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公开(公告)号:US10706902B2
公开(公告)日:2020-07-07
申请号:US16192272
申请日:2018-11-15
Applicant: RENESAS ELECTRONICS CORPORATION
Inventor: Yuichiro Ishii
IPC: G11C8/16 , G11C11/408 , G11C8/08 , G11C11/417 , G11C7/10 , H01L27/11 , G11C8/14 , G11C7/12 , G11C11/419 , G11C7/02 , G11C5/06
Abstract: A semiconductor device includes: memory cells, first word lined arranged for first ports and each arranging corresponding to respective rows of the memory cells; second word lines arranged for second ports and each arranged corresponding to respective rows of the memory cells, first dummy word lines each provided above the respective first word lines, second dummy word lines each provided above the respective second word lines, a word line driver driving the first and second word lines, and a dummy word line driver driving, in an opposite phase, the second dummy word line for the adjacent second word line according to driving of the first word line from among the first and second word lines, or the first dummy word line for the adjacent first word line according to driving of the second word line from among the first and second word lines.
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公开(公告)号:US10460795B2
公开(公告)日:2019-10-29
申请号:US16214220
申请日:2018-12-10
Applicant: Renesas Electronics Corporation
Inventor: Yuichiro Ishii , Makoto Yabuuchi , Masao Morimoto
IPC: G11C11/00 , G11C11/419 , G11C7/00 , G11C7/10 , G11C7/22 , G11C8/00 , G11C8/16 , G11C8/18 , G11C11/418 , G11C8/08 , G11C8/06
Abstract: A semiconductor device includes a latch circuit receiving a first signal, generated in synchronization with a clock signal, from a pulse generation circuit, and generating a second signal; a first delay circuit receiving the second signal from the latch circuit, and generating a third signal by delaying the second signal; a second delay circuit receiving the third signal from the first delay circuit, and generating a fourth signal by delaying the third signal; and a logic circuit receiving the second and fourth signals from the latch and second delay circuits, respectively, and generating a word line control signal based on one of the second signal and the fourth signal. The latch circuit generates the second signal of a first level based on the first signal, and generates the second signal of a second level, which is different from the first level, based on the third signal.
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公开(公告)号:US10354722B2
公开(公告)日:2019-07-16
申请号:US16145342
申请日:2018-09-28
Applicant: Renesas Electronics Corporation
Inventor: Yuichiro Ishii
IPC: G11C11/00 , G11C11/419 , H01L27/11 , G11C11/418 , H01L27/02
Abstract: An assist driver is coupled to an end of a word line to which a word line driver is not coupled, and couples the other end of the word line to a first power source, in accordance with a voltage of the other end of the word line.
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公开(公告)号:US20190198499A1
公开(公告)日:2019-06-27
申请号:US16287570
申请日:2019-02-27
Applicant: Renesas Electronics Corporation
Inventor: Makoto YABUUCHI , Yuichiro Ishii
IPC: H01L27/092 , H01L21/8238 , H01L23/528
CPC classification number: H01L27/0924 , H01L21/823475 , H01L21/823493 , H01L21/823821 , H01L21/823871 , H01L21/823892 , H01L23/528 , H01L23/5286 , H01L27/0928
Abstract: A semiconductor device includes a semiconductor substrate, a first well region formed on the semiconductor substrate, a first fin integrally formed of the semiconductor substrate on the first well region and extended in a first direction in a plan view, a first electrode formed on the first fin via a first gate insulating film, and extended in a second direction crossing the first direction in the plan view, a tap region formed on the semiconductor substrate adjacent to the first well region in the second direction, and supplying a first potential to the first well region, a second fin integrally formed of the semiconductor substrate on the tap region and extended in the first direction in the plan view, and a first wiring layer formed on the second fin in a portion overlapping the tap region in the plan view.
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公开(公告)号:US10068641B2
公开(公告)日:2018-09-04
申请号:US15894757
申请日:2018-02-12
Applicant: Renesas Electronics Corporation
Inventor: Yuichiro Ishii
IPC: G11C11/419 , G11C7/12 , G11C5/14
CPC classification number: G11C11/419 , G11C5/148 , G11C7/12 , G11C2207/2227
Abstract: A semiconductor storage device includes an SRAM memory cell composed of a drive transistor, a transfer transistor and a load transistor, an I/O circuit that is connected to bit lines connected to the memory cell, and an operating mode control circuit that switches an operating mode of the I/O circuit between a resume standby mode and a normal operation mode, wherein the I/O circuit includes a write driver that writes data to bit lines, a sense amplifier that reads data from the bit lines, a first switch inserted between the bit lines and the write driver, a second switch inserted between the bit lines and the sense amplifier, a precharge circuit that precharges the bit lines, and a control circuit that controls the first and second switches and the precharge circuit according to a signal from the operating mode control circuit.
