Semiconductor device
    2.
    发明授权

    公开(公告)号:US11610838B2

    公开(公告)日:2023-03-21

    申请号:US17367773

    申请日:2021-07-06

    摘要: A semiconductor device includes a semiconductor layer having a first surface and a second surface opposite to the first surface, an active pattern on the first surface, the active pattern including a source/drain region, a power rail electrically connected to the source/drain region, and a power delivery network on the second surface, the power delivery network electrically connected to the power rail. The semiconductor layer includes an etch stop dopant, and the etch stop dopant has a maximum concentration at the second surface.

    Integrated circuit device and method of manufacturing the same

    公开(公告)号:US11177286B2

    公开(公告)日:2021-11-16

    申请号:US16807410

    申请日:2020-03-03

    摘要: An integrated circuit device includes an embedded insulation layer, a semiconductor layer on the embedded insulation layer, the semiconductor layer having a main surface, and a plurality of fin-type active areas protruding from the main surface to extend in a first horizontal direction and in parallel with one another, a separation insulation layer separating the semiconductor layer into at least two element regions adjacent to each other in a second horizontal direction intersecting the first horizontal direction, source/drain regions on the plurality of fin-type active areas, a first conductive plug on and electrically connected to the source/drain regions, a buried rail electrically connected to the first conductive plug while penetrating through the separation insulation layer and the semiconductor layer, and a power delivery structure arranged in the embedded insulation layer, the power delivery structure being in contact with and electrically connected to the buried rail.

    Semiconductor device
    4.
    发明授权

    公开(公告)号:US11121080B2

    公开(公告)日:2021-09-14

    申请号:US16809788

    申请日:2020-03-05

    摘要: A semiconductor device includes a semiconductor layer having a first surface and a second surface opposite to the first surface, an active pattern on the first surface, the active pattern including a source/drain region, a power rail electrically connected to the source/drain region, and a power delivery network on the second surface, the power delivery network electrically connected to the power rail. The semiconductor layer includes an etch stop dopant, and the etch stop dopant has a maximum concentration at the second surface.

    Method of manufacturing an integrated circuit device

    公开(公告)号:US11728347B2

    公开(公告)日:2023-08-15

    申请号:US17494275

    申请日:2021-10-05

    摘要: An integrated circuit device includes an embedded insulation layer, a semiconductor layer on the embedded insulation layer, the semiconductor layer having a main surface, and a plurality of fin-type active areas protruding from the main surface to extend in a first horizontal direction and in parallel with one another, a separation insulation layer separating the semiconductor layer into at least two element regions adjacent to each other in a second horizontal direction intersecting the first horizontal direction, source/drain regions on the plurality of fin-type active areas, a first conductive plug on and electrically connected to the source/drain regions, a buried rail electrically connected to the first conductive plug while penetrating through the separation insulation layer and the semiconductor layer, and a power delivery structure arranged in the embedded insulation layer, the power delivery structure being in contact with and electrically connected to the buried rail.

    FERROELECTRIC MEMORY DEVICE
    6.
    发明公开

    公开(公告)号:US20230165012A1

    公开(公告)日:2023-05-25

    申请号:US18049366

    申请日:2022-10-25

    IPC分类号: H01L27/1159

    CPC分类号: H01L27/1159

    摘要: A ferroelectric memory device according to the inventive concept includes a substrate having source/drain regions, an interface layer on the substrate, a high dielectric layer on the interface layer, a ferroelectric layer on the high dielectric layer, and a gate electrode layer on the ferroelectric layer. The high dielectric layer and the ferroelectric layer have phases of different crystal structures.