A high frequency signal is passed through the conductor to generate a magnetic field through the read device and simulate, for example, the head crossing magnetic domains on a magnetic memory disk.

Abstract translation: 一种结构集成到磁头的设计和制造中，允许磁场自发生成。 该结构包括放置在磁头的读取部分附近并连接到外部可访问的连接的导体或导体。 高频信号通过导体，以通过读取装置产生磁场，并且模拟例如磁存储盘上磁头交叉的磁头。

公开(公告)号：US20030182788A1

公开(公告)日：2003-10-02

申请号：US10309405

申请日：2002-11-26

Applicant: Seagate Technology LLC

Inventor： Serge J. Fayeulle ,  Paul W. Smith ,  Gary E. Bement

IPC: G11B005/187 ,  G01R001/00 ,  G01R033/12

CPC classification number: G11B5/455 ,  G11B5/012 ,  G11B2005/001 ,  Y10T29/49004 ,  Y10T29/4902 ,  Y10T29/49021 ,  Y10T29/49025 ,  Y10T29/49036 ,  Y10T29/5313 ,  Y10T29/53165

Abstract: A device and method for testing a slider of a head-gimbal assembly during disc drive manufacturing. The device includes a test disc, an actuator arm and a control module. The test disc has a first circumferential area for detecting contact between the slider and the test disc and a second circumferential area for burnishing sliders that contact the first circumferential area as the test disc rotates at or above the predetermined velocity. The head-gimbal assembly is affixed to a support, or flexure, on the actuator arm such that the slider is operable to move between an inner diameter and an outer diameter of the test disc. The control module controls rotation of the test disc and movement of the actuator arm, and thus the slider, relative to the test disc. The control module monitors the slider-disc interface for contact therebetween. If contact is detected, the slider is either burnished or the head-gimbal assembly is discarded altogether.

Abstract translation: 一种用于在磁盘驱动器制造期间测试磁头万向节组件的滑块的装置和方法。 该装置包括测试盘，致动器臂和控制模块。 测试盘具有用于检测滑块和测试盘之间的接触的第一周向区域和用于当测试盘以预定速度等于或大于其旋转时与第一周向区域接触的抛光滑块的第二周向区域。 头部万向节组件固定在致动器臂上的支撑件或挠曲件上，使得滑块可操作以在测试盘的内径和外径之间移动。 控制模块控制测试盘的旋转和致动器臂的移动，并因此控制滑块相对于测试盘的移动。 控制模块监视滑块 - 光盘接口以在它们之间接触。 如果检测到接触，则滑块被抛光或者将头部万向节组件完全丢弃。

公开(公告)号：US20030141866A1

公开(公告)日：2003-07-31

申请号：US10060440

申请日：2002-01-30

Inventor： Richard R. Johnson ,  Stephen M. Graff

IPC: G01B007/14 ,  G01R033/12

CPC classification number: G01B7/10

Abstract: A sensor device includes the ability to determine part presence and at least one physical characteristic of the part. A drive coil and sense coil are arranged so that a voltage applied across the drive coil causes a response in the sense coil, which is influenced by the presence of the item of interest. In a first mode, a controller determines whether the item is present by determining an amount of coupling between the drive coil and the sense coil, which is indicative of whether a part is present near the sense coil. In a second mode, the controller determines an amount of magnetic flux that is indicative of a thickness of the material. In another mode, constant current applied to the drive coil instigates a voltage across both coils. The amplitude of the sense coil voltage and a phase shift of the sense coil voltage relative to the drive coil voltage provides material thickness information.

Abstract translation: 传感器装置包括确定部件存在和部件的至少一个物理特性的能力。 驱动线圈和感测线圈布置成使得施加在驱动线圈两端的电压在感测线圈中产生响应，该响应受到感兴趣项目的存在的影响。 在第一模式中，控制器通过确定驱动线圈和感测线圈之间的耦合量来确定物品是否存在，其指示部件是否存在于感测线圈附近。 在第二模式中，控制器确定指示材料厚度的磁通量。 在另一种模式中，施加到驱动线圈的恒定电流在两个线圈上产生电压。 感测线圈电压的振幅和感测线圈电压相对于驱动线圈电压的相移提供材料厚度信息。

公开(公告)号：US20030132747A1

公开(公告)日：2003-07-17

申请号：US10051987

申请日：2002-01-16

Inventor： Sooyoul Hong ,  Hyung Jai Lee

IPC: G01R033/12

CPC classification number: G11B27/36 ,  G11B5/012 ,  G11B2005/001 ,  G11B2005/0021 ,  G11B2220/20

Abstract: A test stand and method for testing a disk of a hard disk drive. The disk is placed onto a spindle motor of the test stand. The test stand also contains a head that is connected to a controller. The controller causes the head to write a reference signal and a test signal onto the disk. The amplitude of the reference signal is then reduced, typically with a DC erase current. The head reads back the test signal from areas of the disk that are heated by a heating element. The reference signal is also read back and used to normalize the test signal. Using a reference signal with a reduced amplitude has been found to produce less scattered data than methods of the prior art.

