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公开(公告)号:US11798963B2
公开(公告)日:2023-10-24
申请号:US17119330
申请日:2020-12-11
Applicant: Samsung Electronics Co., Ltd.
Inventor: Yunhong Kim , Yunhwan Jung , Heesung Chae
IPC: H01L27/146 , H04N25/75
CPC classification number: H01L27/14612 , H01L27/14636 , H01L27/14643 , H04N25/75
Abstract: An image sensor includes a substrate including an active pixel region and an inactive pixel region, having a smaller area than the active pixel region; a plurality of active pixels in the active pixel region, each of the plurality of active pixels including a first transfer transistor, a first reset transistor, a first driving transistor, and a first selection transistor; and a plurality of inactive pixels in the inactive pixel region, each of the plurality of inactive pixels including a second transfer transistor, a second reset transistor, a second driving transistor, a second selection transistor, and a switch transistor connected to a node between the second driving transistor and the second select transistor. The plurality of switch transistors, included in the plurality of inactive pixels, are connected to each other by a connection wiring.
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2.
公开(公告)号:US11709518B2
公开(公告)日:2023-07-25
申请号:US17150316
申请日:2021-01-15
Applicant: Samsung Electronics Co., Ltd.
Inventor: Kyung-Min Kim , Haesick Sul , Sunyool Kang , Yunhong Kim , Seungmin Suh , Hyeonji Lee , Yunhwan Jung
Abstract: Disclosed is a bandgap reference circuit, which includes a first current generator that generates a first current proportional to a temperature, a second current generator that outputs a second current obtained by mirroring the first current to a first node at which a reference voltage is formed, a first resistor that is connected with the first node and is supplied with the second current, and a first bipolar junction transistor (BJT) that includes an emitter node connected with the first resistor, a base node supplied with a first power, and a collector node supplied with a second power different from the first power.
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公开(公告)号:US11196952B2
公开(公告)日:2021-12-07
申请号:US16845137
申请日:2020-04-10
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Yunhwan Jung , Sunyool Kang , Jaehong Kim
IPC: H04N5/369 , H04N5/357 , H04N5/3745 , H04N5/376 , H04N5/378
Abstract: A comparing circuit may include a first amplifier and a second amplifier. The first amplifier performs a correlated double sampling operation in response to a pixel signal and a ramp signal, and the second amplifier amplifies an output signal of the first amplifier. The second amplifier includes a current stabilization circuit that supplies current to the second amplifier during the correlated double sampling operation irrespective of the output signal of the first amplifier.
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4.
公开(公告)号:US20230016998A1
公开(公告)日:2023-01-19
申请号:US17824607
申请日:2022-05-25
Applicant: Samsung Electronics Co., Ltd.
Inventor: Yunhong Kim , Heesung Chae , Yunhwan Jung , Haesick Sul
IPC: H04N5/378 , H04N5/3745 , H04N5/369
Abstract: An image sensor for sampling a pixel signal a plurality of times during a readout time includes an analog comparator configured to compare a signal level of the pixel signal with a signal level of a target ramp signal that is any one of a plurality of ramp signals, a counter configured to output counting data based on a comparison result of the analog comparator, and a digital comparing circuit configured to compare a binary value of a target reference code corresponding to the target ramp signal with a binary value of the counting data and determine whether to output a digital signal corresponding to the counting data to a data output circuit based on a result of the comparison between the binary value of the counting data and the binary value of the target reference code.
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公开(公告)号:US20210266477A1
公开(公告)日:2021-08-26
申请号:US17038347
申请日:2020-09-30
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Yunhwan Jung , Kyoungmin Koh
IPC: H04N5/355 , H04N5/3745
Abstract: An imaging device includes a pixel array with a plurality of pixels each configured to generate a reset signal and an image signal, a sampling circuit including a plurality of samplers connected to column lines, where each sampler generates a first comparison signal by comparing the reset signal with a ramp signal and generates a second comparison signal by comparing the image signal with the ramp signal. An ADC converts each of the first and second comparison signals into a digital signal. Each sampler performs an auto-zero operation for initializing itself before performing the comparing with respect to the reset signal in a first mode, and performs a respective auto-zero operation before performing the comparing for each of the reset signal and the image signal in a second mode.
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公开(公告)号:US20190260948A1
公开(公告)日:2019-08-22
申请号:US16403741
申请日:2019-05-06
Applicant: Samsung Electronics Co., Ltd.
