-
公开(公告)号：US5925818A
公开(公告)日：1999-07-20
申请号：US886590
申请日：1997-07-01
申请人： Jason Cleveland , Paul Hansma , William Ducker
发明人： Jason Cleveland , Paul Hansma , William Ducker
CPC分类号： G01Q10/06 , B82Y35/00 , G01Q20/00 , Y10S977/865 , Y10S977/872 , Y10S977/873
摘要： A method and apparatus of magnetic force control for a scanning probe, wherein a first magnetic source having a magnetic moment is provided on the scanning probe and a second magnetic source is disposed external to the scanning probe to apply a magnetic field in a direction other than parallel, and preferably perpendicular, to the orientation of the magnetic moment, from the second magnetic source to the first magnetic source to produce a torque related to the amplitude of the applied magnetic field acting on the probe. By controlling the amplitude of the applied magnetic field, the deflection of the scanning probe is maintained constant during scanning by the scanning probe. An output signal related to the amplitude of the magnetic field applied by the second magnetic source is produced and is indicative of a surface force applied to the probe. The invention can also be used to apply large forces during scanning for applications such as nanolithography or elasticity mapping.
摘要翻译： 一种用于扫描探针的磁力控制的方法和装置，其中在扫描探针上设有具有磁矩的第一磁源，并且第二磁源设置在扫描探针外部，以沿除了 平行且优选地垂直于从第二磁源到第一磁源的磁矩的取向，以产生与作用在探针上的施加的磁场的振幅相关的转矩。 通过控制所施加的磁场的幅度，扫描探针的扫描期间扫描探针的偏转保持恒定。 产生与由第二磁源施加的磁场的振幅相关的输出信号，并且指示施加到探针的表面力。 本发明还可用于在扫描期间施加大的力以用于诸如纳米光刻或弹性映射之类的应用。
-
公开(公告)号：US5670712A
公开(公告)日：1997-09-23
申请号：US290091
申请日：1994-08-15
申请人： Jason Cleveland , Paul Hansma , William Ducker
发明人： Jason Cleveland , Paul Hansma , William Ducker
CPC分类号： G01Q10/06 , B82Y35/00 , G01Q20/00 , Y10S977/865 , Y10S977/872 , Y10S977/873
摘要： A method and apparatus of magnetic force control for a scanning probe, wherein a first magnetic source having a magnetic moment is provided on the scanning probe and a second magnetic source is disposed external to the scanning probe to apply a magnetic field in a direction other than parallel, and preferably perpendicular, to the orientation of the magnetic moment, from the second magnetic source to the first magnetic source to produce a torque related to the amplitude of the applied magnetic field acting on the probe. By controlling the amplitude of the applied magnetic field, the deflection of the scanning probe is maintained constant during scanning by the scanning probe. An output signal related to the amplitude of the magnetic field applied by the second magnetic source is produced and is indicative of a surface force applied to the probe. The invention can also be used to apply large forces during scanning for applications such as nanolithography or elasticity mapping.
摘要翻译： 一种用于扫描探针的磁力控制的方法和装置，其中在扫描探针上设有具有磁矩的第一磁源，并且第二磁源设置在扫描探针外部，以沿除了 平行且优选地垂直于从第二磁源到第一磁源的磁矩的取向，以产生与作用在探针上的施加的磁场的振幅相关的转矩。 通过控制所施加的磁场的幅度，扫描探针的扫描期间扫描探针的偏转保持恒定。 产生与由第二磁源施加的磁场的振幅相关的输出信号，并且指示施加到探针的表面力。 本发明还可用于在扫描期间施加大的力以用于诸如纳米光刻或弹性映射的应用。
-
公开(公告)号：US20080078240A1
公开(公告)日：2008-04-03
申请号：US11899309
申请日：2007-09-05
申请人： Paul Hansma , Georg Fantner , Johannes Kindt
发明人： Paul Hansma , Georg Fantner , Johannes Kindt
IPC分类号： G01B5/28
CPC分类号： G01Q10/04
摘要： A scanner for probe microscopy that avoids low resonance frequencies and accounts better for piezo nonlinearities. The x, y and z axes of a linear stack scanner are partially decoupled from each other while maintaining all mechanical joints stiff in the direction of actuation. The scanning probe microscope comprises a probe, a housing, at least two actuators, each coupled to the housing, and a support coupled to the housing and to at least a first of the actuators at a position spaced from the point at which the actuator is coupled to the housing. The support constrains the motion of the first actuator along a first axis while permitting translation along a second axis. The actuators are preferably orthogonally arranged linear stacks of flat piezos, preferably in push-pull configuration. The support can take different forms in different embodiments of the invention. In a particular embodiment, the scanner is a 2D scanner having a support frame with x and y axes, and a member for supporting an object to be moved such as a sample for a probe, the scanner comprising a flexure and flexure coupled cross-conformed piezos arranged along x and y axes. Expansion of the piezos is measured by at least two strain gauges disposed to measure the differential motion of at least two opposed actuators. The strain gauges are preferably arranged to compensate for ambient temperature changes, and preferably two or more strain gauges of identical type are disposed on each actuator to magnify the strain signal.
