Cold plate architecture for liquid cooling of devices

    公开(公告)号:US12133357B2

    公开(公告)日:2024-10-29

    申请号:US17123760

    申请日:2020-12-16

    申请人: Intel Corporation

    IPC分类号: H05K7/20

    摘要: Examples described herein relate to a cold plate. In some examples, the cold plate includes a surface with fins and at least two channels, wherein a first channel is shaped with a first opening extending towards the surface, a second opening proximate and across a first fin attached to the surface, and a third opening from the surface and extending away from the surface. In some examples, when a fluid is provided to the first opening, the first opening directs the fluid towards the surface, the second opening directs the fluid across the first fin, and the third opening directs the fluid away from the surface. In some examples, the second opening comprises split openings around opposite sides of the first fin.

    BOILING ENHANCEMENT FOR TWO-PHASE IMMERSION COOLING OF INTEGRATED CIRCUIT DEVICES

    公开(公告)号:US20230137684A1

    公开(公告)日:2023-05-04

    申请号:US17517348

    申请日:2021-11-02

    申请人: Intel Corporation

    IPC分类号: H01L23/427 H01L23/373

    摘要: A two-phase immersion cooling system for integrated circuit assemblies may be formed utilizing a heat dissipation assembly thermally coupled to at least one integrated circuit device, wherein the heat dissipation assembly includes a heat dissipation device having a boiling enhancement structure attached thereto with a chemically soluble adhesive material; and a thermal interface material between the boiling enhancement structure and the heat dissipation device. Utilizing a chemically soluble adhesive material allows for the boiling enhancement structure to be removed by dissolving the adhesive material, thus allowing for testing, rework, and/or replacement.

    TECHNOLOGIES FOR LIQUID COOLING INTERFACES

    公开(公告)号:US20210216121A1

    公开(公告)日:2021-07-15

    申请号:US17214230

    申请日:2021-03-26

    申请人: Intel Corporation

    IPC分类号: G06F1/20 H05K7/20

    摘要: Techniques for liquid cooling interfaces with rotatable connector assemblies are disclosed. In one embodiment, a collar contacts flanges on two components of a connector assembly, preventing them from separating. In another embodiment, a housing is positioned around a stem component. The stem component has a gap between a top part and a bottom part held apart by pillars, allowing water to flow to a tubing fitting connected to the housing. A retainer on top of the stem component holds the housing in place. In yet another embodiment, an internal retainer holds a housing component in place over a stem. Other embodiments are disclosed.

    PROBES FOR WAFER SORTING
    5.
    发明申请

    公开(公告)号:US20190101569A1

    公开(公告)日:2019-04-04

    申请号:US15720742

    申请日:2017-09-29

    申请人: Intel Corporation

    IPC分类号: G01R1/067 G01R31/26

    摘要: Embodiments may include systems and methods for manufacturing a probe for wafer sorting or die testing. A probe for wafer sorting or die testing may include a probe body and a probe tip. The probe body may include a probe core and a probe plating layer around the probe core. The probe core may include a first material, and the probe plating layer may include a second material. The probe tip may be next to the probe core of the probe body and may include the first material. In addition, the probe tip may have an end surface that is smaller than a surface of the probe core, and larger than a single point. A probe-manufacturing device may include a forging unit, a clipping unit, and an actuation mechanism to control the forging unit and the clipping unit. Other embodiments may be described and/or claimed.

    MICROELECTRONIC TEST DEVICE INCLUDING A PROBE CARD HAVING AN INTERPOSER
    6.
    发明申请
    MICROELECTRONIC TEST DEVICE INCLUDING A PROBE CARD HAVING AN INTERPOSER 审中-公开
    微电子测试装置,其中包括一个具有插入器的探针卡

    公开(公告)号:US20160299174A1

    公开(公告)日:2016-10-13

    申请号:US14683742

    申请日:2015-04-10

    申请人: INTEL CORPORATION

    IPC分类号: G01R1/073 G01R3/00 G01R1/04

    摘要: A microelectronic test device comprising an organic substrate, a probe holder, and an interposer disposed between the organic substrate and the probe holder, wherein the interposer has a coefficient of thermal expansion that is less than a coefficient of thermal expansion of the organic substrate. The interposer may effectively decouple the organic substrate from probes in the probe holder, which may substantially reduce or eliminate probe misalignment due to the coefficient of thermal expansion mismatch between the organic substrate and other components of the microelectronic test device and to provide require stiffness to the organic substrate.

    摘要翻译: 一种微电子测试装置,包括有机衬底,探针保持器和设置在有机衬底和探针支架之间的插入器,其中插入器的热膨胀系数小于有机衬底的热膨胀系数。 插入器可以有效地将有机衬底与探针保持器中的探针分离,这可以由于有机衬底和微电子测试装置的其它部件之间的热膨胀失配系数而大大减少或消除探针不对准,并且为 有机底物。

    WEBGL APPLICATION ANALYZER
    9.
    发明申请

    公开(公告)号:US20180113794A1

    公开(公告)日:2018-04-26

    申请号:US15569331

    申请日:2015-06-10

    申请人: Intel Corporation

    IPC分类号: G06F11/36 G06F9/54

    摘要: Various systems and methods for analyzing WebGL applications are described herein. A system comprises a recorder service module to intercept a plurality of graphics application programming interface (API) function calls, each of the plurality of graphics API functions calls having an associated execution context; a command translator module to translate the plurality of graphics API functions calls to a set of generic API invocations; a code generator module to generate executable code from the set of generic API invocations; and a replayer service module to test the executable code.