Invention Application
- Patent Title: Magnetic head testing apparatus
- Patent Title (中): 磁头测试仪
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Application No.: US10676935Application Date: 2003-10-01
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Publication No.: US20040104721A1Publication Date: 2004-06-03
- Inventor: Taketoshi Aratani , Tetsuya Mukunoki , Kazuteru Hashizume , Takao Sugawara , Kiyoharu Yagyu
- Applicant: FUJITSU LIMITED
- Applicant Address: null
- Assignee: FUJITSU LIMITED
- Current Assignee: FUJITSU LIMITED
- Current Assignee Address: null
- Main IPC: G01R033/12
- IPC: G01R033/12 ; G01N027/82 ; G01R033/10

Abstract:
A magnetic head testing apparatus includes reference information storing means for holding a predetermined reference sampling period and a number of reference samplings, sampling means for sampling reproduced data read a plurality of times from a magnetic medium in the reference sampling period, sampling number acquiring means for acquiring a sampling number of measured data from a reproduced data base on a sampling result, sampling number radio calculating means for calculating a ratio of the sampling number of the measured data and the number of reference samplings, sampling data re-acquiring means for changing the sampling period of the measured data depending on the calculated ratio and re-acquiring the sampling data and a measured data overlap-displaying means for overlap-display of the sampling data re-acquired from the measured data a plurality of times.
Public/Granted literature
- US07085666B2 Magnetic head testing apparatus Public/Granted day:2006-08-01
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