摘要:
Embodiments of the invention include methods, systems, and computer program products for checking metal coverage in a laminate structure. Aspects of the invention include receiving, by a processor, metal shadowing rules and a semiconductor package design comprising a plurality of laminate layers, a plurality of metal power shapes, and a plurality of signal lines. Each metal power shape is mapped to one or more cells in a two-dimensional array. The processor determines, for each signal line in the semiconductor package design, whether the metal power shapes satisfy the metal shadowing rules. The processor displays a list of signal lines that do not satisfy the metal shadowing rules.
摘要:
A temperature change of a device on an integrated circuit chip due to self-heating and thermal coupling with other device(s) is modeled considering inefficient heat removal from the backside of the chip. To perform such modeling, ratios of an imaginary heat amount to an actual heat amount for different locations on the IC chip must be predetermined using a test integrated circuit (IC) chip. During testing, one test device at one specific location on the test IC chip is selected to function as a heat source, while at least two other test devices at other locations on the test IC chip function as temperature sensors. The heat source is biased and changes in temperature at the heat source and at the sensors are determined. These changes are used to calculate the value of the imaginary heat amount to actual heat amount ratio to be associated with the specific location.
摘要:
A temperature change of a device on an integrated circuit chip due to self-heating and thermal coupling with other device(s) is modeled considering inefficient heat removal from the backside of the chip. To perform such modeling, ratios of an imaginary heat amount to an actual heat amount for different locations on the IC chip must be predetermined using a test integrated circuit (IC) chip. During testing, one test device at one specific location on the test IC chip is selected to function as a heat source, while at least two other test devices at other locations on the test IC chip function as temperature sensors. The heat source is biased and changes in temperature at the heat source and at the sensors are determined. These changes are used to calculate the value of the imaginary heat amount to actual heat amount ratio to be associated with the specific location.
摘要:
Various embodiments automatically back annotate an electronic design representation by inserting complex model instances in the representation and interconnecting the model instances with one or more interconnect models. Identifications of ports in a first representation may be associated or updated with identifications of corresponding ports in a second representation. Annotating the first representation may also include associating or stitching parasitic information from the second representation with or in the first representation. A model is used to represent a vectored net by splitting a vectored net with a vectored net identification into multiple scalared net segments each having its own scalared net identification. Some aspects automatically generate a display for visualizing results of annotating an electronic design with complex models. Some of these aspects may further include parasitic information and analysis results in the display.
摘要:
Various embodiments automatically back annotate an electronic design representation by inserting complex model instances in the representation and interconnecting the model instances with one or more interconnect models. Identifications of ports in a first representation may be associated or updated with identifications of corresponding ports in a second representation. Annotating the first representation may also include associating or stitching parasitic information from the second representation with or in the first representation. A model is used to represent a vectored net by splitting a vectored net with a vectored net identification into multiple scalared net segments each having its own scalared net identification. Some aspects automatically generate a display for visualizing results of annotating an electronic design with complex models. Some of these aspects may further include parasitic information and analysis results in the display.
摘要:
Disclosed are techniques to analyze multi-fabric designs. These techniques generate a cross-fabric analysis model by at least identifying first design data in a first design fabric of a multi-fabric electronic design using a first session of a first electronic design automation (EDA) tool, update the cross-fabric simulation model by at least identifying second design data in a second design fabric using a second session of a second EDA tool, and determine analysis results for the multi-fabric electronic design using at least the cross-fabric simulation model. Analysis results may be determined using parasitic, electrical, or performance information. Various EDA tools access their respective native design data in their respective domains or design fabrics and have no access to or visibility of non-native design data while these techniques automatically cross the boundaries between multiple design fabrics to accomplish the tasks of analyzing multi-fabric electronic designs or displaying analysis results therefor.
摘要:
A method and system for creating a customized package design. Package design and preference information related to a shape of the package design is received. The preference information includes user-specified information related to one or more levels of one or more structural attributes of the package design. A detailed design is generated that incorporates the user-specified information and a detailed design file is generated and output. Generation of the detailed design includes identifying functional elements associated with the package that correspond to the user-specified information and altering at least one physical characteristic of the identified functional elements based upon the preference information, and incorporating the altered physical characteristic into the detailed design. A determination can be made as to whether the altered detailed design satisfies any constraints associated with the package being design, and the detailed design file can be updated accordingly.
摘要:
A layout method for a printed circuit board (PCB) is provided. A memory type of a dynamic random access memory (DRAM) to be mounted on the PCB is obtained. A module group is obtained from a database according to the memory type of the DRAM, wherein the module group includes a plurality of routing modules. A plurality of PCB parameters are obtained. A specific routing module is selected from the module group according to the PCB parameters. The specific routing module is implemented into a layout design of the PCB. The specific routing module includes layout information regarding a main chip, a memory chip and a routing configuration between the main chip and the memory chip.
摘要:
Semiconductor device design methods and conductive bump pattern enhancement methods are disclosed. In some embodiments, a method of designing a semiconductor device includes designing a conductive bump pattern design, and implementing a conductive bump pattern enhancement algorithm on the conductive bump pattern design to create an enhanced conductive bump pattern design. A routing pattern is designed based on the enhanced conductive bump pattern design. A design rule checking (DRC) procedure is performed on the routing pattern.
摘要:
Serializer-deserializer (SERDES) and integrated circuit package including a package substrate, first and second SERDES dies having a SERDES circuit, and a logic die having a logic circuit. The SERDES circuit communicatively connected to the package substrate. The first and second SERDES dies positioned adjacent, in a plane, and disposed on the package substrate. The logic circuit communicatively connected to the SERDES circuit and to the package substrate. The logic die stacked vertically and disposed on the first and second SERDES dies. A method of assembling a SERDES and integrated circuit package including providing a SERDES structure selected from a menu of SERDES die and SERDES circuit combinations. A design structure of a SERDES and integrated circuit package including a package substrate, first and second SERDES dies having a SERDES circuit, and a logic die having a logic circuit. The SERDES circuit communicatively connected to the package substrate.