Ellipsometer and method for estimating thickness of film

    公开(公告)号:US11255658B2

    公开(公告)日:2022-02-22

    申请号:US17002677

    申请日:2020-08-25

    Abstract: An ellipsometer includes a light source, a polarizer, an asymmetric wavelength retarder, an analyzer and an optical detection component. The light source is configured to provide a light beam having multiple wavelengths incident to a sample. The polarizer is disposed between the light source and the sample, and configured to polarize the light beam. The asymmetric wavelength retarder is configured to provide a varied retardation effect on the light beam varied by wavelength. The analyzer is configured to analyze a polarization state of the light beam reflected by the sample. The optical detection component is configured to detect the light beam from the analyzer.

    PELLICLE AND METHOD FOR MANUFACTURING THE SAME

    公开(公告)号:US20170205705A1

    公开(公告)日:2017-07-20

    申请号:US14996966

    申请日:2016-01-15

    CPC classification number: G03F1/64 G03F1/62

    Abstract: A method for manufacturing a pellicle includes: providing a supporting substrate; forming an oxide layer over the supporting substrate; forming a metal layer over the oxide layer; forming a graphene layer over the metal layer; and removing at least a portion of the supporting substrate and the oxide layer. An associated method includes: providing a supporting substrate; forming a first silicon carbide (SiC) layer or a diamond layer over the supporting substrate; forming a graphene layer over the SiC layer or the diamond layer; and removing at least a portion of the supporting substrate and the first silicon carbide (SiC) layer or the diamond layer; wherein the pellicle is at least partially transparent to extreme ultraviolet (EUV) radiation. An associated pellicle is also disclosed.

    N/P metal crystal orientation for high-k metal gate Vt modulation
    4.
    发明授权
    N/P metal crystal orientation for high-k metal gate Vt modulation 有权
    N / P金属晶体取向为高k金属栅Vt调制

    公开(公告)号:US08932921B2

    公开(公告)日:2015-01-13

    申请号:US14174689

    申请日:2014-02-06

    Abstract: The present disclosure provides an integrated circuit. The integrated circuit includes a semiconductor substrate having a first region and a second region; a first gate stack of an n-type field-effect transistor (FET) in the first region; and a second gate stack of a p-type FET in the second region. The first gate stack includes a high k dielectric layer on the semiconductor substrate, a first crystalline metal layer in a first orientation on the high k dielectric layer, and a conductive material layer on the first crystalline metal layer. The second gate stack includes the high k dielectric layer on the semiconductor substrate, a second crystalline metal layer in a second orientation on the high k dielectric layer, and the conductive material layer on the second crystalline metal layer.

    Abstract translation: 本发明提供集成电路。 集成电路包括具有第一区域和第二区域的半导体衬底; 在所述第一区域中的n型场效应晶体管(FET)的第一栅极堆叠; 以及第二区域中的p型FET的第二栅极堆叠。 第一栅极堆叠包括在半导体衬底上的高k电介质层,在高k电介质层上具有第一取向的第一晶体金属层和第一晶体金属层上的导电材料层。 第二栅极堆叠包括半导体衬底上的高k电介质层,在高k电介质层上具有第二取向的第二晶体金属层和第二晶体金属层上的导电材料层。

    N/P METAL CRYSTAL ORIENTATION FOR HIGH-K METAL GATE Vt MODULATION
    5.
    发明申请
    N/P METAL CRYSTAL ORIENTATION FOR HIGH-K METAL GATE Vt MODULATION 有权
    用于高K金属门Vt调节的N / P金属晶体取向

    公开(公告)号:US20140154848A1

    公开(公告)日:2014-06-05

    申请号:US14174689

    申请日:2014-02-06

    Abstract: The present disclosure provides an integrated circuit. The integrated circuit includes a semiconductor substrate having a first region and a second region; a first gate stack of an n-type field-effect transistor (FET) in the first region; and a second gate stack of a p-type FET in the second region. The first gate stack includes a high k dielectric layer on the semiconductor substrate, a first crystalline metal layer in a first orientation on the high k dielectric layer, and a conductive material layer on the first crystalline metal layer. The second gate stack includes the high k dielectric layer on the semiconductor substrate, a second crystalline metal layer in a second orientation on the high k dielectric layer, and the conductive material layer on the second crystalline metal layer.

    Abstract translation: 本发明提供集成电路。 集成电路包括具有第一区域和第二区域的半导体衬底; 在所述第一区域中的n型场效应晶体管(FET)的第一栅极堆叠; 以及第二区域中的p型FET的第二栅极堆叠。 第一栅极堆叠包括在半导体衬底上的高k电介质层,在高k电介质层上具有第一取向的第一晶体金属层和第一晶体金属层上的导电材料层。 第二栅极堆叠包括半导体衬底上的高k电介质层,在高k电介质层上具有第二取向的第二晶体金属层和第二晶体金属层上的导电材料层。

    Apparatus and method for generating an electromagnetic radiation

    公开(公告)号:US11153957B2

    公开(公告)日:2021-10-19

    申请号:US16505156

    申请日:2019-07-08

    Abstract: An electromagnetic radiation generation apparatus includes a collector, a gas supplier and a gas pipeline. The collector has a reflection surface configured to reflect an electromagnetic radiation. The collector includes a bottom portion, a perimeter portion, and a middle portion between the bottom portion and the perimeter portion. The middle portion of the collector includes a plurality of openings. The gas supplier is configured to provide a buffer gas. The gas pipeline is in communication with the gas supplier and the collector, and configured to purge the buffer gas through the openings of the middle portion to form a gas protection layer near the reflection surface of the collector. The openings of the middle portion include a plurality of holes arranged in an array including a plurality of rows of holes, or a plurality of concentric gaps.

    Pellicle and method for manufacturing the same

    公开(公告)号:US09864270B2

    公开(公告)日:2018-01-09

    申请号:US14996966

    申请日:2016-01-15

    CPC classification number: G03F1/64 G03F1/62

    Abstract: A method for manufacturing a pellicle includes: providing a supporting substrate; forming an oxide layer over the supporting substrate; forming a metal layer over the oxide layer; forming a graphene layer over the metal layer; and removing at least a portion of the supporting substrate and the oxide layer. An associated method includes: providing a supporting substrate; forming a first silicon carbide (SiC) layer or a diamond layer over the supporting substrate; forming a graphene layer over the SiC layer or the diamond layer; and removing at least a portion of the supporting substrate and the first silicon carbide (SiC) layer or the diamond layer; wherein the pellicle is at least partially transparent to extreme ultraviolet (EUV) radiation. An associated pellicle is also disclosed.

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