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公开(公告)号:US12232260B2
公开(公告)日:2025-02-18
申请号:US17939546
申请日:2022-09-07
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Seungjin Lee , Jonghoon Kim , Kyoungsun Kim , Sungjoo Park , Jinseong Yun , Young-Ho Lee , Jeonghyeon Cho , Heejin Cho
Abstract: An electronic device includes: a multilayered base substrate including a plurality of substrate bases stacked on each other; a first conductive via and a second conductive via penetrating the substrate bases and spaced from each other; a conductive line electrically connecting the first conductive via and the second conductive via to each other and disposed on at least one of the substrate bases of the plurality of substrate bases; and an open stub including a first end and a second end, wherein the first end is connected to a connector of the conductive line, and the second end is opened.
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公开(公告)号:US10055807B2
公开(公告)日:2018-08-21
申请号:US15059175
申请日:2016-03-02
Applicant: Samsung Electronics Co., Ltd
Inventor: Seungjin Lee , Seok-Jun Lee
Abstract: An image and vision processing architecture included a plurality of image processing hardware accelerators each configured to perform a different one of a plurality of image processing operations on image data. A multi-port memory shared by the hardware accelerators stores the image data and is configurably coupled by a sparse crossbar interconnect to one or more of the hardware accelerators depending on a use case employed. The interconnect processes accesses of the image data by the hardware accelerators. Two or more of the hardware accelerators are chained to operate in sequence in a first order for a first use case, and at least one of the hardware accelerators is set to operate for a second use case. Portions of the memory are allocated to the hardware accelerators based on the use case employed, with an allocated portion of the memory configured as a circular buffer.
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公开(公告)号:US20230180381A1
公开(公告)日:2023-06-08
申请号:US18071903
申请日:2022-11-30
Applicant: Samsung Electronics Co., Ltd.
Inventor: Kanggyune Lee , Hyunggil Baek , Youngja Kim , Seungjin Lee
IPC: H05K1/02 , H01L23/544 , H01L23/498 , H01L25/10
CPC classification number: H05K1/0269 , H01L23/544 , H01L23/49816 , H01L23/49822 , H01L23/49838 , H01L25/105 , H01L2223/54426 , H05K1/113
Abstract: A printed circuit board includes a substrate base; a plurality of ball lands arranged on a surface of the substrate base; a cutting position identification mark disposed on a corner of the surface of the substrate base; and at least one alignment mark disposed on the surface of the substrate base to be spaced apart from the ball lands and exposed to the outside, wherein top surfaces of the ball lands and a top surface of the at least one alignment mark are at substantially the same vertical level and the ball lands and the at least one alignment mark include the same material.
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公开(公告)号:US11323639B2
公开(公告)日:2022-05-03
申请号:US16999586
申请日:2020-08-21
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Soonik Cho , Minji Hwang , Seungjin Lee
Abstract: An image sensor and an operation method of the image sensor are disclosed. The image sensor includes a pixel array and a row driver. The pixel array includes a first pixel and a second pixel. Each of the first pixel and the second pixel includes at least one photosensitive element and a switching element configured to transfer charges generated by the at least one photosensitive element to a floating diffusion node. The first pixel and the second pixel are connected to a same column line. The row driver is configured to provide a clamping control signal to the switching element in the first pixel. The clamping control signal transits from a first level to a second level that is less than the first level, during a read period of the second pixel.
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公开(公告)号:US10313616B2
公开(公告)日:2019-06-04
申请号:US15434605
申请日:2017-02-16
Applicant: Samsung Electronics Co., Ltd.
Inventor: Yunhwan Jung , Sunyool Kang , Kyoungmin Koh , Seungjin Lee
Abstract: An image sensor includes first pixels and second pixels arranged in alternating order along a first direction, first output lines extending in a second direction that is perpendicular to the first direction and respectively connected to the first pixels, second output lines extending in the second direction and respectively connected to the second pixels, first analog circuit blocks and second analog circuit blocks arranged in alternating order along the first direction, and shielding structures disposed each between adjacent ones of the first and second analog circuit blocks. Each of the first analog circuit blocks includes a plurality of first analog circuits respectively connected to the first output lines. Each of the second analog circuit blocks includes a plurality of second analog circuits respectively connected to the second output lines.
