SEMICONDUCTOR NANOSTRUCTURES, SEMICONDUCTOR DEVICES, AND METHODS OF MAKING SAME
    71.
    发明申请
    SEMICONDUCTOR NANOSTRUCTURES, SEMICONDUCTOR DEVICES, AND METHODS OF MAKING SAME 有权
    SEMICONDUCTOR NANOSTRUCTURES,SEMICONDUCTOR DEVICES,AND METHODS OF MAKING SAME

    公开(公告)号:US20110201163A1

    公开(公告)日:2011-08-18

    申请号:US13041740

    申请日:2011-03-07

    Abstract: A semiconductor structure is provided, which includes multiple sections arranged along a longitudinal axis. Preferably, the semiconductor structure comprises a middle section and two terminal sections located at opposite ends of the middle section. A semiconductor core having a first dopant concentration preferably extends along the longitudinal axis through the middle section and the two terminal sections. A semiconductor shell having a second, higher dopant concentration preferably encircles a portion of the semiconductor core at the two terminal sections, but not at the middle section, of the semiconductor structure. It is particularly preferred that the semiconductor structure is a nanostructure having a cross-sectional dimension of not more than 100 nm.

    Abstract translation: 提供了一种半导体结构,其包括沿纵向轴线布置的多个部分。 优选地,半导体结构包括位于中间部分的相对端的中间部分和两个端子部分。 具有第一掺杂剂浓度的半导体芯片优选地沿着纵向轴线延伸通过中间部分和两个端子部分。 具有第二较高掺杂剂浓度的半导体壳体优选地环绕半导体结构的两个端子部分但不在中间部分处的半导体芯体的一部分。 特别优选的是,半导体结构是具有不大于100nm的横截面尺寸的纳米结构。

    Well-Structure Anti-Punch-through Microwire Device
    74.
    发明申请
    Well-Structure Anti-Punch-through Microwire Device 有权
    良好结构的抗穿通微线设备

    公开(公告)号:US20100072455A1

    公开(公告)日:2010-03-25

    申请号:US12235359

    申请日:2008-09-22

    Abstract: A well-structure anti-punch-through microwire device and associated fabrication method are provided. The method initially forms a microwire with alternating highly and lightly doped cylindrical regions. A channel ring is formed external to the microwire outer shell and surrounding a first dopant well-structure region in the microwire, between source and drain (S/D) regions of the microwire. The S/D regions are doped with a second dopant, opposite to the first dopant. A gate dielectric ring is formed surrounding the channel ring, and a gate electrode ring is formed surrounding the gate dielectric ring. The well-structure, in contrast to conventional micro or nanowire transistors, helps prevent the punch-through phenomena.

    Abstract translation: 提供了良好结构的抗穿通微线器件和相关的制造方法。 该方法最初形成具有交替的高度和轻掺杂的圆柱形区域的微线。 通道环形成在微线外壳的外部,并且包围微线中的微线的源极和漏极(S / D)区域之间的第一掺杂剂阱结构区域。 S / D区域掺杂有与第一掺杂剂相反的第二掺杂剂。 围绕通道环形成栅介质环,并且围绕栅介质环形成栅电极环。 与传统的微纳米线或纳米线晶体管相反,井结构有助于防止穿透现象。

    Method of forming an element of a microelectronic circuit
    79.
    发明授权
    Method of forming an element of a microelectronic circuit 失效
    形成微电子电路元件的方法

    公开(公告)号:US06972228B2

    公开(公告)日:2005-12-06

    申请号:US10387623

    申请日:2003-03-12

    Abstract: A method is described for forming an element of a microelectronic circuit. A sacrificial layer is formed on an upper surface of a support layer. The sacrificial layer is extremely thin and uniform. A height-defining layer is then formed on the sacrificial layer, whereafter the sacrificial layer is etched away so that a well-defined gap is left between an upper surface of the support layer and a lower surface of the height-defining layer. A monocrystalline semiconductor material is then selectively grown from a nucleation silicon site through the gap. The monocrystalline semiconductor material forms a monocrystalline layer having a thickness corresponding to the thickness of the original sacrificial layer.

    Abstract translation: 描述了形成微电子电路的元件的方法。 牺牲层形成在支撑层的上表面上。 牺牲层非常薄而均匀。 然后在牺牲层上形成高度限定层,然后牺牲层被蚀刻掉,使得在支撑层的上表面和高度限定层的下表面之间留下明确限定的间隙。 然后从成核硅部位通过间隙选择性地生长单晶半导体材料。 单晶半导体材料形成具有对应于原始牺牲层的厚度的厚度的单晶层。

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