公开(公告)号：US08540506B2

公开(公告)日：2013-09-24

申请号：US12857245

申请日：2010-08-16

Applicant: Jing-Cheng Lin ,  Wen-Chih Chiou ,  Shin-Puu Jeng ,  Chen-Hua Yu

Inventor： Jing-Cheng Lin ,  Wen-Chih Chiou ,  Shin-Puu Jeng ,  Chen-Hua Yu

IPC: H01L21/56

CPC classification number: H01L21/56 ,  H01L21/561 ,  H01L21/565 ,  H01L21/67126 ,  H01L23/3121 ,  H01L24/94 ,  H01L2224/16145 ,  H01L2224/81191 ,  H01L2224/81192 ,  H01L2224/94 ,  H01L2924/181 ,  H01L2224/81 ,  H01L2924/00

Abstract: A system and method for a semiconductor molding chamber is disclosed. An embodiment comprises a top molding portion and a bottom molding portion that form a cavity between them into which a semiconductor wafer is placed. The semiconductor molding chamber has a first set of vacuum tubes which hold and fix the position of the semiconductor wafer and a second set of vacuum tubes which evacuate the cavity of extraneous ambient gasses. The encapsulant may then be placed over the semiconductor wafer in order to encapsulate the semiconductor wafer.

公开(公告)号：US08528802B2

公开(公告)日：2013-09-10

申请号：US12204063

申请日：2008-09-04

Applicant: Chen-Hua Yu ,  Wen-Chih Chiou ,  Weng-Jin Wu

Inventor： Chen-Hua Yu ,  Wen-Chih Chiou ,  Weng-Jin Wu

IPC: B23K1/06 ,  B23K31/02

CPC classification number: H01L24/64 ,  B23K1/06 ,  H01L24/13 ,  H01L24/16 ,  H01L24/75 ,  H01L24/81 ,  H01L2224/056 ,  H01L2224/75 ,  H01L2224/751 ,  H01L2224/75301 ,  H01L2224/81011 ,  H01L2224/81054 ,  H01L2224/81205 ,  H01L2224/81801 ,  H01L2224/81894 ,  H01L2924/01006 ,  H01L2924/01013 ,  H01L2924/01019 ,  H01L2924/01029 ,  H01L2924/01033 ,  H01L2924/0105 ,  H01L2924/01075 ,  H01L2924/01079 ,  H01L2924/01082 ,  H01L2924/14 ,  H01L2924/30105 ,  Y10T29/53174 ,  H01L2924/00014

Abstract: An apparatus including a bond head, a supplemental support, a reduction module, and a transducer is provided. The bond head holds a first substrate that contains a first set of metal pads. The supplemental support holds a second substrate that contains a second set of metal pads. The aligner forms an aligned set of metal pads by aligning the first substrate to the second substrate. The reduction module contains the aligned substrates and a reduction gas flows into the reduction module. The transducer provides repeated relative motion to the aligned set of metal pads.

Abstract translation: 提供了一种包括接合头，补充支撑，还原模块和换能器的装置。 结合头保持包含第一组金属垫的第一衬底。 补充支撑件保持包含第二组金属垫的第二基底。 对准器通过将第一衬底与第二衬底对准而形成对准的一组金属衬垫。 还原模块包含对准的基板，并且还原气体流入还原模块。 传感器向对准的一组金属焊盘提供重复的相对运动。

公开(公告)号：US08525200B2

公开(公告)日：2013-09-03

申请号：US12269497

申请日：2008-11-12

Applicant: Ding-Yuan Chen ,  Wen-Chih Chiou ,  Chen-Hua Yu

Inventor： Ding-Yuan Chen ,  Wen-Chih Chiou ,  Chen-Hua Yu

IPC: H01L33/00 ,  H01L21/00

CPC classification number: H01L33/16 ,  H01L33/0079 ,  H01L33/10

Abstract: A light-emitting diode (LED) device is provided. The LED device has a substrate, a reflective structure over the substrate, and an LED structure over the reflective structure. The reflective structure is formed of non-metallic materials. In one embodiment, the reflective structure is formed of alternating layers of different non-metallic materials having different refractive indices. In another embodiment, the reflective structure is formed of alternating layers of high-porosity silicon and low-porosity silicon. In yet another embodiment, the reflective structure is formed of silicon dioxide, which may allow the use of fewer layers. The reflective structure may be formed directly on the same substrate as the LED structure or formed on a separate substrate and then bonded to the LED structure.

