Power semiconductor apparatus
    1.
    发明授权

    公开(公告)号:US12132014B2

    公开(公告)日:2024-10-29

    申请号:US17622588

    申请日:2020-07-08

    Applicant: HITACHI, LTD.

    Abstract: A power semiconductor apparatus provided with a first conductor section connected to a direct-current terminal for transmitting direct-current power; a second conductor section connected to an alternating-current terminal for transmitting alternating-current power; a semiconductor element which is disposed between the first conductor section and the second conductor section and is for converting the direct-current power to the alternating-current power; and an interposition section disposed between the first conductor section and the second conductor section, in which the interposition section has a first conductor layer connected to the first conductor section, a second conductor layer connected to the second conductor section, and a plurality of insulation layers disposed between the first conductor layer and the second conductor layer, with one or a plurality of third conductor layers sandwiched between the plurality of insulation layers.

    SEMICONDUCTOR DEVICE
    6.
    发明公开

    公开(公告)号:US20240324197A1

    公开(公告)日:2024-09-26

    申请号:US18306231

    申请日:2023-04-24

    CPC classification number: H10B41/40 H01L23/60 H10B41/30

    Abstract: A semiconductor device includes a substrate, a doped ring, a plurality of contacts, and a plurality of conductive lines. The substrate includes a first region and a second region surrounding the first region. The doped ring is located in the substrate in the second region and surrounds the first region. The doped ring includes a first doped region and a plurality of second doped regions. The first doped region is located in the substrate in the second region and surrounds the first region. The first doped region has an opening. The second doped regions are separated from each other and located in the substrate of the opening. The contacts are electrically connected to the second doped regions. The conductive lines are connected to the contacts and a plurality of conductive layers in the first region.

    ELECTROSTATIC DISCHARGE (ESD) ARRAY WITH CIRCUIT CONTROLLED SWITCHES

    公开(公告)号:US20240321781A1

    公开(公告)日:2024-09-26

    申请号:US18731021

    申请日:2024-05-31

    CPC classification number: H01L23/60 H01L27/0266 H01L27/0292 H02H9/046

    Abstract: An electrostatic discharge (ESD) protection apparatus and method for fabricating the same are disclosed herein. In some embodiments, the ESD protection apparatus comprises: an internal circuit formed in a first wafer; an array of electrostatic discharge (ESD) circuits formed in a second wafer, wherein the ESD circuits include a plurality of ESD protection devices each coupled to a corresponding switch and configured to protect the internal circuit from a transient ESD event; and a switch controller in the second wafer, wherein the switch controller is configured to control, based on a control signal from the first wafer, each of the plurality of ESD protection devices to be activated or deactivated by the corresponding switch, and wherein the first wafer is bonded to the second wafer.

    SEMICONDUCTOR DEVICE AND METHOD
    8.
    发明公开

    公开(公告)号:US20240321691A1

    公开(公告)日:2024-09-26

    申请号:US18732879

    申请日:2024-06-04

    CPC classification number: H01L23/481 H01L21/76877 H01L21/76898 H01L23/60

    Abstract: Some devices included a substrate; and a through via, including a plurality of scallops adjacent the through via in a first region and a plurality of scallops adjacent the through via in a second region, the plurality of scallops having a first depth, the scallops having a greater depth. Some devices include an opening extending into a substrate, including a first region and a second region. Sidewalls of the opening include a stack of first concave portions extending a first distance into the first substrate, and a stack of second concave portions extending a second distance, greater than and parallel to the first distance, into the first substrate. A conductor partially fills the first concave portions and at least partially fills the respective second concave portions.

    Sensor package structure
    10.
    发明授权

    公开(公告)号:US12080659B2

    公开(公告)日:2024-09-03

    申请号:US17715924

    申请日:2022-04-07

    CPC classification number: H01L23/60 H01L23/492 H01L23/552

    Abstract: A sensor package structure is provided. The sensor package structure includes a substrate, a sensor chip disposed on the substrate, a light-curing layer disposed on the substrate and surrounding the sensor chip, a light-permeable layer disposed on the light-curing layer, and a shielding layer that is ring-shaped and that is disposed on the light-permeable layer. And inner surface of the light-permeable layer, the light-curing layer, and the substrate jointly define an enclosed space that accommodates the sensor chip. A first projection area defined by orthogonally projecting the shielding layer onto the inner surface does not overlap the assembling region. A second projection area defined by orthogonally projecting the sensing region onto the inner surface along the predetermined direction does not overlap the first projection area and is located inside of the first projection area.

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