知搜-全球专利检索

  1. Login
  2. Sign Up

Search Results

56 records (took 0.035 seconds)

    Semiconductor processing device and IC card
    21.
    发明授权
    Semiconductor processing device and IC card 有权
    半导体处理装置和IC卡

    公开(公告)号：US08050085B2

    公开(公告)日：2011-11-01

    申请号：US10521553

    申请日：2002-08-29

    Applicant: Masatoshi Takahashi ,  Takanori Yamazoe ,  Kozo Katayama ,  Toshihiro Tanaka ,  Yutaka Shinagawa ,  Hiroshi Watase ,  Takeo Kanai ,  Nobutaka Nagasaki

    Inventor： Masatoshi Takahashi ,  Takanori Yamazoe ,  Kozo Katayama ,  Toshihiro Tanaka ,  Yutaka Shinagawa ,  Hiroshi Watase ,  Takeo Kanai ,  Nobutaka Nagasaki

    IPC: G11C7/10 ,  G11C11/40

    CPC classification number: G07F7/1008 ,  G06Q20/341 ,  G06Q20/40975 ,  G07F7/084 ,  G11C11/005 ,  G11C16/0425 ,  G11C16/0433 ,  G11C16/16

    Abstract: A semiconductor processing device according to the invention includes a first non-volatile memory (21) for erasing stored information on a first data length unit, a second non-volatile memory (22) for erasing stored information on a second data length unit, and a central processing unit (2), and capable of inputting/outputting encrypted data from/to an outside. The first non-volatile memory is used for storing an encryption key to be utilized for encrypting the data. The second non-volatile memory is used for storing a program to be processed by the central processing unit. The non-volatile memories to be utilized for storing the program and for storing the encryption key are separated from each other, and the data lengths of the erase units of information to be stored in the non-volatile memories are defined separately. Therefore, the stored information can efficiently be erased before the execution of a processing of writing the program, and the stored information can be erased corresponding to the data length of a necessary processing unit in the write of the encryption key to be utilized in the calculation processing of the CPU.

    Abstract translation: 根据本发明的半导体处理装置包括用于擦除第一数据长度单元上存储的信息的第一非易失性存储器（21），用于擦除第二数据长度单元上存储的信息的第二非易失性存储器（22），以及 中央处理单元（2），能够从/向外部输入/输出加密数据。 第一非易失性存储器用于存储要用于加密数据的加密密钥。 第二非易失性存储器用于存储要由中央处理单元处理的程序。 用于存储程序和用于存储加密密钥的非易失性存储器彼此分离，并且存储在非易失性存储器中的信息的擦除单元的数据长度被分开地定义。 因此，在执行写入程序的处理之前可以有效地擦除存储的信息，并且可以根据在计算中要使用的加密密钥的写入中的必要处理单元的数据长度来擦除存储的信息 处理CPU。

    Semiconductor Integrated Circuit
    22.
    发明申请
    Semiconductor Integrated Circuit 有权
    半导体集成电路

    公开(公告)号：US20110246860A1

    公开(公告)日：2011-10-06

    申请号：US13162180

    申请日：2011-06-16

    Applicant: Yutaka SHINAGAWA ,  Takeshi Kataoka ,  Eiichi Ishikawa ,  Toshihiro Tanaka ,  Kazumasa Yanagisawa ,  Kazufumi Suzukawa

    Inventor： Yutaka SHINAGAWA ,  Takeshi Kataoka ,  Eiichi Ishikawa ,  Toshihiro Tanaka ,  Kazumasa Yanagisawa ,  Kazufumi Suzukawa