Inventor: Yunhwan Jung , Sunyool Kang , Kyoungmin Koh , Seungjin Lee
Abstract: An image sensor includes first pixels and second pixels arranged in alternating order along a first direction, first output lines extending in a second direction that is perpendicular to the first direction and respectively connected to the first pixels, second output lines extending in the second direction and respectively connected to the second pixels, first analog circuit blocks and second analog circuit blocks arranged in alternating order along the first direction, and shielding structures disposed each between adjacent ones of the first and second analog circuit blocks. Each of the first analog circuit blocks includes a plurality of first analog circuits respectively connected to the first output lines. Each of the second analog circuit blocks includes a plurality of second analog circuits respectively connected to the second output lines.
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7.
公开(公告)号:US11924569B2
公开(公告)日:2024-03-05
申请号:US17824607
申请日:2022-05-25
Applicant: Samsung Electronics Co., Ltd.
Inventor: Yunhong Kim , Heesung Chae , Yunhwan Jung , Haesick Sul
IPC: H04N25/75 , H04N25/701 , H04N25/772
CPC classification number: H04N25/75 , H04N25/701 , H04N25/772
Abstract: An image sensor for sampling a pixel signal a plurality of times during a readout time includes an analog comparator configured to compare a signal level of the pixel signal with a signal level of a target ramp signal that is any one of a plurality of ramp signals, a counter configured to output counting data based on a comparison result of the analog comparator, and a digital comparing circuit configured to compare a binary value of a target reference code corresponding to the target ramp signal with a binary value of the counting data and determine whether to output a digital signal corresponding to the counting data to a data output circuit based on a result of the comparison between the binary value of the counting data and the binary value of the target reference code.
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公开(公告)号:US11363231B2
公开(公告)日:2022-06-14
申请号:US17333712
申请日:2021-05-28
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Sunyool Kang , Yunhwan Jung , Seokyong Hong
Abstract: An image sensor includes a pixel array including a plurality of pixels connected to row lines extending in a first direction and to column lines extending in a second direction intersecting the first direction, a ramp voltage generator configured to output a ramp voltage, a plurality of comparators, each of the plurality of comparators including a first input terminal to which the ramp voltage is input, and a second input terminal connected to one of the column lines, and a replica circuit having a same structure as a structure of a portion of the comparators. Each of the comparators includes a plurality of transistors, a first auto-zero transistor connected to the first input terminal, a second auto-zero transistor connected to the second input terminal, and wirings connected to the plurality of transistors, the first auto-zero transistor, and the second auto-zero transistor.
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公开(公告)号:US20220078362A1
公开(公告)日:2022-03-10
申请号:US17459045
申请日:2021-08-27
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Yunhwan Jung , Hyeokjong Lee , Sunyool Kang , Kyungmin Kim , Yunhong Kim , Ingyeong Shin
IPC: H04N5/355 , H04N5/378 , H04N5/3745
Abstract: An image sensor includes a pixel configured to operate in a high conversion gain (HCG) mode and a low conversion gain (LCG) mode during a readout period, and a correlated double sampling (CDS) circuit configured to generate a comparison signal based on a ramp signal and a pixel voltage received from the pixel, wherein the CDS circuit includes a comparator configured to: receive the pixel voltage through a first input node, receive the ramp signal through a second input node based on an LCG reset signal or an LCG image signal being received as the pixel voltage, and receive the ramp signal through a third input node based on an HCG reset signal or an HCG image signal being received as the pixel voltage; and compare the ramp signal to the pixel voltage, and output the comparison signal corresponding to a comparison result.
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10.
公开(公告)号:US10971445B2
公开(公告)日:2021-04-06
申请号:US16663582
申请日:2019-10-25
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Yunhwan Jung , Sunyool Kang , Jaehong Kim
IPC: H04N5/357 , H04N5/378 , H01L23/522 , H03K4/08 , H01L27/08
Abstract: A comparison circuit that includes an input sampling capacitor and an image sensor including the same are provided. The comparison circuit includes an amplifier configured to receive a pixel signal and a ramp signal to perform a correlated double sampling operation, a first pixel capacitor connected to the amplifier through a first floating node and configured to transmit the pixel signal, a first ramp capacitor connected to the amplifier through a second floating node and configured to transmit the ramp signal, a second pixel capacitor connected in parallel to the first pixel capacitor, and a second ramp capacitor connected in parallel to the first ramp capacitor, wherein the second pixel capacitor is formed between the first floating node and first peripheral routing lines, and the second ramp capacitor is formed between the second floating node and second peripheral routing lines.
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