公开(公告)号：US09748157B1

公开(公告)日：2017-08-29

申请号：US13904401

申请日：2013-05-29

Applicant: STATS ChipPAC Pte. Ltd.

Inventor： HeeJo Chi ,  HanGil Shin ,  NamJu Cho ,  Kyung Moon Kim

IPC: H01L23/00 ,  H01L23/28 ,  H01L21/56

CPC classification number: H01L23/28 ,  H01L21/4853 ,  H01L21/56 ,  H01L21/565 ,  H01L23/3128 ,  H01L23/49811 ,  H01L23/49827 ,  H01L23/49833 ,  H01L23/5389 ,  H01L24/16 ,  H01L24/32 ,  H01L24/48 ,  H01L24/73 ,  H01L24/81 ,  H01L24/92 ,  H01L2224/16225 ,  H01L2224/16227 ,  H01L2224/32225 ,  H01L2224/48227 ,  H01L2224/73204 ,  H01L2224/81815 ,  H01L2224/92125 ,  H01L2924/14 ,  H01L2924/1533 ,  H01L2924/15331 ,  H01L2924/00

Abstract: An integrated circuit packaging system and method of manufacture thereof includes: a base substrate having a bottom pad; an integrated circuit device mounted on the base substrate; an interposer having a package interconnect mounted on the base substrate, the package interconnect includes an underside base portion having an irregular surface characteristic of a coining process; and an encapsulation between the interposer and the base substrate.

公开(公告)号：US10109587B1

公开(公告)日：2018-10-23

申请号：US15226735

申请日：2016-08-02

Applicant: STATS ChipPAC Pte. Ltd.

Inventor： Dao Nguyen Phu Cuong ,  Bartholomew Liao Chung Foh ,  Byung Tai Do ,  Kyung Moon Kim ,  Jeffrey David Punzalan ,  SeungYong Chai ,  Soo Won Lee ,  Kwok Keung Szeto ,  KyungOe Kim

IPC: H01L23/538 ,  H01L21/48 ,  H01L21/56 ,  H01L23/31 ,  H01L21/768

Abstract: An integrated circuit packaging system, and a method of manufacture thereof, including: a substrate including: a first trace layer, an encapsulation on the first trace layer, the first trace layer having a surface exposed from the encapsulation with a rough texture characteristic of removal of a conductive carrier coating, a second trace layer on the encapsulation and over the first trace layer, the second trace layer connected to the first trace layer; and an integrated circuit die attached to the substrate.

公开(公告)号：US09865554B2

公开(公告)日：2018-01-09

申请号：US14955033

申请日：2015-11-30

Applicant: STATS ChipPAC Pte. Ltd.

Inventor： Il Kwon Shim ,  Kyung Moon Kim ,  HeeJo Chi ,  JunMo Koo ,  Bartholomew Liao Chung Foh ,  Zigmund Ramirez Camacho

IPC: H01L21/60 ,  H01L23/00 ,  H01L23/31

CPC classification number: H01L24/03 ,  H01L23/3192 ,  H01L24/05 ,  H01L24/11 ,  H01L24/13 ,  H01L2224/03001 ,  H01L2224/03318 ,  H01L2224/0332 ,  H01L2224/03462 ,  H01L2224/0347 ,  H01L2224/039 ,  H01L2224/03901 ,  H01L2224/0401 ,  H01L2224/05022 ,  H01L2224/05027 ,  H01L2224/0508 ,  H01L2224/05124 ,  H01L2224/05144 ,  H01L2224/05147 ,  H01L2224/05155 ,  H01L2224/05166 ,  H01L2224/05171 ,  H01L2224/05555 ,  H01L2224/05569 ,  H01L2224/05572 ,  H01L2224/0558 ,  H01L2224/05664 ,  H01L2224/11462 ,  H01L2224/1147 ,  H01L2224/11849 ,  H01L2224/131 ,  H01L2224/94 ,  H01L2924/014 ,  H01L2924/00014 ,  H01L2224/03 ,  H01L2924/01074 ,  H01L2224/05164 ,  H01L2224/05644 ,  H01L2224/3318

Abstract: An integrated circuit packaging system and method of manufacture thereof including: providing a substrate; forming contact pads on top of the substrate; forming a protection layer on top of the contact pads and the substrate; exposing the contact pads from the protection layer; printing under bump metallization (UBM) layers over the exposed contact pads extended over the protection layer with conductive inks; and forming bumps on top of the under bump metallization layers. It also including: printing an adhesion layer using conductive ink, wherein the adhesion layer comprises interconnected adhesion layer pads; forming additional under bump metallization (UBM) layers and bumps on top of the adhesion layer pads utilizing an electro-deposition process; and removing connections among the interconnected adhesion layer pads.