Policy-based resource management
    1.
    发明申请
    Policy-based resource management 有权
    基于策略的资源管理

    公开(公告)号:US20090059785A1

    公开(公告)日:2009-03-05

    申请号:US11899935

    申请日:2007-09-05

    IPC分类号: G08C15/00

    摘要: In one embodiment, a network device receives a request from a client in association with a connection, where the request indicates an amount of one or more resources that is requested to support the connection. The network device determines whether the amount of the resources is available. The network device may then allocate a level of the resources to the connection according to whether the amount of the resources is available.

    摘要翻译: 在一个实施例中,网络设备从连接中接收来自客户端的请求,其中请求指示被请求支持连接的一个或多个资源的量。 网络设备确定资源的数量是否可用。 然后,网络设备可以根据资源的数量是否可用来向该连接分配一个资源级别。

    Method and system for media synchronization in QoS-enabled wireless networks
    2.
    发明申请
    Method and system for media synchronization in QoS-enabled wireless networks 有权
    支持QoS的无线网络中媒体同步的方法和系统

    公开(公告)号:US20070025325A1

    公开(公告)日:2007-02-01

    申请号:US11192706

    申请日:2005-07-29

    申请人: Rajneesh Kumar

    发明人: Rajneesh Kumar

    IPC分类号: H04J3/06

    摘要: A method and system directed to negotiating and triggering media stream synchronization at the link layer in a QoS-enabled 802.11 WLAN, or other wireless, network. In one implementation, the present invention allows for improved performance of streaming network applications, such as video conferencing, over wireless links. In one implementation, the present invention also provides an optional mechanism whereby a mobile station can signal a need for on-the-fly throttling, if an application on the mobile detects that there is a need for better synchronization of two streams, such as a lower priority stream to a higher priority stream.

    摘要翻译: 一种用于在启用QoS的802.11 WLAN或其他无线网络中的链路层协商和触发媒体流同步的方法和系统。 在一个实现中,本发明允许通过无线链路改进诸如视频会议之类的流媒体网络应用的性能。 在一个实施方式中,本发明还提供了一种可选的机构,其中移动台可以发出对即时节流的需要,如果移动台上的应用检测到需要两个流的更好的同步,诸如 较低优先级流到较高优先级流。

    Flip chip assembly method employing post-contact differential heating
    5.
    发明授权
    Flip chip assembly method employing post-contact differential heating 失效
    使用后接触差动加热的倒装芯片组装方法

    公开(公告)号:US08381966B2

    公开(公告)日:2013-02-26

    申请号:US13036086

    申请日:2011-02-28

    IPC分类号: B23K31/02 H01L21/44

    CPC分类号: B23K1/0016

    摘要: A first substrate mounted to a bonder head and a second substrate mounted to a base plate are held at different elevated temperatures at the time of bonding that provide a substantially matched thermal expansion between the second substrate and the first substrate relative to room temperature. Further, the temperature of the solder material portions and the second substrate is raised at least up to the melting temperature after contact. The distance between the first substrate and the second substrate can be modulated to enhance the integrity of solder joints. Once the distance is at an optimum, the bonder head is detached, and the bonded structure is allowed to cool to form a bonded flip chip structure. Alternately, the bonder head can control the cooling rate of solder joints by being attached to the chip during cooling step.

    摘要翻译: 安装到接合头的第一衬底和安装到基板的第二衬底在接合时被保持在不同的升高的温度,从而相对于室温在第二衬底和第一衬底之间提供基本匹配的热膨胀。 此外,焊接材料部分和第二基板的温度至少升高到接触后的熔融温度。 第一基板和第二基板之间的距离可被调制以增强焊点的完整性。 一旦该距离处于最佳状态,就将分离头拆下,并使粘结结构冷却以形成结合的倒装芯片结构。 或者,焊接头可以在冷却步骤期间通过附接到芯片来控制焊点的冷却速度。

    THERMAL INTERFACE MATERIAL, TEST STRUCTURE AND METHOD OF USE
    8.
    发明申请
    THERMAL INTERFACE MATERIAL, TEST STRUCTURE AND METHOD OF USE 有权
    热接口材料,测试结构和使用方法

    公开(公告)号:US20110267084A1

    公开(公告)日:2011-11-03

    申请号:US12770948

    申请日:2010-04-30

    IPC分类号: G01R31/02 G01R31/10

    CPC分类号: G01R31/2884 G01R31/2874

    摘要: Non-corrosive thermal interface materials for use in a test structure and method of use. The test structure includes a heat sink for dissipating heat away from a device under test. The test structure further includes a non-corrosive thermal interface material disposed between the heat sink and the device under test. The non-corrosive thermal interface material is capable of withstanding test conditions for at least 60 minutes for at least 115° C. without staining or leaving residue on the device under test after baking.

    摘要翻译: 用于测试结构和使用方法的非腐蚀性热界面材料。 测试结构包括散热器,用于从被测设备中散热。 测试结构还包括设置在散热器和被测器件之间的非腐蚀性热界面材料。 非腐蚀性热界面材料能够耐受至少60分钟的测试条件至少115℃,而不会在烘烤后在被测设备上污染或留下残留物。