摘要翻译： 用于探针显微镜的扫描仪，可避免低共振频率，更好地考虑压电非线性。 线性堆栈扫描器的x，y和z轴在保持所有机械接头在致动方向上僵硬的同时部分地相互分离。 扫描探针显微镜包括探针，壳体，每个联接到壳体的至少两个致动器，以及支撑件，其联接到壳体以及至少一个致动器的至少第一致动器，该致动器与致动器的位置间隔开 加上住房。 支撑件沿着第一轴线限制第一致动器的运动，同时允许沿着第二轴线的平移。 致动器优选地是平面压电体的正交布置的线性叠层，优选地在推挽构型中。 在本发明的不同实施例中，支撑件可以采取不同的形式。 在特定实施例中，扫描器是具有带x和y轴的支撑框架的2D扫描仪，以及用于支撑待移动物体的构件，例如用于探针的样品，扫描器包括弯曲和弯曲耦合的交叉 沿x轴和y轴排列的压电体。 通过至少两个应变仪来测量压电体的扩张，这些应变仪设置用于测量至少两个相对的致动器的差动运动。 应变计优选地布置成补偿环境温度变化，并且优选地，两个或更多个相同类型的应变计布置在每个致动器上以放大应变信号。
-
4.发明申请公开(公告)号：US20130122466A1
公开(公告)日：2013-05-16
申请号：US13261567
申请日：2011-07-12
申请人： Randall Connor , Daniel Bridges , Paul Hansma
发明人： Randall Connor , Daniel Bridges , Paul Hansma
IPC分类号： A61B5/00
CPC分类号： A61B5/4504 , A61B5/0053 , A61C19/04 , G01N3/42
摘要： The device performs reference point indentation without a reference probe. The indentation distance is measured relative to the instrument which remains substantially stationary during the impact process, which occurs on the order of one millisecond. In one embodiment, an impact motion with a peak force of order 28N creates an indentation in bone with a depth of approximately 150 μm during which the instrument case moves less than 1 μm. Thus the error in measuring indentation depth due to the motion of the case is less than 1%, making a reference probe unnecessary. Further, this “error” is consistent and can be corrected. In one embodiment, the device measures the fracture resistance of hard tissues by actually creating microscopic fractures in the hard tissues in a measured way. It creates these microscopic fractures by impacting the sample with a sharpened probe. The indentation distance in the sample is correlated with fracture resistance.
摘要翻译： 该设备执行参考点缩进，无参考探针。 相对于在冲击过程中保持基本上静止的仪器测量压痕距离，其发生在一毫秒量级。 在一个实施例中，具有28N的峰值力的冲击运动在具有大约150μm的深度的骨中产生凹陷，在该深度期间仪器壳体移动小于1um。 因此，由于壳体的运动导致测量压痕深度的误差小于1％，使得不需要参考探头。 此外，这个“错误”是一致的，可以被纠正。 在一个实施例中，该装置通过以测量的方式实际地在硬组织中产生微观骨折来测量硬组织的抗断裂性。 它通过用尖锐的探针冲击样品来产生这些微观裂缝。 样品中的压痕距离与抗断裂性相关。
-
公开(公告)号：US20110303022A1
公开(公告)日：2011-12-15
申请号：US13161337
申请日：2011-06-15
申请人： Paul Hansma , Barney Drake , Douglas Rehn , Jonathan Adams , Jason Lulejian
发明人： Paul Hansma , Barney Drake , Douglas Rehn , Jonathan Adams , Jason Lulejian
IPC分类号： G01L5/00
CPC分类号： A61B5/441 , A61B5/0002 , A61B5/0053 , A61B5/4504 , G01N3/42
摘要： Methods and instruments for characterizing a material, such as the properties of bone in a living human subject, using a test probe constructed for insertion into the material and a reference probe aligned with the test probe in a housing. The housing is hand held or placed so that the reference probe contacts the surface of the material under pressure applied either by hand or by the weight of the housing. The test probe is inserted into the material to indent the material while maintaining the reference probe substantially under the hand pressure or weight of the housing allowing evaluation of a property of the material related to indentation of the material by the probe. Force can be generated by a voice coil in a magnet structure to the end of which the test probe is connected and supported in the magnet structure by a flexure, opposing flexures, a linear translation stage, or a linear bearing. Optionally, a measurement unit containing the test probe and reference probe is connected to a base unit with a wireless connection, allowing in the field material testing.