    IPC: H03M13/05 ,  G11C16/04 ,  G06F11/10

    CPC classification number: G11C16/349 ,  G11C16/06 ,  G11C16/3495

    Abstract: A semiconductor integrated circuit has a central processing unit and a rewritable nonvolatile memory area disposed In an address space of the central processing unit. The nonvolatile memory area has a first nonvolatile memory area and a second nonvolatile memory area, which memorize information depending on the difference of threshold voltages. The first nonvolatile memory area has the maximum variation width of a threshold voltage for memorizing information set larger than that of the second nonvolatile memory area. When the maximum variation width of the threshold voltage for memorizing information is larger, since stress to a memory cell owing to a rewrite operation of memory information becomes larger, it is inferior In a point of guaranteeing the number of times of rewrite operation; however, since a read current becomes larger, a read speed of memory information can be expedited. The first nonvolatile memory area can be prioritized to expedite a read speed of the memory information and the second nonvolatile memory area can be prioritized to guarantee the number of times of rewrite operation of memory information more.

    Abstract translation: 半导体集成电路具有设置在中央处理单元的地址空间中的中央处理单元和可重写非易失性存储区域。 非易失性存储区域具有第一非易失性存储区域和第二非易失性存储器区域，其根据阈值电压的差异来存储信息。 第一非易失性存储区具有用于存储大于第二非易失性存储区的信息的阈值电压的最大变化宽度。 当用于存储信息的阈值电压的最大变化幅度较大时，由于由于存储信息的重写操作而对存储单元的应力变大，所以不利于保证重写操作的次数; 然而，由于读取电流变大，因此可以加快存储器信息的读取速度。 可以优先考虑第一非易失性存储器区域以加快存储器信息的读取速度，并且可以对第二非易失性存储器区域进行优先排列以保证存储器信息的重写操作的次数更多。

    Semiconductor integrated circuit
    23.
    发明授权
    Semiconductor integrated circuit 有权
    半导体集成电路

    公开(公告)号：US07978545B2

    公开(公告)日：2011-07-12

    申请号：US12775377

    申请日：2010-05-06

    Applicant: Yutaka Shinagawa ,  Takeshi Kataoka ,  Eiichi Ishikawa ,  Toshihiro Tanaka ,  Kazumasa Yanagisawa ,  Kazufumi Suzukawa

    Inventor： Yutaka Shinagawa ,  Takeshi Kataoka ,  Eiichi Ishikawa ,  Toshihiro Tanaka ,  Kazumasa Yanagisawa ,  Kazufumi Suzukawa

    IPC: G11C7/00

    CPC classification number: G11C16/349 ,  G11C16/06 ,  G11C16/3495

    Abstract: A semiconductor integrated circuit has a central processing unit and a rewritable nonvolatile memory area disposed in an address space of the central processing unit. The nonvolatile memory area has a first nonvolatile memory area and a second nonvolatile memory area, which memorize information depending on the difference of threshold voltages. The first nonvolatile memory area has the maximum variation width of a threshold voltage for memorizing information set larger than that of the second nonvolatile memory area. When the maximum variation width of the threshold voltage for memorizing information is larger, since stress to a memory cell owing to a rewrite operation of memory information becomes larger, it is inferior in a point of guaranteeing the number of times of rewrite operation; however, since a read current becomes larger, a read speed of memory information can be expedited. The first nonvolatile memory area can be prioritized to expedite a read speed of the memory information and the second nonvolatile memory area can be prioritized to guarantee the number of times of rewrite operation of memory information more.

    Abstract translation: 半导体集成电路具有设置在中央处理单元的地址空间中的中央处理单元和可重写的非易失性存储区域。 非易失性存储区域具有第一非易失性存储区域和第二非易失性存储器区域，其根据阈值电压的差异来存储信息。 第一非易失性存储区具有用于存储大于第二非易失性存储区的信息的阈值电压的最大变化宽度。 当用于存储信息的阈值电压的最大变化幅度较大时，由于由于存储信息的重写操作而对存储单元的应力变大，所以在保证重写操作次数方面较差; 然而，由于读取电流变大，因此可以加快存储器信息的读取速度。 可以优先考虑第一非易失性存储器区域以加快存储器信息的读取速度，并且可以对第二非易失性存储器区域进行优先排列以保证存储器信息的重写操作的次数更多。