Abstract translation: 提供了一种发光二极管（LED）装置。 LED器件具有衬底，衬底上的反射结构以及反射结构上的LED结构。 反射结构由非金属材料形成。 在一个实施例中，反射结构由具有不同折射率的不同非金属材料的交替层形成。 在另一个实施例中，反射结构由高孔隙率硅和低孔隙率硅的交替层形成。 在另一个实施例中，反射结构由二氧化硅形成，其可以允许使用更少的层。 反射结构可以直接形成在与LED结构相同的基板上，或者形成在单独的基板上，然后结合到LED结构。

公开(公告)号：US08486730B2

公开(公告)日：2013-07-16

申请号：US13567734

申请日：2012-08-06

Applicant: Ding-Yuan Chen ,  Hung-Ta Lin ,  Chen-Hua Yu ,  Wen-Chih Chiou

Inventor： Ding-Yuan Chen ,  Hung-Ta Lin ,  Chen-Hua Yu ,  Wen-Chih Chiou

IPC: H01L21/00 ,  H01L29/06 ,  H01L31/00

CPC classification number: H01L33/007 ,  C23C14/048 ,  H01L21/0254 ,  H01L21/0262 ,  H01L21/02639 ,  H01L21/0265 ,  H01L25/167 ,  H01L33/0079 ,  H01L2924/0002 ,  H01L2924/00

Abstract: A method of forming a light-emitting diode (LED) device and separating the LED device from a growth substrate is provided. The LED device is formed by forming an LED structure over a growth substrate. The method includes forming and patterning a mask layer on the growth substrate. A first contact layer is formed over the patterned mask layer with an air bridge between the first contact layer and the patterned mask layer. The first contact layer may be a contact layer of the LED structure. After the formation of the LED structure, the growth substrate is detached from the LED structure along the air bridge.

Abstract translation: 提供一种形成发光二极管（LED）器件并将LED器件与生长衬底分离的方法。 LED器件通过在生长衬底上形成LED结构而形成。 该方法包括在生长衬底上形成和图案化掩模层。 在图案化掩模层之上形成第一接触层，在第一接触层和图案化掩模层之间具有空气桥。 第一接触层可以是LED结构的接触层。 在形成LED结构之后，生长衬底沿着空气桥与LED结构分离。

公开(公告)号：US08344513B2

公开(公告)日：2013-01-01

申请号：US12631172

申请日：2009-12-04

Applicant: Chen-Hua Yu ,  Wen-Chih Chiou ,  Weng-Jin Wu

Inventor： Chen-Hua Yu ,  Wen-Chih Chiou ,  Weng-Jin Wu

IPC: H01L23/522 ,  H01L21/4763

CPC classification number: H01L21/76846 ,  H01L21/76847 ,  H01L21/76898 ,  H01L23/5226 ,  H01L24/05 ,  H01L24/06 ,  H01L2224/0557 ,  H01L2924/00014 ,  H01L2924/0002 ,  H01L2924/01019 ,  H01L2924/01025 ,  H01L2924/01078 ,  H01L2924/01079 ,  H01L2924/04941 ,  H01L2924/14 ,  H01L2924/19041 ,  H01L2924/19042 ,  H01L2924/19043 ,  H01L2224/05552 ,  H01L2924/00

Abstract: A system and a method for protecting through-silicon vias (TSVs) is disclosed. An embodiment comprises forming an opening in a substrate. A liner is formed in the opening and a barrier layer comprising carbon or fluorine is formed along the sidewalls and bottom of the opening. A seed layer is formed over the barrier layer, and the TSV opening is filled with a conductive filler. Another embodiment includes a barrier layer formed using atomic layer deposition.

Abstract translation: 公开了一种用于保护硅通孔（TSV）的系统和方法。 一个实施例包括在衬底中形成开口。 在开口中形成衬垫，并且沿着开口的侧壁和底部形成包含碳或氟的阻挡层。 在阻挡层上形成种子层，并且用导电填料填充TSV开口。 另一实施例包括使用原子层沉积形成的阻挡层。

公开(公告)号：US08319349B2

公开(公告)日：2012-11-27

申请号：US13342583

申请日：2012-01-03

Applicant: Hsien-Pin Hu ,  Chen-Hua Yu ,  Shin-Puu Jeng ,  Shang-Yun Hou ,  Jing-Cheng Lin ,  Wen-Chih Chiou ,  Hung-Jung Tu

Inventor： Hsien-Pin Hu ,  Chen-Hua Yu ,  Shin-Puu Jeng ,  Shang-Yun Hou ,  Jing-Cheng Lin ,  Wen-Chih Chiou ,  Hung-Jung Tu