摘要翻译： 用于表征材料的方法和仪器，例如使用构建用于插入材料中的测试探针，以及在壳体中与测试探针对准的参考探针，例如活的人类受试者中的骨骼的性质。 手持或放置外壳，使得参考探头在由手或由外壳的重量施加的压力下接触材料的表面。 将测试探针插入材料中以压缩材料，同时将参考探针基本上保持在壳体的手压或重量下，从而评估与探针的材料压痕有关的材料的性质。 力可以由磁体结构中的音圈产生，其结束时，测试探针通过弯曲，相对的弯曲，线性平移台或线性轴承连接和支撑在磁体结构中。 可选地，包含测试探针和参考探针的测量单元连接到具有无线连接的基本单元，允许在现场材料测试中。
-
公开(公告)号：US07966866B2
公开(公告)日：2011-06-28
申请号：US12079444
申请日：2008-03-27
申请人： Paul Hansma , Barney Drake , Douglas Rehn , Jonathan Adams , Jason Lulejian
发明人： Paul Hansma , Barney Drake , Douglas Rehn , Jonathan Adams , Jason Lulejian
CPC分类号： A61B5/441 , A61B5/0002 , A61B5/0053 , A61B5/4504 , G01N3/42
摘要： Methods and instruments for characterizing a material, such as the properties of bone in a living human subject, using a test probe constructed for insertion into the material and a reference probe aligned with the test probe in a housing. The housing is hand held or placed so that the reference probe contacts the surface of the material under pressure applied either by hand or by the weight of the housing. The test probe is inserted into the material to indent the material while maintaining the reference probe substantially under the hand pressure or weight of the housing allowing evaluation of a property of the material related to indentation of the material by the probe. Force can be generated by a voice coil in a magnet structure to the end of which the test probe is connected and supported in the magnet structure by a flexure, opposing flexures, a linear translation stage, or a linear bearing. Optionally, a measurement unit containing the test probe and reference probe is connected to a base unit with a wireless connection, allowing in the field material testing.
摘要翻译： 用于表征材料的方法和仪器，例如使用构建用于插入材料中的测试探针，以及在壳体中与测试探针对准的参考探针，例如活的人类受试者中的骨骼的性质。 手持或放置外壳，使得参考探头在由手或由外壳的重量施加的压力下接触材料的表面。 将测试探针插入材料中以压缩材料，同时将参考探针基本上保持在壳体的手压或重量下，从而评估与探针的材料压痕有关的材料的性质。 力可以由磁体结构中的音圈产生，其结束时，测试探针通过弯曲，相对的弯曲，线性平移台或线性轴承连接和支撑在磁体结构中。 可选地，包含测试探针和参考探针的测量单元连接到具有无线连接的基本单元，允许在现场材料测试中。
-
公开(公告)号：US09895104B2
公开(公告)日：2018-02-20
申请号：US13261567
申请日：2011-07-12
申请人： Randall Connor , Daniel Bridges , Paul Hansma
发明人： Randall Connor , Daniel Bridges , Paul Hansma
CPC分类号： A61B5/4504 , A61B5/0053 , A61C19/04 , G01N3/42
摘要： The device performs reference point indentation without a reference probe. The indentation distance is measured relative to the instrument which remains substantially stationary during the impact process, which occurs on the order of one millisecond. In one embodiment, an impact motion with a peak force of order 28N creates an indentation in bone with a depth of approximately 150 μm during which the instrument case moves less than 1 μm. Thus the error in measuring indentation depth due to the motion of the case is less than 1%, making a reference probe unnecessary. Further, this “error” is consistent and can be corrected. In one embodiment, the device measures the fracture resistance of hard tissues by actually creating microscopic fractures in the hard tissues in a measured way. It creates these microscopic fractures by impacting the sample with a sharpened probe. The indentation distance in the sample is correlated with fracture resistance.