    SEMICONDUCTOR INTEGRATED CIRCUIT
    24.
    发明申请
    SEMICONDUCTOR INTEGRATED CIRCUIT 有权
    半导体集成电路

    公开(公告)号：US20100220531A1

    公开(公告)日：2010-09-02

    申请号：US12775377

    申请日：2010-05-06

    Applicant: YUTAKA SHINAGAWA ,  Takeshi Kataoka ,  Eiichi Ishikawa ,  Toshihiro Tanaka ,  Kazumasa Yanagisawa ,  Kazufumi Suzukawa

    Inventor： YUTAKA SHINAGAWA ,  Takeshi Kataoka ,  Eiichi Ishikawa ,  Toshihiro Tanaka ,  Kazumasa Yanagisawa ,  Kazufumi Suzukawa

    IPC: G11C16/04 ,  G06F12/02 ,  G06F11/00 ,  G06F13/20

    CPC classification number: G11C16/349 ,  G11C16/06 ,  G11C16/3495

    Abstract: A semiconductor integrated circuit has a central processing unit and a rewritable nonvolatile memory area disposed in an address space of the central processing unit. The nonvolatile memory area has a first nonvolatile memory area and a second nonvolatile memory area, which memorize information depending on the difference of threshold voltages. The first nonvolatile memory area has the maximum variation width of a threshold voltage for memorizing information set larger than that of the second nonvolatile memory area. When the maximum variation width of the threshold voltage for memorizing information is larger, since stress to a memory cell owing to a rewrite operation of memory information becomes larger, it is inferior in a point of guaranteeing the number of times of rewrite operation; however, since a read current becomes larger, a read speed of memory information can be expedited. The first nonvolatile memory area can be prioritized to expedite a read speed of the memory information and the second nonvolatile memory area can be prioritized to guarantee the number of times of rewrite operation of memory information more.

    Abstract translation: 半导体集成电路具有设置在中央处理单元的地址空间中的中央处理单元和可重写的非易失性存储区域。 非易失性存储区域具有第一非易失性存储区域和第二非易失性存储器区域，其根据阈值电压的差异来存储信息。 第一非易失性存储区具有用于存储大于第二非易失性存储区的信息的阈值电压的最大变化宽度。 当用于存储信息的阈值电压的最大变化幅度较大时，由于由于存储信息的重写操作而对存储单元的应力变大，所以在保证重写操作次数方面较差; 然而，由于读取电流变大，因此可以加快存储器信息的读取速度。 可以优先考虑第一非易失性存储器区域以加快存储器信息的读取速度，并且可以对第二非易失性存储器区域进行优先排列以保证存储器信息的重写操作的次数更多。

    Semiconductor processing device and IC card
    25.
    发明申请
    Semiconductor processing device and IC card 有权
    半导体处理装置和IC卡

    公开(公告)号：US20090213649A1

    公开(公告)日：2009-08-27

    申请号：US10521553

    申请日：2002-08-29

    Applicant: Masatoshi Takahashi ,  Takanori Yamazoe ,  Kozo Katayama ,  Toshihiro Tanaka ,  Yutaka Shinagawa ,  Hiroshi Watase ,  Takeo Kanai ,  Nobutaka Nagasaki

    Inventor： Masatoshi Takahashi ,  Takanori Yamazoe ,  Kozo Katayama ,  Toshihiro Tanaka ,  Yutaka Shinagawa ,  Hiroshi Watase ,  Takeo Kanai ,  Nobutaka Nagasaki

    IPC: G11C11/34 ,  G11C16/04 ,  G11C5/14 ,  G06F12/14

    CPC classification number: G07F7/1008 ,  G06Q20/341 ,  G06Q20/40975 ,  G07F7/084 ,  G11C11/005 ,  G11C16/0425 ,  G11C16/0433 ,  G11C16/16