Abstract translation: 用于测试硬盘驱动器磁盘的测试台和方法。 将盘放置在测试台的主轴电机上。 测试台还包含连接到控制器的头部。 控制器使头部将参考信号和测试信号写入磁盘。 然后，参考信号的幅度通常用直流擦除电流减小。 磁头读取由加热元件加热的磁盘区域的测试信号。 参考信号也被读回并用于标准化测试信号。 已经发现使用具有减小的幅度的参考信号产生比现有技术的方法更少的分散数据。

公开(公告)号：US20030085701A1

公开(公告)日：2003-05-08

申请号：US10053016

申请日：2001-11-02

Inventor： Bradley Frederick Baumgartner ,  Shanlin Duan ,  Yan Liu ,  Bob C. Robinson ,  Li Tang ,  Ka Chi Wong

IPC: G01R033/12

CPC classification number: G11B20/1883 ,  G01R33/1207 ,  G11B5/012 ,  G11B5/82 ,  G11B19/04 ,  G11B20/1816 ,  G11B27/36 ,  G11B33/10 ,  G11B2005/001 ,  G11B2220/20 ,  Y10T29/47

Abstract: An apparatus and method for detecting and marking delamination defects on thin film disks are disclosed. The apparatus includes a read/write (R/W) head and a burnishing head mounted on separate arms that access the disk while spinning on the test stand. The controller uses the R/W head to perform an initial magnetic test of selected areas on the disk to establish an initial defect map. The burnish head is then flown over the surface for an extended time to accelerate and open up the latent delamination defects by impacting protruding material. The R/W head is then used to perform a second magnetic test which is compared against the first test to identify the delamination defects which have been developed by the burnishing. The delamination defects are then marked with a magnetic pattern which aids in optically locating the defect during subsequent failure analysis.

Abstract translation: 公开了一种用于检测和标记薄膜盘上的分层缺陷的装置和方法。 该装置包括读/写（R / W）头和安装在分开的臂上的抛光头，当在测试台上旋转时，其读取磁盘。 控制器使用R / W头对磁盘上所选区域进行初始磁性测试，以建立初始缺陷图。 然后将抛光头在表面上飞过较长时间，以加速并通过冲击突出的材料来打开潜在的脱层缺陷。 然后使用R / W头执行第二磁性测试，其与第一次测试进行比较，以识别由抛光开发的分层缺陷。 然后用磁性图案标记分层缺陷，这有助于在随后的故障分析期间光学地定位缺陷。

公开(公告)号：US20030020467A1

公开(公告)日：2003-01-30

申请号：US10195106

申请日：2002-07-15

Applicant: TDK CORPORATION

Inventor： Noriaki Kasahara ,  Nozomu Hachisuka ,  Yasutoshi Fujita

IPC: G01B007/14 ,  G01R033/12

CPC classification number: B82Y25/00 ,  G01R33/093 ,  G11B5/3116 ,  G11B5/3166 ,  G11B5/3903 ,  Y10T29/49041 ,  Y10T29/53165

Abstract: Disclosed is a lapping monitor element that is juxtaposed with a magnetic transducer element having a magnetoresistance effect film to determine the lapping position upon lapping the element height of the magnetic transducer element to a predetermined dimension, the lapping monitor element comprising a resistance film to be resistance measured, the resistance film being a metal film of nonmagnetic transition metal or of alloy composed mainly of nonmagnetic transition metal, or a multilayered film where two or more such metal films are laid one upon another, thereby making it possible to extremely stabilize the ELG sensor resistance measured values upon lapping as well as to provide a high accuracy MR height control.

