Abstract:
Antifuses and gate arrays with antifuses are disclosed that have high thermal stability, reduced size, reduced leakage current, reduced capacitance in the unprogrammed state, improved manufacturing yield, and more controllable electrical characteristics. Some antifuses include spacers in the antifuse via. In some antifuses, the programmable material is planar, and the top or the bottom electrode is formed in the antifuse via. In some gate arrays, the antifuses are formed above the dielectric separating two levels of routing channels rather than below that dielectric.
Abstract:
Node voltages in a net involving non-linear circuit elements are estimated, successively from one point in time to the next, without a computation-intensive step of solving a set of simultaneous equations. An RC tree representing the net is obtained by modeling circuit elements with resistors, capacitors and voltage sources. Voltages on nodes of the RC tree at a second point in time are then estimated given voltages on the nodes at a previous point in time, by: 1) performing a circuit substitution that enforces a backward stepping rule, and 2) performing a DC analysis thereby obtaining node voltages at the second point in time. In this way, estimated node voltages at successive points in time are obtained by repeating the circuit substitution for the next point in time and by repeating the DC analysis to obtain node voltages at the next point in time. The length of time required for the voltage on a selected node to reach a threshold voltage is the estimated propagation delay.
Abstract:
Critical programmed reliability of a metal-to-metal amorphous silicon antifuse is a function of programming current, operating current and total programming time. The time required to program a field programmable gate array is reduced by classifying antifuses to be programmed into three or more classes according to the amount of programming time required to achieve critical programmed reliability under programming current and operating current conditions. Each of these classes of antifuses is programmed with near the minimum programming time required to program every antifuse in the class to critical reliability. In this way, large numbers of antifuses are not programmed with significantly greater amounts of programming time than are actually required to program them to critical reliability. The time required to program the field programmable gate array is therefore reduced. Techniques for obtaining critical reliability data used in classifying antifuses are also disclosed. Classifications based on antifuse type, programming method, and operating conditions are also disclosed.
Abstract:
In a field programmable gate array, a plurality of wire segments extend parallel to each other between two logic cells. Some of the wire segments extend to logic cell inputs and others to logic cell outputs. A power wire extends perpendicular to the wire segments and crosses each of the wire segments. Antifuses are disposed to couple the input wire segments to the power wire but no antifuses are disposed between the output wire segments and the power wire.
Abstract:
A logic circuit is implemented on a macrocell of a field programmable device using select sets of a logic function which represents a transformation of the one or more input signals of the logic circuit to the output signal of the logic circuit. Select sets of a logic function are determined (i) by grouping input signals which correspond to equal co-factors of the logic function or (ii) by grouping input signals such that one input signal of a group never appears in a term of the logic function in a greedy phase-minimized RMF canonical form without all other input signals of the group. The logic circuit is implemented on a macrocell which includes a circuit element which selects one of two or more input signals according to one or more select signals, each of which is driven by a respective logic gate. Examples of such circuit elements include multiplexers and random access memory (RAM). The logic circuit is implemented by placing on input lines of a logic gate driving a select line the input signals or the complement of the input signals of a select set.
Abstract:
To facilitate the simultaneous programming of multiple antifuses on an integrated circuit, a first current path is established from a first programming terminal (VPP1) of a programmable logic device through a first antifuse to be programmed and a second current path is established from a second programming terminal (VPP2) of the programmable logic device through a second antifuse to be programmed. By supplying the programming current for programming the first antifuse from a different terminal than the programming current for programming the second antifuse, the two antifuses can be programmed simultaneously with an adequate amount of programming current being supplied to each antifuse. A programming current multiplexer circuit is disclosed for selectively coupling either a first programming voltage (VPP1) terminal, a second programming voltage (VPP2), or a ground terminal (GND) to a programming bus and/or to an antifuse to be programmed. The first and second current paths can be established using multiple such programming current multiplexer circuits.
Abstract:
A field programmable gate array includes a programmable routing network, a programmable configuration network integrated with the programmable routing network; and a logic cell integrated with the programmable configuration network. The logic cell includes four two-input AND gates, two six-input AND gates, three multiplexers, and a delay flipflop. The logic cell is a powerful general purpose universal logic building block suitable for implementing most TTL and gate array macrolibrary functions. A considerable variety of functions are realizable with one cell delay, including combinational logic functions as wide as thirteen inputs, all boolean transfer functions for up to three inputs, and sequential flipflop functions such as T, JK and count with carry-in.
Abstract:
The invention allows programming an antifuse so as to reduce the antifuse resistance and the standard deviation of the resistance without increasing the programming current. This is achieved by passing current pulses of the opposite polarity through the antifuse. In some embodiments, the magnitude of the second pulse is lower than the magnitude of the first pulse. Further, if the antifuse is formed on a semiconductor substrate with one electrode on top of the other electrode and on top of the substrate, the current during the first pulse flows from the top electrode to the bottom electrode and not vice versa. A programming circuitry is provided that allows to program antifuses in a programmable circuit. A driver circuit is connected to each "horizontal" channel and each "vertical" channel. Each driver circuit is controlled by data in the driver circuit. The driver circuits are connected into shift registers so that all the data can be entered from one, two, three or four inputs. No decoding circuitry is necessary. Before programming, the drivers precharge all the channels to an intermediate voltage. During programming, the channels that are not directly connected to the antifuse being programmed are switched to high impedance. As a result, the power consumption is reduced and the programming proceeds faster.
Abstract:
A programmable logic device (PLD) supports scan testing of configurable logical blocks using scannable word line (WL) shift register (WLSR) chains to enable writes to configurable memory bits while scan test data is input via a scan chain comprising scannable bit line (BL) shift registers (BLSRs). Input test data may be shifted onto BLs to write data into a configurable memory bit when a corresponding WL associated with the configurable memory bit is asserted. Logic blocks may comprise: latch-based configurable memory bits, scannable WLSRs forming a distinct WLSR chain in shift mode and driving corresponding WLs. Each WL, when asserted, enables writes to a corresponding configurable memory bit. A scannable BLSR receives serial scan test vector input in shift mode and drives a corresponding BL coupled to the configurable memory bit to write data to the configurable memory bit when the associated WL is asserted.
Abstract:
An apparatus and method of reducing power consumption across a switch, such as an unprogrammed antifuse, is provided. The invention applies to antifuses, other switches such as transistor based switches, (e.g., FLASH, EEPROM and/or SRAM) and other devices exhibiting a leakage current, especially during a sleep or stand-by mode. During a sleep mode, such switches or other devices may be uncoupled from signals driving the switches, then terminals of each switch may be coupled to a common potential or allowed to float to a common potential thereby eliminating or reducing leakage currents through the switches.