    Abstract: A semiconductor processing device according to the invention includes a first non-volatile memory (21) for erasing stored information on a first data length unit, a second non-volatile memory (22) for erasing stored information on a second data length unit, and a central processing unit (2), and capable of inputting/outputting encrypted data from/to an outside. The first non-volatile memory is used for storing an encryption key to be utilized for encrypting the data. The second non-volatile memory is used for storing a program to be processed by the central processing unit. The non-volatile memories to be utilized for storing the program and for storing the encryption key are separated from each other, and the data lengths of the erase units of information to be stored in the non-volatile memories are defined separately. Therefore, the stored information can efficiently be erased before the execution of a processing of writing the program, and the stored information can be erased corresponding to the data length of a necessary processing unit in the write of the encryption key to be utilized in the calculation processing of the CPU.

    Abstract translation: 根据本发明的半导体处理装置包括用于擦除第一数据长度单元上存储的信息的第一非易失性存储器（21），用于擦除第二数据长度单元上存储的信息的第二非易失性存储器（22），以及 中央处理单元（2），能够从/向外部输入/输出加密数据。 第一非易失性存储器用于存储要用于加密数据的加密密钥。 第二非易失性存储器用于存储要由中央处理单元处理的程序。 用于存储程序和用于存储加密密钥的非易失性存储器彼此分离，并且存储在非易失性存储器中的信息的擦除单元的数据长度被分开地定义。 因此，在执行写入程序的处理之前可以有效地擦除存储的信息，并且可以根据在计算中要使用的加密密钥的写入中的必要处理单元的数据长度来擦除存储的信息 处理CPU。

    Nonvolatile memory device and semiconductor device
    26.
    发明申请
    Nonvolatile memory device and semiconductor device 有权
    非易失性存储器件和半导体器件

    公开(公告)号：US20060239072A1

    公开(公告)日：2006-10-26

    申请号：US11472993

    申请日：2006-06-23

    Applicant: Toshihiro Tanaka ,  Takashi Yamaki ,  Yutaka Shinagawa ,  Daisuke Okada ,  Digh Hisamoto ,  Kan Yasui ,  Tetsuya Ishimaru

    Inventor： Toshihiro Tanaka ,  Takashi Yamaki ,  Yutaka Shinagawa ,  Daisuke Okada ,  Digh Hisamoto ,  Kan Yasui ,  Tetsuya Ishimaru

    IPC: G11C16/04 ,  G11C11/34

    CPC classification number: G11C16/10 ,  G11C16/0433

    Abstract: Disclosed here is a method for speeding up data writing and reducing power consumption by reducing the variation of the threshold voltage of each of non-volatile memory cells at data writing. When writing data in a memory cell, a voltage of about 8V is applied to the memory gate line, a voltage of about 5V is applied to the source line, a voltage of about 1.5V is applied to the selected gate line respectively. At that time, in the writing circuit, the writing pulse is 0, the writing latch output a High signal, and a NAND-circuit outputs a Low signal. And, a constant current of about 1 iA flows in a constant current source transistor and the bit line is discharged by a constant current of about 1 iA to flow a current in the memory cell.

    Abstract translation: 这里公开了一种通过在数据写入时减小每个非易失性存储单元的阈值电压的变化来加速数据写入并降低功耗的方法。 当在存储单元中写入数据时，约8V的电压被施加到存储器栅极线，大约5V的电压被施加到源极线，大约1.5V的电压分别施加到所选择的栅极线。 此时，在写入电路中，写入脉冲为0，写入锁存器输出高电平信号，NAND电路输出低电平信号。 并且，在恒定电流源晶体管中流动约1IA的恒定电流，并且通过约1iA的恒定电流放电位线以使存储单元中的电流流动。

    Semiconductor integrated circuit, semiconductor non-volatile memory, memory card, and microcomputer
    27.
    发明授权
    Semiconductor integrated circuit, semiconductor non-volatile memory, memory card, and microcomputer 有权
    半导体集成电路，半导体非易失性存储器，存储卡和微计算机