IPC: H01L23/48

CPC classification number: H01L21/561 ,  H01L21/486 ,  H01L23/147 ,  H01L23/3128 ,  H01L23/49816 ,  H01L23/49822 ,  H01L23/49827 ,  H01L24/97 ,  H01L25/0655 ,  H01L2224/05001 ,  H01L2224/05027 ,  H01L2224/05571 ,  H01L2224/16225 ,  H01L2224/16227 ,  H01L2224/32225 ,  H01L2224/73204 ,  H01L2224/97 ,  H01L2924/00014 ,  H01L2924/01029 ,  H01L2924/01322 ,  H01L2924/014 ,  H01L2924/14 ,  H01L2924/15311 ,  H01L2924/181 ,  H01L2924/18161 ,  H01L2224/81 ,  H01L2924/00012 ,  H01L2924/00 ,  H01L2224/05541 ,  H01L2224/05005 ,  H01L2224/05599 ,  H01L2224/05099

Abstract: A method includes providing an interposer wafer including a substrate, and a plurality of through-substrate vias (TSVs) extending from a front surface of the substrate into the substrate. A plurality of dies is bonded onto a front surface of the interposer wafer. After the step of bonding the plurality of dies, a grinding is performed on a backside of the substrate to expose the plurality of TSVs. A plurality of metal bumps is formed on a backside of the interposer wafer and electrically coupled to the plurality of TSVs.

公开(公告)号：US20120289062A1

公开(公告)日：2012-11-15

申请号：US13562101

申请日：2012-07-30

Applicant: Ching-Yu Lo ,  Hung-Jung Tu ,  Hai-Ching Chen ,  Tien-I Bao ,  Wen-Chih Chiou ,  Chen-Hua Yu

Inventor： Ching-Yu Lo ,  Hung-Jung Tu ,  Hai-Ching Chen ,  Tien-I Bao ,  Wen-Chih Chiou ,  Chen-Hua Yu

IPC: H01L21/71

CPC classification number: H01L21/6835 ,  H01L21/76898 ,  H01L23/481 ,  H01L24/02 ,  H01L2221/68372 ,  H01L2224/0557 ,  H01L2924/00014 ,  H01L2924/0002 ,  H01L2924/01019 ,  H01L2924/04941 ,  H01L2924/12042 ,  H01L2924/14 ,  H01L2924/19041 ,  H01L2924/19043 ,  H01L2224/05552 ,  H01L2924/00

Abstract: An integrated circuit structure includes a semiconductor substrate; a through-semiconductor via (TSV) opening extending into the semiconductor substrate; and a TSV liner in the TSV opening. The TSV liner includes a sidewall portion on a sidewall of the TSV opening and a bottom portion at a bottom of the TSV opening. The bottom portion of the TSV liner has a bottom height greater than a middle thickness of the sidewall portion of the TSV liner.

Abstract translation: 集成电路结构包括半导体衬底; 贯穿半导体衬底的贯通半导体通孔（TSV）开口; 和TSV开口的TSV衬管。 TSV衬套包括在TSV开口的侧壁上的侧壁部分和TSV开口底部的底部。 TSV衬管的底部部分的底部高度大于TSV衬套的侧壁部分的中间厚度。

公开(公告)号：US20120128457A1

公开(公告)日：2012-05-24

申请号：US12954180

申请日：2010-11-24

Applicant: Hsin Chang ,  Hsin-Yu Chen ,  Fang Wen Tsai ,  Jing-Cheng Lin ,  Wen-Chih Chiou ,  Shin-Puu Jeng ,  Chen-Hua Yu

Inventor： Hsin Chang ,  Hsin-Yu Chen ,  Fang Wen Tsai ,  Jing-Cheng Lin ,  Wen-Chih Chiou ,  Shin-Puu Jeng ,  Chen-Hua Yu

IPC: B65G1/133 ,  B25J18/00

CPC classification number: H01L21/6875 ,  B65G47/90 ,  H01L21/68707 ,  Y10T74/20305

Abstract: An apparatus includes a robot arm, and a plurality of guide pins mounted on the robot arm. Each of the plurality of guide pins includes a plurality of wafer supports at different levels, with each of the plurality of wafer supports configured to support and center a wafer having a size different from wafers configured to be supported and centered by remaining ones of the plurality of wafer supports

Abstract translation: 一种装置包括机器人臂和安装在机器人手臂上的多个引导销。 多个引导销中的每一个包括多个不同级别的晶片支架，其中多个晶片支撑件中的每一个被配置为支撑和定心具有不同晶圆尺寸的晶片，所述晶片被配置为被多个晶圆支撑的中心部分支撑并居中 的晶片支架

公开(公告)号：US20120045611A1

公开(公告)日：2012-02-23

申请号：US12858211

申请日：2010-08-17

Applicant: Ying-Ching Shih ,  Weng-Jin Wu ,  Jing-Cheng Lin ,  Wen-Chih Chiou ,  Shin-Puu Jeng ,  Chen-Hua Yu