Abstract translation: 公开了一种研磨监测元件，其与具有磁阻效应膜的磁换能器元件并置，以在将磁换能器元件的元件高度研磨到预定尺寸时确定研磨位置，研磨监测元件包括电阻膜 电阻膜是由非磁性过渡金属或非磁性过渡金属组成的非磁性过渡金属或合金的金属膜，或其中两个或更多个这样的金属膜彼此层叠的多层膜，从而使得ELG传感器 研磨时的电阻测量值以及提供高精度MR高度控制。

公开(公告)号：US20020175679A1

公开(公告)日：2002-11-28

申请号：US09996083

申请日：2001-11-28

Inventor： Hoon Kim ,  Yasushi Nagamune ,  Geun-Taek Lee ,  Suk-Hwan Chung

IPC: G01N027/72 ,  G01R033/12

CPC classification number: G01R33/1253

Abstract: Disclosed are apparatus and method for measuring Hall effect related-values in a semiconductor, such as a mobility, a carrier concentration and a resistivity using a Hall effect. A sample is loaded into an IC socket or a similar target, which is fixed on the inside of a heat insulating material container capable of containing injected liquid nitrogen. The Hall effect related-values are measured using a moving member for moving a pair of permanent magnets to an outside of the heat insulating material container. The measuring equipment has a simple structure, and a measuring operation is simple. A level of an input voltage of a sample is measured depending on a constant current that is supplied by a constant current supplying unit contained in a Hall voltage measurement unit. A measurement error detection unit detects and displays a measurement error of the sample using the level of the measured input voltage. Since the measurement error is detected before measuring the Hall effect, the measurement error can be excluded.

Abstract translation: 公开了使用霍尔效应来测量半导体中的霍尔效应相关值的装置和方法，例如迁移率，载流子浓度和电阻率。 将样品加载到IC插座或类似的目标物中，固定在能够容纳注入的液氮的绝热材料容器的内部。 使用用于将一对永磁体移动到绝热材料容器的外部的移动构件来测量霍尔效应相关值。 测量设备结构简单，测量操作简单。 取决于由包含在霍尔电压测量单元中的恒定电流供给单元提供的恒定电流来测量样本的输入电压的电平。 测量误差检测单元使用测量的输入电压的电平检测并显示样品的测量误差。 由于在测量霍尔效应之前检测到测量误差，因此可以排除测量误差。

公开(公告)号：US20020163330A1

公开(公告)日：2002-11-07

申请号：US10084918

申请日：2002-03-01

Applicant: Honda Giken Kogyo Kabushiki Kaisha

Inventor： Shigenobu Sekiya

IPC: G01N027/72 ,  G01R033/12

CPC classification number: G01R33/028

Abstract: A magnetic flux detector comprises a core member 12 and an armature member 11, and the core member 12 generates a magnetic flux by an exciting coil 13 when the exciting coil receives an excitation current controlled by an excitation current controller 30. The magnetic flux detector further comprises a search coil 14, which is provided in a magnetic path for the magnetic flux, and a magnetic flux calculator 40, which determines the magnitude of the magnetic flux by measuring an electromotive force induced in the search coil 14 by a change in the magnetic flux. The excitation current controller 30 controls the excitation current to increase from zero to a predetermined current value during a first predetermined time period T1 and then to decrease from the predetermined current value to zero during a second predetermined time period T2, and the magnetic flux calculator 40 determines the magnitude of the magnetic flux based on the difference between the increasing electromotive force integral value which is calculated by integrating the electromotive force induced in said search coil 14 during the first predetermined time period T1 and the decreasing electromotive force integral value which is calculated by integrating the electromotive force induced in the search coil 14 during the second predetermined time period T2.

Abstract translation: 磁通检测器包括铁芯构件12和电枢构件11，并且当励磁线圈接收到由励磁电流控制器30控制的励磁电流时，铁芯构件12通过励磁线圈13产生磁通。磁通检测器进一步 包括设置在用于磁通的磁路中的搜索线圈14和磁通量计算器40，该磁通量计算器40通过测量由磁场中的变化在搜索线圈14中感应的电动势来确定磁通量的大小 助焊剂 激励电流控制器30在第一预定时间段T1期间控制励磁电流从零增加到预定电流值，然后在第二预定时间段T2期间从预定电流值减小到零，并且磁通量计算器40 基于通过积分在第一预定时间段T1期间在所述搜索线圈14中感应的电动势计算出的增加电动势积分值与由下式计算的减小电动势积分值之间的差来确定磁通量的大小，该减小电动势积分值由 在第二预定时间段T2期间积分在搜索线圈14中感应的电动势。