-
公开(公告)号：US20090056427A1
公开(公告)日：2009-03-05
申请号：US12079444
申请日：2008-03-27
申请人： Paul Hansma , Barney Drake , Douglas Rehn , Jonathan Adams , Jason Lulejian
发明人： Paul Hansma , Barney Drake , Douglas Rehn , Jonathan Adams , Jason Lulejian
CPC分类号： A61B5/441 , A61B5/0002 , A61B5/0053 , A61B5/4504 , G01N3/42
摘要： Methods and instruments for characterizing a material, such as the properties of bone in a living human subject, using a test probe constructed for insertion into the material and a reference probe aligned with the test probe in a housing. The housing is hand held or placed so that the reference probe contacts the surface of the material under pressure applied either by hand or by the weight of the housing. The test probe is inserted into the material to indent the material while maintaining the reference probe substantially under the hand pressure or weight of the housing allowing evaluation of a property of the material related to indentation of the material by the probe. Force can be generated by a voice coil in a magnet structure to the end of which the test probe is connected and supported in the magnet structure by a flexure, opposing flexures, a linear translation stage, or a linear bearing. Optionally, a measurement unit containing the test probe and reference probe is connected to a base unit with a wireless connection, allowing in the field material testing.
摘要翻译： 用于表征材料的方法和仪器，例如使用构建用于插入材料中的测试探针，以及在壳体中与测试探针对准的参考探针，例如活的人类受试者中的骨骼的性质。 手持或放置外壳，使得参考探头在由手或由外壳的重量施加的压力下接触材料的表面。 将测试探针插入材料中以压缩材料，同时将参考探针基本上保持在壳体的手压或重量下，从而评估与探针的材料压痕有关的材料的性质。 力可以由磁体结构中的音圈产生，其结束时，测试探针通过弯曲，相对的弯曲，线性平移台或线性轴承连接和支撑在磁体结构中。 可选地，包含测试探针和参考探针的测量单元连接到具有无线连接的基本单元，允许在现场材料测试中。
-
公开(公告)号：US20070276292A1
公开(公告)日：2007-11-29
申请号：US11417494
申请日：2006-05-04
申请人： Paul Hansma , Douglas Rehn , Georg Fantner , Patricia Turner
发明人： Paul Hansma , Douglas Rehn , Georg Fantner , Patricia Turner
IPC分类号： A61B5/103
CPC分类号： A61B5/4504 , A61B5/4509
摘要： Methods and instruments for assessing bone, for example fracture risk, in a subject in which a test probe is inserted through the skin of the subject so that the test probe contacts the subject's bone and the resistance of the test bone to microscopic fracture by the test probe is determined. Macroscopic bone fracture risk is assessed by measuring the resistance of the bone to microscopic fractures caused by the test probe. The microscopic fractures are so small that they pose negligible health risks. The instrument may also be useful in characterizing other materials, especially if it is necessary to penetrate a layer to get to the material to be characterized.
摘要翻译： 在受试者中评估骨骼的方法和仪器，例如骨折风险，其中将测试探针插入受试者的皮肤，使得测试探针通过测试与受检者的骨骼接触并测试骨骼与微观断裂的抵抗力 探针被确定。 通过测量由测试探针引起的骨显微镜骨折的抵抗力来评估宏观骨折的风险。 微观裂缝如此之小，造成健康风险微不足道。 该仪器还可用于表征其它材料，特别是如果需要穿透层以获得要表征的材料。
-
公开(公告)号：US20060112760A1
公开(公告)日：2006-06-01
申请号：US11000589
申请日：2004-11-30
申请人： Paul Hansma , Georg Fantner , Johannes Kindt
发明人： Paul Hansma , Georg Fantner , Johannes Kindt
IPC分类号： G01B5/28
CPC分类号： G01Q10/04
摘要： A scanner for probe microscopy that avoids low resonance frequencies and accounts better for piezo nonlinearities. The x, y and z axes of a linear stack scanner are partially decoupled from each other while maintaining all mechanical joints stiff in the direction of actuation. The scanning probe microscope comprises a probe, a housing, at least two actuators, each coupled to the housing, and a support coupled to the housing and to at least a first of the actuators at a position spaced from the point at which the actuator is coupled to the housing. The support constrains the motion of the first actuator along a first axis while permitting translation along a second axis. The actuators are preferably orthogonally arranged linear stacks of flat piezos, preferably in push-pull configuration. The support can take different forms in different embodiments of the invention. In a particular embodiment, the scanner is a 2D scanner having a support frame with x and y axes, and a member for supporting an object to be moved such as a sample for a probe, the scanner comprising a flexure and flexure coupled cross-conformed piezos arranged along x and y axes. Expansion of the piezos is measured by at least two strain gauges disposed to measure the differential motion of at least two opposed actuators. The strain gauges are preferably arranged to compensate for ambient temperature changes, and preferably two or more strain gauges of identical type are disposed on each actuator to magnify the strain signal.
-
-
-
-
-
-
-
-
-
搜索结果
11 条记录 (耗时 0.023 秒)