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公开(公告)号:US20170256016A1
公开(公告)日:2017-09-07
申请号:US15059175
申请日:2016-03-02
Applicant: Samsung Electronics Co., Ltd
Inventor: Seungjin Lee , Seok-Jun Lee
Abstract: An image and vision processing architecture included a plurality of image processing hardware accelerators each configured to perform a different one of a plurality of image processing operations on image data. A multi-port memory shared by the hardware accelerators stores the image data and is configurably coupled by a sparse crossbar interconnect to one or more of the hardware accelerators depending on a use case employed. The interconnect processes accesses of the image data by the hardware accelerators. Two or more of the hardware accelerators are chained to operate in sequence in a first order for a first use case, and at least one of the hardware accelerators is set to operate for a second use case. Portions of the memory are allocated to the hardware accelerators based on the use case employed, with an allocated portion of the memory configured as a circular buffer.
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公开(公告)号:US11977828B2
公开(公告)日:2024-05-07
申请号:US17486794
申请日:2021-09-27
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Seungjin Lee , Yunkyoung Song , Dawoon Choi , Kyoil Koo
IPC: G06F30/392 , G03F7/00 , H01L21/308 , G06F111/08 , G06F111/10
CPC classification number: G06F30/392 , G03F7/70033 , G03F7/70625 , G03F7/7065 , H01L21/308 , G06F2111/08 , G06F2111/10
Abstract: A method for detecting a stochastic weak point of a layout pattern of a semiconductor integrated circuit includes: forming a semiconductor integrated circuit by exposing a wafer which is masked by a layout pattern and coated with a photoresist to light, and etching the circuit according to the layout pattern, calculating line edge roughness (LER) of the circuit, and calculating a variability constant for fitting the line edge roughness to a normal distribution from a polymer concentration value of the photoresist. The polymer concentration value is calculated from modeling the layout pattern, a total value of intensity of light reaching the photoresist, and an intensity value of light reaching one point of the photoresist. The method further includes calculating a probability distribution of the polymer concentration value of the layout pattern based on the variability constant, and calculating a stochastic weak point of the layout pattern from the probability distribution.
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公开(公告)号:US11818850B2
公开(公告)日:2023-11-14
申请号:US17582590
申请日:2022-01-24
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Seungjin Lee , Jongbeom Park
CPC classification number: H05K3/4007 , B23K1/203 , H05K2203/0126
Abstract: A flux dotting tool is provided that includes: a housing having an internal space and a plurality of through-holes extending from the internal space to an outside of the housing; a plurality of flux pins disposed in the internal space to correspond to the plurality of through-holes, respectively, wherein each of the plurality of flux pins includes a flux holding portion extending in a first direction and that is exposed to the outside of the housing, and a flux blocking structure protruding in a second direction, perpendicular to the first direction, from a side surface of the flux holding portion, and the flux blocking structure is configured to limit a flux wetting region; and an elastic structure disposed on the plurality of flux pins in the internal space and configured to impart elastic force in the first direction.
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公开(公告)号:US11740073B2
公开(公告)日:2023-08-29
申请号:US17463499
申请日:2021-08-31
Inventor: Jooho Kim , Donyun Kim , Yunhyoung Nam , Seungjin Lee , Dawoon Choi
CPC classification number: G01B11/24 , G06T7/60 , G06V10/267 , H01J37/28 , H01J2237/24578 , H01J2237/2803
Abstract: A method of measuring a critical dimension (CD) includes forming a plurality of patterns in a substrate, creating first to n-th images, where n is a natural number greater than 1, for first to n-th areas in the substrate, respectively, where the first to n-th areas do not overlap with each other, where each of the first to n-th areas comprising at least some of the plurality of patterns, creating a merged image for the first to n-th images, and measuring a CD for a measurement object from the plurality of patterns using the merged image. The merged image has a higher resolution than each of the first to n-th images.
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公开(公告)号:US20220325179A1
公开(公告)日:2022-10-13
申请号:US17708245
申请日:2022-03-30
Inventor: Eun Joo JANG , Seungjin Lee , Ted Sargent , Kwanghee KIM , Yuho WON
Abstract: A quantum dot device and an electronic device including the device are provided. The quantum dot device includes a first electrode and a second electrode, a quantum dot layer disposed between the first electrode and the second electrode, and a hole auxiliary layer disposed between the quantum dot layer and the first electrode, wherein the hole auxiliary layer includes nickel oxide and a self-assembled monolayer disposed between the hole auxiliary layer and the quantum dot layer, the self-assembled monolayer including an organic compound represented by Chemical Formula 1.
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