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公开(公告)号:US10026472B2
公开(公告)日:2018-07-17
申请号:US15674659
申请日:2017-08-11
Applicant: Renesas Electronics Corporation
Inventor: Yuichiro Ishii
IPC: G11C11/00 , G11C11/418 , G11C11/419
Abstract: In a multi-port memory, a first pulse signal generator circuit generates a first pulse signal following input of a clock signal. A first latch circuit sets a first start signal to a first state in response to generation of the first pulse signal, and resets the first start signal to a second state in response to a first delayed signal obtained by delaying the first start signal by a delay circuit. A second pulse signal generator circuit generates a second pulse signal following input of the first delayed signal. A first latch circuit sets a second start signal to the first state and holds this state in response to generation of the second pulse signal, and resets the second start signal to the second state in response to a second delayed signal obtained by delaying the second start signal by the delay circuit. The memory operates based on start signals.
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公开(公告)号:US09805821B2
公开(公告)日:2017-10-31
申请号:US15234910
申请日:2016-08-11
Applicant: Renesas Electronics Corporation
Inventor: Shinji Tanaka , Yuichiro Ishii , Masaki Tsukude , Yoshikazu Saito
IPC: G11C29/02 , G11C11/418 , G11C11/419 , G11C29/12 , G11C29/04 , G11C29/18 , G11C29/28 , G11C29/50
CPC classification number: G11C7/00 , G11C11/418 , G11C11/419 , G11C29/02 , G11C29/04 , G11C29/12 , G11C29/12005 , G11C29/1201 , G11C29/12015 , G11C29/18 , G11C29/28 , G11C29/50 , G11C29/50016 , G11C2029/1202 , G11C2029/1204
Abstract: A semiconductor memory device includes a memory array including a plurality of memory cells arranged in a matrix form, a plurality of bit line pairs disposed in the columns of the memory cells, a plurality of word lines disposed in the rows of the memory cells, a write drive circuit adapted to transfer data to a bit line pair in a selected column in accordance with write data, and a control circuit that deselects the word lines during a test and drives a low-potential side bit line of the bit line pair in the selected column to a negative voltage level in accordance with the potentials of bit lines in the selected column.
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公开(公告)号:US09798600B2
公开(公告)日:2017-10-24
申请号:US14868238
申请日:2015-09-28
Applicant: RENESAS ELECTRONICS CORPORATION
Inventor: Yuichiro Ishii , Atsushi Miyanishi , Yoshikazu Saito
CPC classification number: G06F11/0751 , G06F11/073
Abstract: The present invention provides a semiconductor memory device that can perform failure detection of an address decoder by a simple method with a low area overhead. The semiconductor memory device includes: a first memory array having a plurality of first memory cells arrange in matrix; a plurality of word lines provided corresponding to each of the memory cell rows; an address decoder for selecting a word line from the word lines based on the input address information; a second memory array that is provided adjacent to the first memory array in the column direction, having a plurality of second memory cells able to read address information used in the selection of the previously stored word line, according to the selection of the word line extended to the second memory array; and a comparison circuit for comparing the input address information with the address information read from the second memory array.
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公开(公告)号:US09728272B2
公开(公告)日:2017-08-08
申请号:US15000027
申请日:2016-01-18
Applicant: Renesas Electronics Corporation
Inventor: Atsushi Miyanishi , Yuichiro Ishii , Yoshisato Yokoyama
IPC: G11C11/00 , G11C29/04 , G11C29/46 , G11C29/02 , G11C11/419 , G11C11/412 , G11C11/413 , G11C29/34 , G11C29/48 , G11C29/50 , G11C7/04 , G11C11/417 , G11C29/06
CPC classification number: G11C11/419 , G11C7/04 , G11C11/412 , G11C11/413 , G11C11/417 , G11C29/02 , G11C29/04 , G11C29/06 , G11C29/34 , G11C29/46 , G11C29/48 , G11C29/50
Abstract: When a screening test at a normal temperature is performed instead of a low temperature screening test of SRAM, overkill is reduced and risk of outflow of defects due to local variation is suppressed. An SRAM including a word line, a bit line pair, a memory cell, and a drive circuit that drives the bit line pair is provided with a function that can drive one bit line of the bit line pair at a high level (VDD) potential and drive the other bit line at an intermediate potential (VSS+several tens mV to one handled and several tens mV) a little higher than a low level (VSS) potential for normal writing when writing data into the memory cell.
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公开(公告)号:US20170221549A1
公开(公告)日:2017-08-03
申请号:US15492147
申请日:2017-04-20
Applicant: Renesas Electronics Corporation
Inventor: Yoshisato Yokoyama , Yuichiro Ishii
IPC: G11C11/418
CPC classification number: G11C11/418 , G11C5/148 , G11C11/417
Abstract: A semiconductor storage device includes, a memory array, a plurality of memory cells provided in rows and columns, and a control circuit for controlling the memory array, each of the memory cells being a static-type memory cell comprising driving transistors, transfer transistors, and load elements.
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