    公开(公告)号：US07072218B2

    公开(公告)日：2006-07-04

    申请号：US10486638

    申请日：2002-07-03

    Applicant: Masamichi Fujito ,  Yuko Nakamura ,  Kazufumi Suzukawa ,  Toshihiro Tanaka ,  Yutaka Shinagawa

    Inventor： Masamichi Fujito ,  Yuko Nakamura ,  Kazufumi Suzukawa ,  Toshihiro Tanaka ,  Yutaka Shinagawa

    IPC: G11C16/04

    CPC classification number: G11C7/1057 ,  G11C7/1051 ,  G11C7/1096 ,  G11C7/12 ,  G11C8/08 ,  G11C16/08 ,  H01L2924/0002 ,  H01L2924/00

    Abstract: A high voltage output driver derives operational power from high voltages and a switching circuit which reverses the output state of the high voltage output driver. The high voltage output driver has in a current path of the high voltages, a series circuit of a first MOS transistor (M1) and second MOS transistor (M2), with the serial connection node thereof being the driver output terminal. The switching circuit operates to reverse the complementary switching states of the first and second MOS transistors such that one transistor in the on-state is switched to an off-state first and the other transistor is switched to an on-state afterward. Even if the other MOS transistor has its Vds exceeding the minimum breakdown voltage when it operates to turn on, the through current path is already shut off, and therefore the high voltage output driver does not break down.

    Abstract translation: 高电压输出驱动器从高电压导出工作电源，并切换反向高压输出驱动器的输出状态的开关电路。 高压输出驱动器具有高电压的电流路径，第一MOS晶体管（M 1）和第二MOS晶体管（M 2）的串联电路，其串联连接节点是驱动器输出端子。 开关电路操作以反转第一和第二MOS晶体管的互补开关状态，使得处于导通状态的一个晶体管首先被切换到截止状态，而另一个晶体管之后被切换到导通状态。 即使其他MOS晶体管的Vds在其操作导通时其Vds超过最小击穿电压，直通电流路径已被切断，因此高压输出驱动器不会分解。

    Non-volatile semiconductor memory device for selectively re-checking word lines
    29.
    发明授权
    Non-volatile semiconductor memory device for selectively re-checking word lines 有权
    用于选择性地重新检查字线的非易失性半导体存储器件

    公开(公告)号：US06711061B2

    公开(公告)日：2004-03-23

    申请号：US10223488

    申请日：2002-08-20

    Applicant: Nozomu Matsuzaki ,  Kazuyoshi Shiba ,  Yasuhiro Taniguchi ,  Toshihiro Tanaka ,  Yutaka Shinagawa

    Inventor： Nozomu Matsuzaki ,  Kazuyoshi Shiba ,  Yasuhiro Taniguchi ,  Toshihiro Tanaka ,  Yutaka Shinagawa

    IPC: G11C1604

    CPC classification number: G11C16/3409 ,  G11C8/08 ,  G11C16/12 ,  G11C16/3404

    Abstract: A method for settling threshold voltages of word lines on a predetermined level in an erasing processing of a non-volatile semiconductor memory device so as to speed up the erasing processing. A word latch circuit is provided for each word line and the threshold voltage of each memory cell is managed for each word line in a selected memory block. Each word latch circuit is shared by a plurality of word lines so as to reduce the required chip area. A rewriting voltage is set for each finished non-volatile memory and the voltage information is stored in the boot area of the non-volatile memory, so that the voltage is recognized by the system each time the system is powered.

    Abstract translation: 一种用于在非易失性半导体存储器件的擦除处理中在预定电平上建立字线的阈值电压的方法，以加速擦除处理。 为每个字线提供字锁存电路，并且在所选择的存储器块中为每个字线管理每个存储器单元的阈值电压。 每个字锁存电路由多个字线共享，以便减少所需的芯片面积。 为每个完成的非易失性存储器设置重写电压，并且电压信息被存储在非易失性存储器的引导区域中，使得每当系统供电时，系统识别电压。

Patent Agency Ranking