Inventor： Ying-Ching Shih ,  Weng-Jin Wu ,  Jing-Cheng Lin ,  Wen-Chih Chiou ,  Shin-Puu Jeng ,  Chen-Hua Yu

IPC: H01L23/12 ,  B32B3/24 ,  B32B3/26 ,  B32B38/10 ,  H01L21/50 ,  B32B37/02 ,  B32B37/12 ,  B32B17/06 ,  B32B7/12

CPC classification number: G07F17/3213 ,  B32B17/10 ,  B32B37/1207 ,  B32B37/182 ,  B32B37/185 ,  B32B2457/14 ,  H01L21/6835 ,  H01L2221/68318 ,  H01L2221/68327 ,  H01L2221/6834 ,  H01L2221/68381

Abstract: A composite carrier structure for manufacturing semiconductor devices is provided. The composite carrier structure utilizes multiple carrier substrates, e.g., glass or silicon substrates, coupled together by interposed adhesive layers. The composite carrier structure may be attached to a wafer or a die for, e.g., backside processing, such as thinning processes. In an embodiment, the composite carrier structure comprises a first carrier substrate having through-substrate vias formed therethrough. The first substrate is attached to a second substrate using an adhesive such that the adhesive may extend into the through-substrate vias.

Abstract translation: 提供了一种用于制造半导体器件的复合载体结构。 复合载体结构利用多个载体衬底，例如玻璃或硅衬底，通过插入的粘合剂层耦合在一起。 复合载体结构可以附接到晶片或模具，用于例如背面处理，例如变薄处理。 在一个实施例中，复合载体结构包括具有贯穿其中形成的贯通基板通孔的第一载体基板。 使用粘合剂将第一衬底附接到第二衬底，使得粘合剂可以延伸到贯穿衬底通孔中。

公开(公告)号：US20120025368A1

公开(公告)日：2012-02-02

申请号：US12847802

申请日：2010-07-30

Applicant: Yan-Fu Lin ,  Jing-Cheng Lin ,  Wen-Chih Chiou ,  Shin-Puu Jeng ,  Chen-Hua Yu

Inventor： Yan-Fu Lin ,  Jing-Cheng Lin ,  Wen-Chih Chiou ,  Shin-Puu Jeng ,  Chen-Hua Yu

IPC: H01L23/544 ,  H01L21/56 ,  H01L23/498

CPC classification number: H01L21/563 ,  H01L23/49838 ,  H01L23/544 ,  H01L24/11 ,  H01L24/81 ,  H01L2223/54413 ,  H01L2223/5442 ,  H01L2223/54426 ,  H01L2223/54473 ,  H01L2223/5448 ,  H01L2223/54486 ,  H01L2224/1132 ,  H01L2224/11334 ,  H01L2224/1145 ,  H01L2224/11462 ,  H01L2224/11849 ,  H01L2224/131 ,  H01L2224/13111 ,  H01L2224/13124 ,  H01L2224/13139 ,  H01L2224/13144 ,  H01L2224/13147 ,  H01L2224/13155 ,  H01L2224/73204 ,  H01L2224/8113 ,  H01L2224/81132 ,  H01L2224/81191 ,  H01L2224/81815 ,  H01L2924/0001 ,  H01L2924/01005 ,  H01L2924/01006 ,  H01L2924/01013 ,  H01L2924/01029 ,  H01L2924/01033 ,  H01L2924/01047 ,  H01L2924/0105 ,  H01L2924/01079 ,  H01L2924/01082 ,  H01L2924/014 ,  H01L2924/351 ,  H01L2924/00014 ,  H01L2224/13099 ,  H01L2924/00

Abstract: A system and method for determining underfill expansion is provided. An embodiment comprises forming cover marks along a top surface of a substrate, attaching a semiconductor substrate to the top surface of the substrate, placing an underfill material between the semiconductor substrate and the substrate, and then using the cover marks to determine the expansion of the underfill over the top surface of the substrate. Additionally, cover marks may also be formed along a top surface of the semiconductor substrate, and the cover marks on both the substrate and the semiconductor substrate may be used together as alignment marks during the alignment of the substrate and the semiconductor substrate.

Abstract translation: 提供了一种用于确定底部填充膨胀的系统和方法。 一个实施例包括沿着衬底的顶表面形成覆盖标记，将半导体衬底附接到衬底的顶表面，将底部填充材料放置在半导体衬底和衬底之间，然后使用覆盖标记来确定 底部填充在基材的顶表面上。 此外，也可以沿着半导体衬底的顶表面形成覆盖标记，并且衬底和半导体衬底上的覆盖标记可以在衬底和半导体衬底的对准期间一起用作对准标记。